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    • 1. 发明申请
    • CARBON NANOTUBE CIRCUITS DESIGN METHODOLOGY
    • 碳纳米管电路设计方法
    • WO2008127773A3
    • 2009-01-22
    • PCT/US2008053794
    • 2008-02-13
    • MOTOROLA INCLEE KING FAMLANI ISLAMSHAH S
    • LEE KING FAMLANI ISLAMSHAH S
    • G06F17/50
    • G06F17/5045B82Y10/00H01L23/53276H01L51/0048H01L2924/0002H01L2924/00
    • A methodology is provided for optimizing circuit parameters of circuits including carbon nanotube transistors. The method comprises mapping (122) selected transistor design parameters (118), based on carbon nanotube process parameters (120) and selected circuit topologies (114), into carbon nanotube physical attributes. A circuit layout is generated (124) from the carbon nanotube physical attributes and simulated (128). The steps are repeated until circuit specifications (130) are met. The carbon nanotube physical attributes may include, for example, the catalyst width (74) for growing a plurality of carbon nanotubes (72) or number of segments in a serpentine electrode structure (88, 89, 90) contacting a single carbon nanotube (81).
    • 提供了一种用于优化包括碳纳米管晶体管在内的电路的电路参数的方法。 该方法包括将选择的晶体管设计参数(122)基于碳纳米管工艺参数(120)和所选择的电路拓扑(114)映射(122)成碳纳米管物理属性。 从碳纳米管的物理属性(128)生成电路布局(124)。 重复步骤直到电路规格(130)满足。 碳纳米管物理属性可以包括例如用于生长与单个碳纳米管(81)接触的蛇形电极结构(88,89,90)中的多个碳纳米管(72)或多个段的催化剂宽度(74) )。
    • 3. 发明申请
    • CARBON NANOTUBE SENSOR
    • 碳纳米管传感器
    • WO2007053154A2
    • 2007-05-10
    • PCT/US2005041975
    • 2005-11-18
    • MOTOROLA INCNAGAHARA LARRY AAMLANI ISLAMSHAH S
    • NAGAHARA LARRY AAMLANI ISLAMSHAH S
    • G01N27/26
    • B82Y15/00G01N27/127
    • A device is provided for determining the degree of the presence of an unwanted environmental agent. The apparatus comprises a device (30, 40) having first (31, 41) and second (33, 46) conducting layers with alternatively interdigitized fingers (34, 36, 42, 43, 44, 47, 48, 49) coupled to a nano-structure (32, 45) having a high aspect ratio, wherein sections (35, 37, 50, 51, 52, 53, 54) of the nano-structure between each of the fingers are substantially equal in length. Circuitry (62) coupled to the first and second conducting layers deternines the occurrence of a change in a material characteristic of the sections of the nano-structure.
    • 提供了用于确定不需要的环境试剂的存在程度的装置。 该装置包括具有第一(31,41)和第二(33,46)导电层的装置(30,40),所述导电层与另一个交叉指状的指状物(34,36,42,43,44,47,48,49) 具有高纵横比的纳米结构(32,45),其中每个指状物之间的纳米结构的部分(35,37,50,51,52,53,54)的长度基本相等。 耦合到第一和第二导电层的电路(62)确定了纳米结构部分的材料特性变化的发生。