会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • METHOD OF COOLING HIGH DENSITY ELECTRONICS
    • 冷却高密度电子学的方法
    • WO2003046610A1
    • 2003-06-05
    • PCT/US2001/043392
    • 2001-11-21
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.
    • GRIESMER, Jerome, J.KLINE, Barry, D.
    • G01T1/24
    • G01T1/2018
    • For nuclear imaging of a subject injected with a radioactive isotope, each detector array (18) is associated with event analyzer circuitry (64) and detector array signals due to gamma ray emissions indicative of nuclear decay are processed and reconstructed into an image of the subject anatomy. Cadmium zinc telluride (CZT) crystals (20) outputs are amplified by complex low-noise integrated preamplifier circuits (P-ASIC 60) dissipating 300-500 mW each. Additionally, low-noise linear voltage regulators (66) providing regulated DC power to assure delivery of clean power to the P-ASIC (60), dissipate 150-250 mW each. In order to facilitate cooling of electrical components (60,66) which account for most of the dissipated power on circuit boards (62), the boards (62) are arranged parallel to each other and extend perpendicularly away from the detector array (18) to provide channels between the boards (62) through which cooling air is drawn by an array of fans.
    • 对于注射放射性同位素的受试者的核成像,每个检测器阵列(18)与事件分析器电路(64)相关联,并且由于指示核衰变的伽马射线辐射引起的检测器阵列信号被处理并重建为受试者的图像 解剖学。 镉锌碲化物(CZT)晶体(20)输出由复杂的低噪声集成前置放大器电路(P-ASIC 60)放大,每个耗散300-500 mW。 另外,提供稳压直流电源以确保向P-ASIC(60)传送清洁电力的低噪声线性稳压器(66)可以耗散150-250 mW。 为了便于对电路板(62)上大部分耗散功率的电气部件(60,66)的冷却,板(62)彼此平行地布置并垂直于检测器阵列(18)延伸, 以在通过一组风扇吸入冷却空气的板(62)之间提供通道。
    • 2. 发明申请
    • HIGH VOLTAGE DISTRIBUTION SYSTEM FOR CZT ARRAYS
    • WO2002071098A3
    • 2002-09-12
    • PCT/US2001/043390
    • 2001-11-21
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.
    • GRIESMER, Jerome, J.KLINE, Barry, D.
    • G01T1/164
    • A subject (10) is disposed adjacent a detector array (18). The subject (10) is injected with a radioactive isotope (14) and y-ray emissions indicative of nuclear decay are detected at the detector array (18) . The detector array generates electrical signals in response to each y-ray which signals are processed (64) and reconstructed (46) into an image representation of the anatomy of the subject (10). A high voltage bias is applied across the detector array. The bias is applied by a set of bias strips (80) and an electrically isolated common busbar (82) built onto a sheet of flexible circuit material. This flexible circuit (81) is highly transmissive to gamma radiation in the energy range 60-180 keV which is typically used in diagnostic nuclear medicine. Connections between the common busbar (82) and the bias strips (80) are made by resistors (92) on individual detector cards. Each bias strip is capacitively coupled (68) to the local ground on each detector card to form a Faraday shield around each detector array. Bias strips set above groups of detector arrays and electrical pads (86) are disposed along opposite faces. A substantially uniform DC electric field is set up between the strips and pads across the detector array. The strips and pads substantially surround groups of arrays defining Faraday cages. Capacitive filters (68) connected with the strips filter out noise. The capacitor's connection to the P-ASIC ground completes a Faraday Shield aroung the highly sensitive detector array (18). Resistors (92) electrically isolate each of the Faraday cages. Capacitive filters (68) connected with the strips filter out noise. The capacitor's connection to the P-ASIC ground completes a Faraday shield around the highly sensitive detector array (18). Resistors (92) electrically isolate each of the Faraday cages. Additionally, light baffles are added to prevent visible light from generating a signal in the detector array (18). Collimator vanes (16) are supported on a ground layer (100) which is separated from the conductive strips (80) by a resilient foam layer (102).
    • 3. 发明申请
    • AUTOMATED CRYSTAL IDENTIFICATION ACHIEVED VIA MODIFIABLE TEMPLATES
    • 通过可修改模板实现的自动化晶体鉴定
    • WO2011158134A2
    • 2011-12-22
    • PCT/IB2011/051837
    • 2011-04-27
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.LAURENCE, ThomasWANG, Sharon, X.GRIESMER, Jerome, J.
    • LAURENCE, ThomasWANG, Sharon, X.GRIESMER, Jerome, J.
    • G01T1/164
    • G06K9/78G01T1/1647
    • A nuclear imaging system (10) includes a crystal identification system (40) which receives a flood image (30) which includes a plurality of peaks, each peak responsive to radiation detected by a corresponding scintillator crystal. A crystal identification processor (42) partitions the flood image (30) into a plurality of regions (56), each region being masked to correspond to one of an array of nuclear detectors. A model image (62) is generated in which the at least one Gaussian models represents the identified peaks. Misidentified peaks in the model image (62) in which locations of the peaks in the flood image (30) differ from the corresponding scintillator crystal are determined and the locations of the misidentified peaks in the flood image (30) are corrected. A calibration processor (43) corrects geometric distortions in acquired projection data according to the corrected peaks.
    • 核成像系统(10)包括晶体识别系统(40),其接收包括多个峰值的泛洪图像(30),每个峰值响应于由相应的闪烁体晶体检测的辐射。 晶体识别处理器(42)将洪水图像(30)分割成多个区域(56),每个区域被掩蔽以对应于核探测器阵列之一。 产生模型图像(62),其中至少一个高斯模型表示所识别的峰值。 确定在洪水图像(30)中的峰的位置与相应的闪烁体晶体不同的模型图像(62)中的误识别的峰,并校正洪水图像(30)中的错误识别的峰的位置。 校准处理器(43)根据校正的峰值校正获取的投影数据中的几何失真。
    • 7. 发明申请
    • METHOD AND APPARATUS FOR REVERSING PERFORMANCE DEGRADATION IN SEMI-CONDUCTOR DETECTORS
    • 用于在半导体探测器中反转性能退化的方法和设备
    • WO2005040854A2
    • 2005-05-06
    • PCT/IB2004/052001
    • 2004-10-06
    • KONINKLIJKE PHILIPS ELECTRONICS, N.V.GAGNON, DanielGRIESMER, Jerome, J.
    • GAGNON, DanielGRIESMER, Jerome, J.
    • G01T1/24
    • G01T1/249G01T1/24
    • A system reverses degraded energy resolution of semiconductor radiation detection elements (44) which are used in a radiation detector assembly. A means (38) identifies semiconductor elements which exhibit degraded energy resolution as compared to an initial level of energy resolution after application of the forward bias. A means (40) restores the degraded semiconductor elements to the initial level of energy resolution by applying the reverse bias. A heater (74) accelerates the restoration process by supplying an elevated ambient temperature. A screening means (48) screens new semiconductor elements to identify the elements which are susceptible to degradation. A forward bias is applied by a forward bias means (50) to induce the degradation. A heater (52) increases an ambient temperature to accelerate the performance degradation in the new semiconductor. elements. The identified degradable elements are treated with a reverse bias prior to installation in the detector.
    • 系统逆转在辐射检测器组件中使用的半导体辐射检测元件(44)的退化能量分辨率。 装置(38)识别在施加正向偏置之后与能量分辨率的初始水平相比表现出降低的能量分辨率的半导体元件。 装置(40)通过施加反向偏压将退化的半导体元件恢复到能量分辨率的初始水平。 加热器(74)通过提供升高的环境温度来加速恢复过程。 筛选装置(48)筛选新的半导体元件以识别易受降解影响的元素。 正向偏压由正向偏压装置(50)施加以引起退化。 加热器(52)增加环境温度以加速新半导体中的性能下降。 元素。 确定的可降解元件在安装在检测器中之前用反向偏压进行处理。