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1. 发明申请

WO2008072156A3 MICROELECTRONIC SENSOR DEVICE FOR DETECTING LABEL PARTICLES 审中-公开
标题翻译：用于检测标签颗粒的微电子传感器装置
公开(公告)号：WO2008072156A3
公开(公告)日：2008-08-28
申请号：PCT/IB2007054979
申请日：2007-12-10
申请人： KONINKL PHILIPS ELECTRONICS NV , VERSCHUREN COEN ADRIANUS , BRULS DOMINIQUE MARIA , IMMINK ANDRE ALBERT HENDRIK JA , DE THEIJE FEMKE KARINA , VAN DER WIJK THEA , VAN DER LEE ALEXANDER MARC , SCHLEIPEN JOHANNES JOSEPH HUBE
发明人： VERSCHUREN COEN ADRIANUS , BRULS DOMINIQUE MARIA , IMMINK ANDRE ALBERT HENDRIK JA , DE THEIJE FEMKE KARINA , VAN DER WIJK THEA , VAN DER LEE ALEXANDER MARC , SCHLEIPEN JOHANNES JOSEPH HUBE
IPC分类号： G01N33/543
CPC分类号： G01N33/543 , G01N21/552 , G01N21/553 , G01N21/6428 , G01N21/6452 , G01N21/648 , G01N27/745 , G01N33/54306 , G01N33/54386 , Y10S436/00
摘要： The invention relates to a microelectronic sensor device for the detection of target components that comprise label particles, for example magnetic particles (1). The sensor device comprises a carrier (11) with a binding surface (12) at which target components can collect and optionally bind to specific capture elements. An input light beam (L1) is transmitted into the carrier and totally internally reflected at the binding surface (12). The amount of light in the output light beam (L2) and optionally also of fluorescence light emitted by target components at the binding surface is then detected by a light detector (31). Evanescent light generated during the total internal reflection is affected (absorbed, scattered) by target components and/or label particles (1) at the binding surface (12) and will therefore be missing in the output light beam (L2). This can be used to determine the amount of target components at the binding surface (12) from the amount of light in the output light beam (L2, L2a, L2b). A magnetic field generator (41) is optionally used to generate a magnetic field (B) at the binding surface (12) by which magnetic label particles (1) can be manipulated, for example 15 attracted or repelled.
摘要翻译：本发明涉及用于检测包含标签颗粒（例如磁性颗粒（1））的目标组分的微电子传感器装置。传感器装置包括具有结合表面（12）的载体（11），靶组分可以收集并任选地结合到特定的捕获元件。输入光束（L1）被传输到载体中并在结合表面（12）处全反射。由光检测器（31）检测输出光束（L2）中的光量以及可选地由结合表面上的目标成分发出的荧光。在全内反射期间产生的渐消光在目标部件和/或粘合表面（12）处的标签颗粒（1）受到影响（吸收，散射），因此在输出光束（L2）中将被丢失。这可以用于根据输出光束（L2，L2a，L2b）中的光量来确定结合表面（12）处的目标成分的量。可选地使用磁场发生器（41）来在绑定表面（12）处产生磁场（B），通过该磁场可以操纵磁性标签颗粒（1），例如15被吸引或排斥。

2. 发明申请

WO2011135486A3 X-RAY DETECTOR WITH IMPROVED SPATIAL GAIN UNIFORMITY AND RESOLUTION AND METHOD OF FABRICATING SUCH X-RAY DETECTOR 审中-公开
标题翻译：具有改进的空间增益均匀性和分辨率的X射线探测器以及制造这种X射线探测器的方法
公开(公告)号：WO2011135486A3
公开(公告)日：2012-04-19
申请号：PCT/IB2011051681
申请日：2011-04-19
申请人： KONINKL PHILIPS ELECTRONICS NV , VERSCHUREN COEN ADRIANUS , STEINHAUSER HEIDRUN , POORTER TIEMEN , CORNELISSEN HUGO JOHAN
发明人： VERSCHUREN COEN ADRIANUS , STEINHAUSER HEIDRUN , POORTER TIEMEN , CORNELISSEN HUGO JOHAN
IPC分类号： G01T1/20
CPC分类号： G01T1/2002
摘要： An X-raydetector (1) is proposed comprising a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed betweenthe scintillator layer (5) and the reflector layer (9). The light emission layer (7) may comprise an OLED and may be made with a thickness of less than 50 µm. Thereby, a sensitivity and resolutionofthe X-raydetector may be improved.
摘要翻译：提出了一种X射线检测器（1），其包括诸如CMOS光电检测器的光检测装置（3），诸如CsI：T1层的闪烁体层（5），反射器层（9）和发光层（7））插入在闪烁体层（5）和反射层（9）之间。发光层（7）可以包括OLED，并且可以制成具有小于50μm的厚度。因此，可以提高X射线检测器的灵敏度和分辨率。

3. 发明申请

WO2011086500A3 SEALED THIN-FILM DEVICE, OLED AND SOLAR CELL 审中-公开
标题翻译：密封薄膜器件，OLED和太阳能电池
公开(公告)号：WO2011086500A3
公开(公告)日：2011-12-08
申请号：PCT/IB2011050113
申请日：2011-01-11
申请人： KONINKL PHILIPS ELECTRONICS NV , TNO , BOUTEN PETRUS CORNELIS PAULUS , VERSCHUREN COEN ADRIANUS , LIFKA HERBERT
发明人： BOUTEN PETRUS CORNELIS PAULUS , VERSCHUREN COEN ADRIANUS , LIFKA HERBERT
IPC分类号： H01L51/52 , H01L51/44
CPC分类号： H01L51/5253 , H01L51/0097 , H01L51/448 , H01L51/5256 , H01L2227/326 , H01L2251/5338 , Y02E10/549
摘要： The invention relates to a sealed thin- film device (10) to an organic light emitting diode device (100) and to a solar cell device (200) comprising the sealed thin- film device. The sealed thin-film device comprises a thin-film device (20) and a barrier stack (30) for protecting the thin-film device from environmental influence. The barrier stack (30) comprises an inorganic barrier layer (34) in contact with at least one organic sealing layer (32) which comprises organic material comprising selected organic material selected to comprise a value of the Young's modulus (Eorg) remaining equal to or higher than 200 Mega- Pascal during a part of the processing of the sealed thin- film device during which the at least one organic sealing layer comprising the selected organic material has been applied. An effect of the sealed thin- film device according to the invention is that the use of the selected organic material reduces the crack occurrence and growth in the barrier stack which improves the sealing properties of the barrier stack and consequently improves the operational life-time of the thin- film device.
摘要翻译：本发明涉及有机发光二极管器件（100）的密封薄膜器件（10）以及包括该密封薄膜器件的太阳能电池器件（200）。密封的薄膜器件包括用于保护薄膜器件免受环境影响的薄膜器件（20）和阻挡叠层（30）。所述阻挡叠层（30）包括与至少一个有机密封层（32）接触的无机阻挡层（34），所述有机密封层（32）包含有机材料，所述有机材料包含选定的有机材料，所述有机材料选择为包括等于或小于在密封的薄膜器件的处理过程的一部分期间高于200兆帕斯卡，在该密封的薄膜器件的处理期间已经施加了包含所选择的有机材料的至少一个有机密封层。根据本发明的密封的薄膜器件的效果是使用所选择的有机材料减少了阻挡叠层中的裂纹发生和增长，这改善了阻挡叠层的密封性能并且因此提高了使用寿命薄膜器件。

4. 发明申请

WO2009013707A2 A CARRIER FOR OPTICAL EXAMINATIONS WITH LIGHT REFLECTIONS 审中-公开
标题翻译：光反射光学检查的承运人
公开(公告)号：WO2009013707A2
公开(公告)日：2009-01-29
申请号：PCT/IB2008052939
申请日：2008-07-22
申请人： KONINKL PHILIPS ELECTRONICS NV , KAHLMAN JOSEPHUS ARNOLDUS HENR , VERSCHUREN COEN ADRIANUS
发明人： KAHLMAN JOSEPHUS ARNOLDUS HENR , VERSCHUREN COEN ADRIANUS
IPC分类号： G01N21/45
CPC分类号： G01N21/45 , B01L2300/0627 , G01N21/4788 , G01N21/552
摘要： The invention relates to a carrier (111) and a microelectronic sensor device for making optical examinations with the help of the reflection of an input light beam (L1). The contact surface (112) of the carrier (111) at which the reflection takes place comprises an optical phase structure, e.g. a pattern of pits (115) and lands (114), from which an input light beam (L1) is reflected as a plurality of output light beams (L2) with phase differences. In a preferred embodiment, the phase differences are adjusted such that the output light beams destructively interfere in zero-th order. For a clean contact surface, a minimal, ideally zero signal will therefore be measured in the output light beam. If target substances (1) are present at the contact surface (112), e.g. bound to binding sites (116) on the lands (114), this balance is disturbed by frustrated total internal reflection, and a corresponding non-zero signal can be detected.
摘要翻译：本发明涉及借助于输入光束（L1）的反射进行光学检查的载体（111）和微电子传感器装置。发生反射的载体（111）的接触表面（112）包括光学相位结构，例如，凹坑（115）和平台（114）的图案，输入光束（L1）从该图案反射为具有相位差的多个输出光束（L2）。在优选实施例中，调整相位差使得输出光束以零级的方式相消干涉。因此，对于干净的接触表面，因此在输出光束中将测量最小的理想零信号。如果目标物质（1）存在于接触表面（112），例如限制在陆地（114）上的结合位点（116），这种平衡受到沮丧的全内反射的干扰，并且可以检测相应的非零信号。

5. 发明申请

WO2009081355A3 OPTICAL DISK FORMAT FOR DIRECT WRITING MATERIALS ON A SUBSTRATE 审中-公开
标题翻译：用于直接写在材料上的材料的光盘格式
公开(公告)号：WO2009081355A3
公开(公告)日：2010-01-14
申请号：PCT/IB2008055438
申请日：2008-12-18
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS CORP , CROMPVOETS FLORIS MARIA HERMAN , VERSCHUREN COEN ADRIANUS
发明人： CROMPVOETS FLORIS MARIA HERMANSZ , VERSCHUREN COEN ADRIANUS
IPC分类号： C23C14/04 , B23K26/18 , B41M5/24 , C23C14/28
CPC分类号： C23C14/048 , B23K26/0604 , B23K26/0613 , C23C14/28 , C23C14/54
摘要： A direct write carrier, system and method include an optical assembly configured to direct a writing laser and a tracking laser. A carrier has a material layer and a tracking layer. The carrier is moveable relative to the optical assembly such that when the material layer is energized by the writing laser, direct writing is provided to a surface below the carrier. The tracking layer includes readable data which is employed to control one of the optical assembly and a position of the carrier.
摘要翻译：直接写入载体，系统和方法包括配置成引导写入激光器和跟踪激光器的光学组件。载体具有材料层和跟踪层。载体相对于光学组件可移动，使得当材料层被写入激光器激励时，直接写入到载体下方的表面。跟踪层包括用于控制光学组件中的一个和载体的位置的可读数据。

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