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1. 发明申请

WO2005045385A3 METHOD FOR DETERMINING A SURFACE CONTACT FORCE 审中-公开
标题翻译：用于确定表面接触力的方法
公开(公告)号：WO2005045385A3
公开(公告)日：2006-05-04
申请号：PCT/US2004037136
申请日：2004-11-05
申请人： INNOVATIVE SCIENT SOLUTIONS IN
发明人： FONOV SERGEY D , JONES E GRANT , CRAFTON JIM W
IPC分类号： G01L20060101 , G01L1/24 , G01M9/06 , G01V1/28
CPC分类号： G01L1/24
摘要： A method of measuring a load on a surface (10, 58, 76) produced by a contact force. An elastic film or coating (12, 56, 74) is located on a supporting surface to provide an indication of normal and tangential or shear forces applied to the surface. A thickness measurement, corresponding to a normal displacement, and a tangential displacement of the film, corresponding to a shear displacement, is obtained and input to a response function to reconstruct the normal and shear load components of the contact force on the surface. A differential thickness measurement of the film is detected by an optical method in which a luminescent output from a luminophore in the film is measured. A luminescent output from a reference luminophore located below the film is also measured to provide a measurement system independent of the illumination source used to produce the luminescent output.
摘要翻译：一种测量由接触力产生的表面（10,58,76）上的载荷的方法。弹性膜或涂层（12,56,74）位于支撑表面上，以提供施加到表面的正常和切向或剪切力的指示。获得与对应于剪切位移的薄膜对应于正常位移和切向位移的厚度测量值，并将其输入到响应函数中，以重建表面上的接触力的法向和剪切载荷分量。通过光学方法检测膜的差分厚度测量，其中测量膜中发光体的发光输出。还测量了位于膜下方的参考发光体的发光输出，以提供独立于用于产生发光输出的照明源的测量系统。

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