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    • 5. 发明申请
    • EXPORTING MEASUREMENTS OF NANOPORE ARRAYS
    • 纳米级阵列的出口测量
    • WO2016073318A1
    • 2016-05-12
    • PCT/US2015/058531
    • 2015-11-01
    • GENIA TECHNOLOGIES, INC.
    • CHEN, Roger, J., A.TIAN, HuiFERNANDEZ-GOMEZ, Santiago
    • G06F19/22
    • G01N33/48721B82Y15/00C12Q1/6869G06F19/22
    • A method of exporting measurements of a nanopore sensor on a nanopore based sequencing chip is disclosed. An electrical characteristic associated with the nanopore sensor is measured. The electrical characteristic associated with the nanopore sensor is processed. A summary for the electrical characteristic and one or more previous electrical characteristics is determined. The summary for the electrical characteristic and the one or more previous electrical characteristics are exported. Determining the summary includes determining that the electrical characteristic and at least a portion of the one or more previous electrical characteristics correspond to a base call event at the nanopore sensor. The summary represents the electrical characteristic and the at least a portion of the one or more previous electrical characteristics.
    • 公开了一种在基于纳米孔的测序芯片上输出纳米孔传感器测量的方法。 测量与纳米孔传感器相关的电特性。 处理与纳米孔传感器相关的电特性。 确定电特性和一个或多个先前电特性的总结。 导出了电气特性和一个或多个以前的电气特性的总结。 确定总结包括确定电特性和一个或多个先前的电特性的至少一部分对应于纳米孔传感器处的基本呼叫事件。 总结表示电特性和一个或多个先前电特性的至少一部分。