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    • 2. 发明申请
    • TECHNIQUES FOR SELECTIVE NOISE REDUCTION AND IMAGING SYSTEM CHARACTERIZATION
    • 选择性降噪和成像系统表征技术
    • WO2012142048A2
    • 2012-10-18
    • PCT/US2012032936
    • 2012-04-10
    • FLIR SYSTEMSGARDNER DAVID WHOGASTEN NICHOLAS
    • GARDNER DAVID WHOGASTEN NICHOLAS
    • H04N5/21G06T5/00
    • G06T5/002G06T2207/10016G06T2207/20008G06T2207/20182H04N5/21H04N5/33H04N17/002
    • Various techniques are disclosed for reducing spatial and temporal noise in captured images. In one example, temporal noise may be filtered while still retaining temporal responsivity in filtered images to allow low contrast temporal events to be captured. Spatial and temporal noise filters may be selectively weighted to more strongly favor filtering using whichever one of the filters is least likely to cause a loss of signal fidelity in actual scene content. Other techniques are disclosed for determining various parameters of imaging systems having image lag. For example, a mean-variance characterization and a noise equivalent irradiance characterization may be performed to determine parameters of the imaging systems. Results of such characterizations may be used to determine the actual performance of the imaging systems without the effects of image lag.
    • 公开了各种技术用于减少所捕获图像中的空间和时间噪声。 在一个示例中,可以对时间噪声进行滤波,同时仍然保留经滤波的图像中的时间响应度以允许捕获低对比度时间事件。 空间和时间噪声滤波器可以被选择性地加权以更强烈地支持使用滤波器中的任何一个最不可能导致实际场景内容中信号保真度的损失的滤波。 公开了用于确定具有图像滞后的成像系统的各种参数的其他技术。 例如,可以执行平均方差表征和噪声等效辐照度表征以确定成像系统的参数。 可以使用这种表征的结果来确定成像系统的实际性能而没有图像滞后的影响。
    • 3. 发明申请
    • BOLOMETER CIRCUITRY AND METHODS FOR DIFFERENCE IMAGING
    • BOLOMETER电路和差分成像方法
    • WO2016111734A3
    • 2016-10-13
    • PCT/US2015056110
    • 2015-10-16
    • FLIR SYSTEMS
    • SIMOLON BRIAN BAZIZ NASEEM YHOGASTEN NICHOLAS
    • G01J1/44G01J5/24H04N5/33
    • G01J5/24G01J1/44G01J2005/0077G01J2005/202
    • Various techniques are disclosed for bolometer circuits and related methods for thermal imaging in a difference domain, where each pixel value represents a difference in incident IR radiation intensity between adjacent bolometers. For example, a bolometer circuit may include an array of bolometers each configured to generate a pixel signal in response to a bias and incident infrared radiation. Each column of the bolometer array may comprise an amplifier, a first plurality of switches each configured to selectively provide a supply voltage to a respective one of bolometers of the each column, a second plurality of switches each configured to selectively route a difference of the pixel signals of a respective adjacent pair of the bolometers of the each column to an input of the amplifier, and a third plurality of switches configured to selectively provide a common voltage to a respective one of the bolometers of the each column.
    • 公开了用于测辐射热计电路的各种技术以及用于差异域中的热成像的相关方法,其中每个像素值表示相邻测辐射热计之间的入射IR辐射强度的差异。 例如,辐射热测量计电路可以包括辐射热测量计阵列,每个辐射热测量计被配置为响应于偏置和入射红外辐射而生成像素信号。 辐射热测量计阵列的每一列可以包括放大器,第一多个开关,每个第一多个开关被配置为选择性地将电源电压提供给每列的辐射热测量计中的相应一个,第二多个开关中的每一个被配置为选择性地路由该像素 将每列的各相邻对辐射热测量计的信号与放大器的输入进行比较;以及第三多个开关,其被配置为选择性地将公共电压提供给每列的辐射热测量计中的相应一个。