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    • 1. 发明申请
    • PLATING DEVICE
    • 电镀装置
    • WO0003074A8
    • 2000-05-04
    • PCT/JP9903729
    • 1999-07-09
    • EBARA CORPHONGO AKIHISASUZUKI KENICHICHONO ATSUSHITADA MITSUOOGATA AKIRASENDAI SATOSHIMISHIMA KOJI
    • HONGO AKIHISASUZUKI KENICHICHONO ATSUSHITADA MITSUOOGATA AKIRASENDAI SATOSHIMISHIMA KOJI
    • C25D21/12G01R31/02
    • C25D21/12G01R31/026
    • A conduction condition detecting means which can detect a conduction condition (contact condition) of a plurality of feeding contacts in contact with the conduction portion of a substrate to be plated, and a plating device which can form a plating film with a uniform film thickness by uniformizing plating currents flowing through individual feeding contacts. A plating device which plates a substrate to be plated (12), wherein an electrode (13) and a substrate to be plated (12) mounted to a plating jig (11) are arranged opposite to each other in a plating tank (10), the plating jig (11) is provided with a plurality of feeding contact (15) to come into contact with the conduction portion provided on the surface of the substrate to be plated (12), and a specified voltage is applied between the feeding contacts (15) and the electrode (13) to supply a plating current through the feeding contacts (15), the plating device being provided with a conduction condition detecting means (22) for detecting a conduction condition between individual feeding contacts (15) of the plating jig (11) and the conduction portion of the substrate to be plated (12).
    • 导电条件检测装置,其能够检测与待镀基板的导电部分接触的多个馈电触点的导电状态(接触状况);以及电镀装置,其能够通过以下步骤形成具有均匀膜厚度的电镀膜: 使流过各个馈电触点的电镀电流均匀化。 本发明提供一种电镀装置,该电镀装置在镀槽(10)中对置配置电镀基板(12)的电极(13)和被镀基板(12) ,电镀夹具(11)设置有多个馈电触点(15),以与设置在待电镀基板(12)的表面上的导电部分接触,并且在馈电触点 (15)与电极(13)之间的导电状态检测装置(22),用于通过馈电触点(15)提供电镀电流,所述电镀装置设置有用于检测 电镀夹具(11)和待镀基板(12)的导电部分。