专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

WO2007111812A2 HIGH CURRENT MEASUREMENT WITH TEMPERATURE COMPENSATION 审中-公开
标题翻译：高电流测量与温度补偿
公开(公告)号：WO2007111812A2
公开(公告)日：2007-10-04
申请号：PCT/US2007/005702
申请日：2007-03-06
申请人： DYNAMP, LLC , MASRI, Farid, E. , SHERMAN, Christopher S.
发明人： MASRI, Farid, E. , SHERMAN, Christopher S.
IPC分类号： G01B9/02
CPC分类号： G01R19/32
摘要： A non-contact device for measuring current in a conductor. The device includes an interferometer with an optical fiber that extends around the conductor and through which light beams pass. The magnetic field around the conductor, caused by the current conducted through the conductor, causes a phase shift in the light beams, which is measured. The measured current is corrected as a function of the temperature of at least the fiber, and possibly also the temperature of the quarter wave plate and/or the compensation coil in the interferometer. Multiple sensors are evenly spaced and mounted to the fiber in the preferred embodiment, and the signals from the sensors are averaged. The average signal is used to correct the measured current.
摘要翻译：用于测量导体中电流的非接触式装置。该装置包括具有光纤的干涉仪，该光纤围绕导体延伸并且光束通过该干涉仪。由导体传导的电流引起的导体周围的磁场引起测量的光束的相移。测量的电流根据至少光纤的温度以及可能还有干涉仪中四分之一波片和/或补偿线圈的温度的函数进行校正。在优选实施例中，多个传感器均匀间隔并安装到光纤，并且来自传感器的信号被平均化。平均信号用于校正测量电流。

2. 发明申请

WO2009052253A1 ACCURACY ENHANCING MECHANISM AND METHOD FOR CURRENT MEASURING APPARATUS 审中-公开
标题翻译：电流测量装置的精度增强机理及方法
公开(公告)号：WO2009052253A1
公开(公告)日：2009-04-23
申请号：PCT/US2008/080110
申请日：2008-10-16
申请人： DYNAMP LLC , MASRI, Farid, E. , SHERMAN, Christopher, S.
发明人： MASRI, Farid, E. , SHERMAN, Christopher, S.
IPC分类号： G01B9/02
CPC分类号： G01R15/246 , G01R15/247
摘要： An optical interferometer used to measure the current in a conductor, where the gap between the mirror and the quarter wave plate is minimized, and the gap is shielded magnetically. Additionally, at least the modulator is shielded, and preferably the case containing many of the components, such as the integral number of turns of optical fiber in a coil, is magnetically shielded. By shielding the components, and reducing the gap between the quarter wave plate and the mirror, the error in the current measurement is substantially reduced.
摘要翻译：用于测量导体中的电流的光学干涉仪，其中反射镜和四分之一波片之间的间隙最小化，并且间隙被磁性地屏蔽。此外，至少调制器被屏蔽，并且优选地，包含许多部件的壳体，例如线圈中的光纤的整数匝被磁屏蔽。通过屏蔽部件并减小四分之一波片和反射镜之间的间隙，电流测量中的误差显着降低。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式