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    • 2. 发明申请
    • CIRCUIT TO PROVIDE TESTABILITY TO A SELF-TIMED CIRCUIT
    • 电路向自适应电路提供可测试性
    • WO2010001187A1
    • 2010-01-07
    • PCT/IB2008/001714
    • 2008-06-30
    • BAINBRIDGE, JohnSALISBURY, SeanLANDER, George
    • BAINBRIDGE, JohnSALISBURY, SeanLANDER, George
    • G01R31/3185
    • G01R31/318541G01R31/318586
    • The present invention enables asynchronous circuits to be tested in the same manner and using the same equipment and test strategies as with synchronous circuits. The feedback path of an asynchronous element, for example a Muller C element, includes a test structure which may be invoked for the purpose of providing the means for synchronous testing. When configured for testing, the test structure provides a clocked latching and selecting function which, by virtue of breaking the feedback path of the self-timing device, prevents the device being tested from switching states until desired. When the element is not in test mode, the test structure is configured to pass through the data that normally flows through the feedback path unchanged. The result is an ability to test an asynchronous device or subsystem of a device in the same manner as and / or intermixed with a synchronous device.
    • 本发明使异步电路能够以与同步电路相同的方式和使用与同步电路相同的设备和测试策略进行测试。 异步元件(例如Muller C元件)的反馈路径包括可以为了提供用于同步测试的装置而被调用的测试结构。 当配置为测试时,测试结构提供时钟锁存和选择功能,其通过破坏自定时装置的反馈路径,防止被测试的装置转换状态直到期望。 当元件不处于测试模式时,测试结构被配置为通过正常流过反馈路径的数据不变。 结果是以与同步设备相同的方式和/或与其混合来测试设备的异步设备或子系统的能力。