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    • 1. 发明申请
    • STEREO IMAGING WITH ROTATIONAL-SHEAR INTERFEROMETRY
    • 立体成像与旋转剪切干涉
    • WO2015116999A1
    • 2015-08-06
    • PCT/US2015/013909
    • 2015-01-30
    • WAYNE, Leonard, Rodenhausen
    • WAYNE, Leonard, Rodenhausen
    • G02B27/22H04N13/04
    • G02B27/2242
    • A stereo imaging system and method for generating a three-dimensional image using at least two rotational-shear interferometers. An exemplary system includes a first rotational-shear interferometer and a second rotational-shear interferometer. The first rotational-shear interferometer is configured for collecting first electromagnetic radiation from an object of interest. The second rotational-shear interferometer is configured for collecting second electromagnetic radiation from the object of interest. The first rotational-shear interferometer and the second rotational-shear interferometer are positioned relative to one another to provide stereo imaging of the object of interest. An exemplary method includes steps of collecting, by a first rotational-shear interferometer, first electromagnetic radiation from an object of interest; collecting, by a second rotational-shear interferometer, second electromagnetic radiation from the object of interest, and processing the collected first and second electromagnetic radiation to provide stereo imaging of the object of interest.
    • 一种用于使用至少两个旋转剪切干涉仪产生三维图像的立体成像系统和方法。 示例性系统包括第一旋转剪切干涉仪和第二旋转剪切干涉仪。 第一旋转剪切干涉仪被配置为收集来自感兴趣对象的第一电磁辐射。 第二旋转剪切干涉仪被配置用于从感兴趣对象收集第二电磁辐射。 第一旋转剪切干涉仪和第二旋转剪切干涉仪相对于彼此定位,以提供感兴趣对象的立体成像。 示例性方法包括以下步骤:通过第一旋转剪切干涉仪收集来自感兴趣物体的第一电磁辐射; 通过第二旋转剪切干涉仪收集来自感兴趣对象的第二电磁辐射,以及处理收集的第一和第二电磁辐射以提供感兴趣对象的立体成像。
    • 3. 发明申请
    • MICRODISSECTION WITH COUNTER-CHANGE-IN-TILT INTERFEROMETRY
    • 具有计数变化干涉的微观形态
    • WO2016049007A3
    • 2016-09-29
    • PCT/US2015051418
    • 2015-09-22
    • WAYNE LEONARD RODENHAUSEN
    • WAYNE LEONARD RODENHAUSEN
    • G01N21/45
    • G01B9/02098G01N1/286G01N21/45G01N2001/2886
    • Microdissection with counter-change-in-tiit interferometry, such as rotational-shear interferometry, and method. As used herein, and furthe explained below, the term "counter-change-in-tilt" refers to interferometer systems in which the angle between the two interfering beams o the interferometer increases or decreases as a point source at the input of the interferometer is moved laterally across the scene. Moreover, while devices and methods of the present invention relate to all counter-change-in-tiit interferometers, rotational-shear interferometers (RSI's) are non-limiting examples which can have 100% beam overlap on the detector, allowing potentially maximal resolution enhancement from the counter-change-in-tilt configuration, and a particularly long depth-of-field.
    • 显微解剖与反变化干涉测量法,如旋转剪切干涉测量法和方法。 如本文所使用的,并且如下所述,术语“反向倾斜”是指干涉仪系统,其中干涉仪两个干涉光束之间的角度随着干涉仪输入端的点光源的增加或减小而增加或减小 横向横过现场。 此外,虽然本发明的装置和方法涉及所有的反变化干涉仪,但是旋转剪切干涉仪(RSI)是非限制性示例,其可以在检测器上具有100%的光束重叠,允许潜在的最大分辨率增强 来自反倾斜配置,以及特别长的景深。