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1. 发明申请

WO2016191371A1 METHODS FOR REMOVING NUCLEI FORMED DURING EPITAXIAL GROWTH 审中-公开
标题翻译：在外源性生长期间去除核形成的方法
公开(公告)号：WO2016191371A1
公开(公告)日：2016-12-01
申请号：PCT/US2016/033783
申请日：2016-05-23
申请人： STRATIO, INC. , STRATIO
发明人： LEE, Jae Hyung , NA, Yeul , KIM, Youngsik , JUNG, Woo-shik
IPC分类号： H01L21/02 , H01L21/308
CPC分类号： H01L21/3081 , H01L21/02057 , H01L21/02082 , H01L21/02636 , H01L21/30604
摘要： A method for removing nuclei formed during a selective epitaxial growth process includes epitaxially growing a first group of one or more semiconductor structures over a substrate with one or more mask layers. A second group of a plurality of semiconductor structures is formed on the one or more mask layers. The method also includes forming one or more protective layers over the first group of one or more semiconductor structures. At least a subset of the second group of the plurality of semiconductor structures is exposed from the one or more protective layers. The method further includes, subsequent to forming the one or more protective layers over the first group of one or more semiconductor structures, etching at least the subset of the second group of the plurality of semiconductor structures.
摘要翻译：一种用于去除在选择性外延生长工艺过程中形成的核的方法包括用一个或多个掩模层在衬底上外延生长第一组一个或多个半导体结构。在一个或多个掩模层上形成第二组多个半导体结构。该方法还包括在一个或多个半导体结构的第一组上形成一个或多个保护层。多个半导体结构的第二组的至少一个子集从一个或多个保护层露出。该方法还包括：在一个或多个半导体结构的第一组上形成一个或多个保护层之后，至少蚀刻多个半导体结构的第二组的子集。

2. 发明申请

WO2017139008A1 BROADBAND VISIBLE-SHORTWAVE INFRARED SPECTROMETER 审中-公开
标题翻译：宽带可见 - 短波红外光谱仪
公开(公告)号：WO2017139008A1
公开(公告)日：2017-08-17
申请号：PCT/US2016/064585
申请日：2016-12-02
申请人： STRATIO , STRATIO, INC.
发明人： LEE, Jae Hyung , KANG, Juhyung , KIM, Youngsik , NA, Yeul , JUNG, Wooshik
IPC分类号： A61B1/06 , A61B5/00 , A61B5/145 , A61B5/1455 , G01B9/02 , G01J1/16 , G01J1/42
CPC分类号： G01J1/42 , G01J1/16 , G01J1/44 , G01J3/0208 , G01J3/021 , G01J3/14 , G01J3/1838 , G01J3/2803 , G01J3/2823 , G01J5/024 , G01J5/10 , G01J2003/1861 , G01J2003/2826 , H01L27/1461 , H01L27/14616 , H01L27/14645 , H01L27/14649 , H01L27/14689
摘要： An apparatus for analyzing visible and shortwave infrared light includes an input aperture for receiving light that includes a visible wavelength component and a shortwave infrared wavelength component; a first set of one or more lenses configured to relay light from the input aperture; one or more dispersive optical elements configured to disperse light from the first set of one or more lenses; a second set of one or more lenses configured to focus the dispersed light from the one or more dispersive optical elements; and an array detector configured for converting the light from the second set of one or more lenses to electrical signals that include electrical signals indicating intensity of the visible wavelength component and electrical signals indicating intensity of the shortwave infrared wavelength component.
摘要翻译：一种用于分析可见光和短波红外光的装置包括：输入孔，用于接收包括可见光波长成分和短波红外波长成分的光; 第一组一个或多个透镜，其被配置为中继来自所述输入孔径的光; 一个或多个色散光学元件，其被配置为分散来自所述第一组一个或多个透镜的光; 第二组一个或多个透镜，其被配置为聚焦来自所述一个或多个色散光学元件的色散光; 以及阵列检测器，被配置用于将来自第二组一个或多个透镜的光转换为包括指示可见波长成分的强度的电信号和指示短波红外波长成分的强度的电信号的电信号。

3. 发明申请

WO2021108364A1 SCANNER FOR MULTI-DIMENSIONAL CODE AND LABELS 审中-公开
公开(公告)号：WO2021108364A1
公开(公告)日：2021-06-03
申请号：PCT/US2020/061945
申请日：2020-11-24
申请人： STRATIO , STRATIO, INC. , KOREA MINTING AND SECURITY PRINTING CORPORATION
发明人： LEE, Jae, Hyung , OH, Su Ryeo , NA, Yeul , PARK, Se Jin , KIM, Youngsik , CHOE, Wongyun , CHOI, II-hoon , SEO, Bomjoon , JOO, Sunghyun , SHIN, Hwasup , CHO, Minsoo
IPC分类号： G06K7/14
摘要： A method performed at an electronic device with one or more processors and memory storing one or more programs includes receiving a plurality of images of a machine readable code. A respective image of the plurality of images corresponds to a distinct wavelength. The method also includes analyzing the respective image of the plurality of images to obtain a respective processed information; combining the respective processed information to obtain combined information; and providing the combined information to at least one program of the one or more programs stored in the memory for processing.

4. 发明申请

WO2016049558A1 PEER-TO-PEER COMMUNICATION BASED ON DEVICE IDENTIFIERS 审中-公开
标题翻译：基于设备标识符的对等通信
公开(公告)号：WO2016049558A1
公开(公告)日：2016-03-31
申请号：PCT/US2015/052410
申请日：2015-09-25
申请人： STRATIO , STRATIO, INC.
发明人： LEE, Jae, Hyung , KIM, Youngsik , NA, Yeul , JUNG, Wooshik , BHATTIPROLU, Seema
IPC分类号： H04L9/32
CPC分类号： H04L63/0876 , G06F21/44 , H04L63/104 , H04W12/06 , H04W12/08
摘要： A server system receives from a first electronic device a first device identifier and network information of the first electronic device; subsequent to receiving the first device identifier and the network information of the first electronic device, receives from a second electronic device a second device identifier and network information of the second electronic device; in response to receiving from the second electronic device the second device identifier and the network information of the second electronic device, determines whether the first device identifier is associated with the second device identifier; and, in accordance with a determination that the first device identifier is associated with the second device identifier, sends to the second electronic device the network information of the first electronic device and/or sends to the first electronic device the network information of the second electronic device.
摘要翻译：服务器系统从第一电子设备接收第一设备标识符和第一电子设备的网络信息; 在接收到第一设备标识符和第一电子设备的网络信息之后，从第二电子设备接收第二设备标识符和第二电子设备的网络信息; 响应于从所述第二电子设备接收到所述第二设备标识符和所述第二电子设备的网络信息，确定所述第一设备标识符是否与所述第二设备标识符相关联; 并且根据第一设备标识符与第二设备标识符相关联的确定，向第二电子设备发送第一电子设备的网络信息和/或向第一电子设备发送第二电子设备的网络信息设备。

5. 发明申请

WO2015084858A1 LAYER TRANSFER TECHNOLOGY FOR SILICON CARBIDE 审中-公开
标题翻译：硅碳膜转移技术
公开(公告)号：WO2015084858A1
公开(公告)日：2015-06-11
申请号：PCT/US2014/068179
申请日：2014-12-02
申请人： STRATIO , STRATIO, INC.
发明人： LEE, Jae, Hyung , JUNG, Wooshik
IPC分类号： H01L29/36
CPC分类号： H01L21/76254 , H01L21/02002 , H01L21/02381 , H01L21/02529 , H01L21/02694 , H01L21/31 , H01L29/0649 , H01L29/1608 , H01L29/36
摘要： Devices that include a layer of silicon carbide and methods for making such devices are disclosed. A method includes obtaining a first silicon carbide wafer implanted with protons; applying a first layer of spin-on-glass over the first silicon carbide wafer; obtaining a first semiconductor substrate; bonding (i) the first layer of spin-on-glass to (ii) the first semiconductor substrate; and heating the first silicon carbide wafer to initiate splitting of the first silicon carbide wafer so that a first layer of silicon carbide remains over the first semiconductor substrate. A semiconductor device includes a semiconductor substrate; a first layer of spin-on-glass positioned over the semiconductor substrate; a first layer of silicon carbide positioned over the first layer of spin-on-glass; a second layer of spin-on-glass positioned over the first layer of silicon carbide; and a second layer of silicon carbide positioned over the second layer of spin-on-glass.
摘要翻译：公开了包括碳化硅层的装置和用于制造这种装置的方法。一种方法包括获得植入质子的第一碳化硅晶片; 在第一碳化硅晶片上施加第一层旋涂玻璃; 获得第一半导体衬底; 将（i）第一层旋涂玻璃接合到（ii）第一半导体衬底; 以及加热所述第一碳化硅晶片以引发所述第一碳化硅晶片的分裂，使得第一碳化硅层保留在所述第一半导体衬底之上。半导体器件包括半导体衬底; 位于半导体衬底上的第一层旋涂玻璃; 位于第一层旋涂玻璃上的第一层碳化硅; 位于第一层碳化硅上的第二层旋涂玻璃; 以及位于第二层旋涂玻璃上的第二层碳化硅。

6. 发明申请

WO2022003217A1 MÉTODO Y SISTEMA PARA EL ACCESO RESTRINGIDO A DATOS MEDIANTE ONTOLOGÍAS 审中-公开
公开(公告)号：WO2022003217A1
公开(公告)日：2022-01-06
申请号：PCT/ES2020/070431
申请日：2020-07-03
申请人： STRATIO BIG DATA INC SUCURSAL EN ESPAÑA
发明人： OSCAR, Mendez , ROMAN, Martin , MARCO, Tulio , ROQUE, Vassal'lo
IPC分类号： G06F16/90 , G06N5/02 , G06F21/00
摘要： Se propone un método implementado por ordenador y un sistema electrónico para la gestión y el acceso a datos de una manera optimizada. La solución propuesta permite ofrecer una capa de datos, independiente del modelo físico de los datos, mediante una definición de negocio y semántica en base a ontologías. Una vez creada esta capa de datos, toda gestión y acceso al dato se realiza en base a dicha capa, lo que permite el acceso al dato en base a una definición de negocio, desacoplando todos los procesos/sistemas que explotan los datos de los modelos físicos de datos, y haciéndolos portables en diferentes escenarios.

7. 发明申请

WO2020096620A1 METHODS FOR FORMING A GERMANIUM ISLAND USING SELECTIVE EPITAXIAL GROWTH AND A SACRIFICIAL FILLING LAYER 审中-公开
公开(公告)号：WO2020096620A1
公开(公告)日：2020-05-14
申请号：PCT/US2018/060134
申请日：2018-11-09
申请人： STRATIO , LEE, Jae, Hyung
发明人： LEE, Jae, Hyung , NA, Yeul , KIM, Youngsik
IPC分类号： H01L21/20 , H01L21/203 , H01L21/205 , H01L21/223 , H01L21/34 , H01L21/36
摘要： A method for obtaining a semiconductor island includes epitaxially growing a semiconductor structure over a substrate with a mask layer defining a region not covered by the mask layer. The semiconductor structure includes a first portion located adjacent to the mask layer and a second portion located away from the mask layer. The first portion has a first height that is less than a second height of a portion of the mask layer located adjacent to the first portion. The second portion has a third height that is equal to, or greater than, the second height. The method also includes forming a filling layer over at least the first portion; and, subsequently removing at least a portion of the semiconductor structure that is located above the second height. Devices made by this method are also disclosed.

8. 发明申请

WO2019084569A1 SPECTROMETERS WITH SELF-COMPENSATION OF MISALIGNMENT 审中-公开
公开(公告)号：WO2019084569A1
公开(公告)日：2019-05-02
申请号：PCT/US2018/058059
申请日：2018-10-29
申请人： STRATIO , LEE, Jae, Hyung
发明人： LEE, Jae, Hyung , KIM, Youngsik , NA, Yeul , KANG, Juhyung
IPC分类号： G01B9/00 , G01J1/00 , G01J1/10 , G01J1/16 , G01J1/42
CPC分类号： G01B9/00 , G01J1/00 , G01J1/10 , G01J1/16 , G01J1/42
摘要： An apparatus for analyzing light includes an input aperture for receiving light; a first set of one or more lenses configured to relay light from the input aperture; and a prism assembly configured to disperse light from the first set of one or more lenses. The prism assembly includes a plurality of prisms that includes a first prism, a second prism that is distinct from the first prism, and a third prism that is distinct from the first prism and the second prism. The first prism is mechanically coupled with the second prism and the second prism is mechanically coupled with the third prism. The apparatus also includes a second set of one or more lenses configured to focus the dispersed light from the prism assembly; and an array detector configured for converting the light from the second set of one or more lenses to electrical signals.

9. 发明申请

WO2014205353A2 GATE-CONTROLLED CHARGE MODULATED DEVICE FOR CMOS IMAGE SENSORS 审中-公开
标题翻译：用于CMOS图像传感器的门控控制电荷调制装置
公开(公告)号：WO2014205353A2
公开(公告)日：2014-12-24
申请号：PCT/US2014/043421
申请日：2014-06-20
申请人： STRATIO, INC.
发明人： LEE, Jae, Hyung , NA, Yeul , KIM, Youngsik , JUNG, Woo-Shik
IPC分类号： H01L31/08
CPC分类号： H01L27/14649 , H01L27/14614 , H01L27/14616 , H01L27/14689 , H04N5/361
摘要： A device for sensing light includes a first semiconductor region doped with a dopant of a first type and a second semiconductor region doped with a dopant of a second type. The second semiconductor region is positioned above the first semiconductor region. The device includes a gate insulation layer; a gate, a source, and a drain. The second semiconductor region has a top surface that is positioned toward the gate insulation layer and a bottom surface that is positioned opposite to the top surface of the second semiconductor region. The second semiconductor region has an upper portion that includes the top surface of the second semiconductor region and a lower portion that includes the bottom surface of the second semiconductor region and is mutually exclusive with the upper portion. The first semiconductor region is in contact with both the upper portion and the lower portion of the second semiconductor region.
摘要翻译：用于感测光的装置包括掺杂有第一类型的掺杂剂的第一半导体区域和掺杂有第二类型的掺杂剂的第二半导体区域。第二半导体区域位于第一半导体区域的上方。该器件包括栅绝缘层; 一个门，一个源头和一个排水沟。第二半导体区域具有朝向栅极绝缘层定位的顶表面和与第二半导体区域的顶表面相对定位的底表面。第二半导体区域具有包括第二半导体区域的顶表面的上部和包括第二半导体区域的底表面并与上部相互排斥的下部。第一半导体区域与第二半导体区域的上部和下部部分接触。

10. 发明申请

WO2023033199A1 METHODS FOR AUTOMATICALLY IDENTIFYING A MATCH BETWEEN A PRODUCT IMAGE AND A REFERENCE DRAWING BASED ON ARTIFICIAL INTELLIGENCE 审中-公开
公开(公告)号：WO2023033199A1
公开(公告)日：2023-03-09
申请号：PCT/KR2021/011669
申请日：2021-08-31
申请人： STRATIO
发明人： LEE, Jae Hyung , KIM, Youngsik , NA, Yeul
IPC分类号： G06T7/00 , G06N20/20
摘要： A method of assessing a similarity between a product image and reference drawings may include obtaining one or more feature vectors corresponding to one or more images of a product; retrieving a plurality of trained models built to determine respective similarities to respective reference products; for a respective trained model, of the plurality of trained models, built to determine a respective similarity between the product and the respective reference product, applying the respective trained model to a feature vector of the one or more feature vectors corresponding to the one or more images of the product for determining a similarity between an image of the one or more images of the product and an image of the respective reference product; and providing the respective similarity between the product and the respective reference product. A method of such building models is also described.

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