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    • 1. 发明申请
    • METHOD FOR DEVELOPING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • 用于开发半导体集成电路器件的方法
    • WO1999031607A1
    • 1999-06-24
    • PCT/JP1997004619
    • 1997-12-16
    • HITACHI, LTD.SHIMIZU, IsaoSATOU, Masayuki
    • HITACHI, LTD.
    • G06F17/50
    • G01R31/318357G01R31/318307G06F17/5022
    • A method for developing a semiconductor integrated circuit device comprising the first processing steps (S1 to S5) for generating a device model in which the functions of a semiconductor integrated circuit device to be developed are modeled using a function describing language in such a way as to meet the target specifications, the second processing steps (S6 to S8) for designing the circuit of the circuit device based on the device model, and the third processing steps (S21 to S22) for generating a tester model in which the test items corresponding to the target specifications are modeled in parallel with the second processing and for making test design by simulating the tester model and the device model. Since the device model in which the functions of the circuit device are described meets the target specifications of the circuit device, the appropriateness of the tester model, for example, the appropriateness of a test program or the design of a test board for connecting a tester to a semiconductor device can be verified by simulating both the device model and tester model and judging whether or not the device model meets the target specifications from the results of the simulation. Therefore, test design can be carried out before the circuit of the circuit device is designed.
    • 一种用于开发半导体集成电路器件的方法,包括用于产生器件模型的第一处理步骤(S1至S5),其中使用函数描述语言对要开发的半导体集成电路器件的功能进行建模, 符合目标规范,用于基于设备型号设计电路装置的电路的第二处理步骤(S6至S8)以及用于生成测试器模型的第三处理步骤(S21至S22),其中对应于 目标规格与第二次处理并行进行建模,并通过模拟测试仪型号和设备模型进行测试设计。 由于描述了电路装置的功能的装置模型符合电路装置的目标规格,因此测试仪型号的适当性,例如测试程序的适当性或用于连接测试仪的测试板的设计 可以通过模拟设备型号和测试仪模型来验证半导体器件,并根据仿真结果判断器件型号是否符合目标规格。 因此,在设计电路设备的电路之前,可以进行测试设计。
    • 2. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT FOR INSPECTION, CIRCUIT SIMULATOR AND CIRCUIT SIMULATION METHOD
    • 用于检查的半导体集成电路,电路仿真器和电路仿真方法
    • WO1998057281A1
    • 1998-12-17
    • PCT/JP1997002041
    • 1997-06-13
    • HITACHI, LTD.SATOU, MasayukiSHIMIZU, IsaoFUKIAGE, Hiroshi
    • HITACHI, LTD.
    • G06F17/50
    • G06F17/5027
    • On a semiconductor chip are arranged a plurality of circuit cell blocks each comprising an A/D conversion circuit for converting analog input signals into digital signals, a signal processing circuit constituted similarly to a known DSP (digital signal processor) that computes and outputs a desired value based on the converted signals, and a D/A conversion circuit that converts the calculation result into an analog signal and outputs it. A variable wiring means is provided to programmably connect these circuit cell blocks together thereby to constitute an LSI for verification. A hardware simulator is realized which incorporates an analog circuit and inspects a semiconductor integrated circuit within a short period of time.
    • 在半导体芯片上布置有多个电路单元块,每个电路单元块包括用于将模拟输入信号转换为数字信号的A / D转换电路,与已知的DSP(数字信号处理器)类似地构成的信号处理电路,该DSP(数字信号处理器)计算并输出所需的 基于转换的信号的值,以及将计算结果转换为模拟信号并将其输出的D / A转换电路。 提供可变布线装置以可编程地将这些电路单元块连接在一起,从而构成用于验证的LSI。 实现了一种硬件模拟器,其包含模拟电路并且在短时间内检查半导体集成电路。
    • 3. 发明申请
    • METHOD FOR DEVELOPING SYSTEM BOARD
    • 开发系统板的方法
    • WO1999031608A1
    • 1999-06-24
    • PCT/JP1997004620
    • 1997-12-16
    • HITACHI, LTD.SHIMIZU, IsaoSATOU, Masayuki
    • HITACHI, LTD.
    • G06F17/50
    • G06F17/5022
    • A method for developing a system board using a semiconductor integrated circuit device, wherein the development of a system board is made before the development of the circuit device used for the system board is actually acquired by verifying (S31 and S32) whether or not the system board meets the target specifications of the system board by carrying out simulation using a device model in which the functions of the circuit device are modeled by using a function describing language in such a way that the target specifications of the circuit device can be met and the description of the state of the external interface of the circuit device defined conformable to the target specifications. Since the device model in which the functions of the circuit device are described meets the target specifications of the circuit device, the device model is simulated together with the description of the interface state, whether or not the circuit part related to the description of the state of the interface, namely, the interface with the circuit device is appropriate can be verified from the results of the simulation, and the design of the system board can be carried out before the completion of the development of the circuit device or the device is acquired.
    • 一种用于使用半导体集成电路器件开发系统板的方法,其中系统板的开发是在通过验证(S31和S32)是否实际获取用于系统板的电路器件的开发之前进行的(S31和S32) 通过使用使用功能描述语言来对电路装置的功能进行建模的装置模型进行仿真来实现系统板的目标规格,使得可以满足电路装置的目标规格和 描述符合目标规格的电路设备外部接口的状态。 由于描述了电路装置的功能的装置模型符合电路装置的目标规格,因此将与接口状态的描述一起模拟装置模型,无论电路部分是否与状态描述相关 的接口,即与电路设备的接口是合适的,可以从仿真结果中验证,并且系统板的设计可以在完成电路设备或设备的开发之前进行 。