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    • 1. 发明申请
    • A METHOD OF MEASURING PROPERTIES OF PARTICLES AND CORRESPONDING APPARATUS
    • 测量颗粒和相关设备性能的方法
    • WO2006137090A1
    • 2006-12-28
    • PCT/IT2005/000362
    • 2005-06-22
    • UNIVERSITA'DEGLI STUDI DI MILANOGIGLIO, MarzioPOTENZA, Marco, Alberto, Carlo
    • GIGLIO, MarzioPOTENZA, Marco, Alberto, Carlo
    • G01N15/02
    • G01N15/1459G01N2015/1497
    • A method of measuring properties of particles comprises the steps of generating a beam of radiation (IW) ; illuminating with the beam (IW) an observation region (MR) which is transited by a particle (B), a portion of the beam (IW) giving rise to radiation (SW) which is scattered by scattering interaction with the particle (B), and another portion (TW) being transmitted substantially undisturbed through the observation region (MR); and detecting, in a detection plane (M), a plurality of radiation intensity values which are determined by the interference between the scattered radiation (SW) and the transmitted radiation (TW). The detection of the radiation intensity values in the detection plane (M) is carried out according to a time sequence of acquisitions corresponding to successive transit positions of the particle through the observation region (MR). On the basis of the time sequence of acquisitions, the trend of a parameter of asymmetry of the distribution of the plurality of radiation intensity values with respect to the optical axis (z), due to the successive transit positions of the particle (B), is determined as a function of time. Depending on the trend of the parameter of asymmetry determined as a function of time, the trends of phase delay and amplitude of the scattered radiation (SW) with respect to the transmitted radiation (TW) are determined as a function of time, and the properties of the particle (B) are determined on the basis of the trends of the phase delay and amplitude of the scattered radiation (SW) as a function of time.
    • 测量颗粒性质的方法包括产生辐射束(IW)的步骤; 用光束(IW)照射由颗粒(B)转移的观察区域(MR),通过与颗粒(B)的散射相互作用而散射的辐射(SW)的一部分光束(IW) ,另一部分(TW)通过观察区域(MR)基本上不受干扰地传播; 以及在检测平面(M)中检测由散射辐射(SW)和透射辐射(TW)之间的干涉确定的多个辐射强度值。 检测平面(M)中的辐射强度值的检测根据与通过观察区域(MR)的粒子的连续传送位置相对应的时间序列进行。 基于采集的时间序列,由于粒子(B)的连续传送位置,多个辐射强度值相对于光轴(z)的分布的不对称性的参数的趋势, 被确定为时间的函数。 根据作为时间的函数确定的不对称参数的趋势,相对于透射辐射(TW)的散射辐射(SW)的相位延迟和振幅的趋势被确定为时间的函数,并且性质 基于作为时间的函数的散射辐射(SW)的相位延迟和振幅的趋势来确定粒子(B)的粒子(B)。
    • 2. 发明申请
    • A method for measuring properties of particles by means of interference fringe analysis and corresp onding apparatus
    • 一种通过干涉条纹分析和对应装置测量颗粒性质的方法
    • WO2005083389A8
    • 2006-06-22
    • PCT/IB2005000411
    • 2005-02-18
    • UNIV DEGLI STUDI MILANOGIGLIO MARZIOPOTENZA MARCO ALBERTO CARLO
    • GIGLIO MARZIOPOTENZA MARCO ALBERTO CARLO
    • G01N15/02
    • G01N15/0205
    • A method of measuring properties of particles comprises the steps of: generating a beam of radiation (IB) which is propagated along a principal axis (z), illuminating with the beam (IB) an observation region (MR) with particles (B), a portion of the beam (IB) giving rise to radiation (SW) which is scattered by interaction of the portion of the beam (IB) with the particles (B) and another portion (TB) being transmitted substantially undisturbed through the observation region (MR), and detecting, in a plane (M) disposed on the propagation axis (z), radiation intensity values which are determined by the interference between the scattered radiation (SW) and the transmitted radiation (TB). The method further comprises the steps of: identifying systems of interference fringes associated with the particles (B) in which the interference pattern is affected by a phase delay of the scattered radiation (SW) relative to the transmitted radiation (TB), the delay being determined by the interaction of the radiation beam (IB) with the particles (B), and determining the properties of the particles (B) on the basis of the lower-order interference fringes.
    • 一种测量颗粒性质的方法包括以下步骤:产生沿着主轴(z)传播的辐射束(IB),用光束(IB)照射具有颗粒(B)的观察区域(MR), 通过光束(IB)的部分与颗粒(B)和另一部分(TB)的相互作用而散射的辐射(SW)的一部分通过观察区域基本上不受干扰地传播 MR),并且在设置在传播轴(z)上的平面(M)中检测由散射辐射(SW)和透射辐射(TB)之间的干扰确定的辐射强度值。 该方法还包括以下步骤:识别与颗粒(B)相关联的干涉条纹的系统,其中干涉图案相对于透射辐射(TB)受到散射辐射(SW)的相位延迟的影响,延迟为 由辐射束(IB)与颗粒(B)的相互作用确定,并且基于低阶干涉条纹来确定颗粒(B)的性质。
    • 3. 发明申请
    • A METHOD FOR MEASURING PROPERTIES OF PARTICLES BY MEANS OF INTERFERENCE FRINGE ANALYSIS AND CORRESPONDING APPARATUS
    • 用干涉法分析和相应仪器测量粒子性质的方法
    • WO2005083389A1
    • 2005-09-09
    • PCT/IB2005/000411
    • 2005-02-18
    • UNIVERSITA` DEGLI STUDI DI MILANOGIGLIO, MarzioPOTENZA, Marco, Alberto, Carlo
    • GIGLIO, MarzioPOTENZA, Marco, Alberto, Carlo
    • G01N15/02
    • G01N15/0205
    • A method of measuring properties of particles comprises the steps of: generating a beam of radiation (IB) which is propagated along a principal axis (z), illuminating with the beam (IB) an observation region (MR) with particles (B), a portion of the beam (IB) giving rise to radiation (SW) which is scattered by interaction of the portion of the beam (IB) with the particles (B) and another portion (TB) being transmitted substantially undisturbed through the observation region (MR), and detecting, in a plane (M) disposed on the propagation axis (z), radiation intensity values which are determined by the interference between the scattered radiation (SW) and the transmitted radiation (TB). The method further comprises the steps of: identifying systems of interference fringes associated with the particles (B) in which the interference pattern is affected by a phase delay of the scattered radiation (SW) relative to the transmitted radiation (TB), the delay being determined by the interaction of the radiation beam (IB) with the particles (B), and determining the properties of the particles (B) on the basis of the lower-order interference fringes.
    • 测量粒子性质的方法包括以下步骤:产生沿主轴(z)传播的辐射束(IB),用束(IB)照射观察区域(IB) MR)与颗粒(B)接触时,部分光束(IB)产生辐射(SW),该辐射通过光束(IB)部分与颗粒(B)的相互作用而散射,另一部分(TB) 在传播轴(z)上的平面(M)中检测由散射辐射(SW)和透射辐射(SW)之间的干涉确定的辐射强度值( TB)。 该方法还包括以下步骤:识别与其中干涉图案受散射辐射(SW)相对于透射辐射(TB)的相位延迟影响的与粒子(B)相关联的干涉条纹的系统,延迟为 通过辐射束(IB)与粒子(B)的相互作用来确定,并且基于较低阶干涉条纹来确定粒子(B)的性质。
    • 4. 发明申请
    • A METHOD FOR MEASURING PROPERTIES OF PARTICLES BY MEANS OF INTERFERENCE FRINGE ANALYSIS AND CORRESPONDING APPARATUS
    • 通过干涉法测定颗粒物性的方法FRINGE分析和相关装置
    • WO2005083389A9
    • 2005-12-15
    • PCT/IB2005000411
    • 2005-02-18
    • UNIV DEGLI STUDI MILANOGIGLIO MARZIOPOTENZA MARCO ALBERTO CARLO
    • GIGLIO MARZIOPOTENZA MARCO ALBERTO CARLO
    • G01N15/02
    • G01N15/0205
    • A method of measuring properties of particles comprises the steps of: generating a beam of radiation (IB) which is propagated along a principal axis (z), illuminating with the beam (IB) an observation region (MR) with particles (B), a portion of the beam (IB) giving rise to radiation (SW) which is scattered by interaction of the portion of the beam (IB) with the particles (B) and another portion (TB) being transmitted substantially undisturbed through the observation region (MR), and detecting, in a plane (M) disposed on the propagation axis (z), radiation intensity values which are determined by the interference between the scattered radiation (SW) and the transmitted radiation (TB). The method further comprises the steps of: identifying systems of interference fringes associated with the particles (B) in which the interference pattern is affected by a phase delay of the scattered radiation (SW) relative to the transmitted radiation (TB), the delay being determined by the interaction of the radiation beam (IB) with the particles (B), and determining the properties of the particles (B) on the basis of the lower-order interference fringes.
    • 一种测量颗粒性质的方法包括以下步骤:产生沿着主轴(z)传播的辐射束(IB),用光束(IB)用颗粒(B)照射观察区域(MR), 通过光束(IB)的部分与颗粒(B)和另一部分(TB)的相互作用而散射的辐射(SW)的一部分通过观察区域基本上不受干扰地传播 MR),并且在布置在传播轴(z)上的平面(M)中检测由散射辐射(SW)和透射辐射(TB)之间的干扰确定的辐射强度值。 该方法还包括以下步骤:识别与其中干涉图案相对于透射辐射(TB)的散射辐射(SW)的相位延迟影响的粒子(B)相关联的干涉条纹的系统,延迟为 由辐射束(IB)与颗粒(B)的相互作用确定,并且基于低阶干涉条纹来确定颗粒(B)的性质。