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    • 3. 发明申请
    • SYSTEM AND METHOD FOR LOCALIZING AND PASSIVATING DEFECTS IN A PHOTOVOLTAIC ELEMENT
    • 用于在光伏元件中定位和释放缺陷的系统和方法
    • WO2010023263A1
    • 2010-03-04
    • PCT/EP2009/061110
    • 2009-08-28
    • ODERSUN AGTOBER, OlafPENNDORF, JürgenBRAUER, Wolfgang
    • TOBER, OlafPENNDORF, JürgenBRAUER, Wolfgang
    • G01R31/26H01L31/18
    • H02S50/10G01R31/025
    • The present invention relates to a system and method for localizing defects causing leakage currents in a photovoltaic element (100), a system and method for passivating defects causing leakage currents in a photovoltaic element and a system and method for passivating a shunt in a roll-to-roll photovoltaic element comprising the steps of illuminating an area (130), having at least a minimum size, of the photovoltaic element; measuring at least one electrical value of an electrical potential between electrodes of the photovoltaic element at at least one specific measurement position within the illuminated area on one of the electrodes of the photovoltaic element; and determining a position of a defect based on the measured at least one photomduced electrical value and the at least one specific measurement position.
    • 本发明涉及一种用于定位导致光电元件(100)中的漏电流的缺陷的系统和方法,用于钝化导致光伏元件中的漏电流的缺陷的系统和方法以及用于钝化光伏元件中的分流的方法, 所述光伏元件包括以下步骤:照射具有至少最小尺寸的光伏元件的区域(130); 在所述光电元件的一个电极中的所述照射区域内的至少一个特定测量位置处测量所述光伏元件的电极之间的电位的至少一个电值; 以及基于所测量的至少一个光致电值和所述至少一个特定测量位置来确定缺陷的位置。