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    • 3. 发明申请
    • VARIABLE FREQUENCY PHACOEMULSIFICATION HANDPIECE
    • 可变频率分析手段
    • WO2010075145A1
    • 2010-07-01
    • PCT/US2009/068356
    • 2009-12-17
    • BAUSCH & LOMB INCORPORATEDMOORE, Thomas, G., Jr.
    • MOORE, Thomas, G., Jr.
    • A61F9/007B06B1/02
    • A61F9/00745B06B1/0269
    • A phacoemulsification system includes a phacoemulsification handpiece having a horn coupled to a transducer configured to convert alternating current into mechanical oscillation of the horn. The phacoemulsification handpiece further includes a phacoemulsification needle attached to the horn. The phacoemulsification needle vibrates by oscillation of the horn, to provide for mechanical cutting of tissue and inducing cavitation proximate a tip of the phacoemulsification needle. The phacoemulsification system further includes a control system with associated drive circuitry in connection with the transducer of the phacoemulsification handpiece. The control system is configured to adjust an operating frequency of the transducer to increase or decrease a mechanical cutting performance and a cavitational-induced performance of the phacoemulsification needle.
    • 超声乳化乳化系统包括晶状体乳化手术件,其具有耦合到被配置为将交流电转换成喇叭的机械振荡的换能器的喇叭。 晶状体乳化手术还包括附接到喇叭的晶状体乳化针。 晶状体乳化针通过喇叭的振荡而振动,以提供组织的机械切割并且在晶状体乳化针的尖端附近引起空化。 晶状体晶状体乳化系统还包括与超声乳化手术器的换能器相关联的具有相关联的驱动电路的控制系统。 控制系统被配置为调节换能器的工作频率以增加或减少超声乳化脉冲针的机械切割性能和空穴诱导的性能。
    • 4. 发明申请
    • SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSCOPES
    • 用于能量束显微镜的单通道光学处理系统
    • WO2010025317A2
    • 2010-03-04
    • PCT/US2009/055286
    • 2009-08-28
    • OMNIPROBE, INC.MARCHMAN, HerschelMOORE, ThomasKRUGER, Rocky
    • MARCHMAN, HerschelMOORE, ThomasKRUGER, Rocky
    • H01J37/26
    • H01J37/226H01J37/3045H01J2237/2482H01J2237/317H01J2237/31749
    • A single-channel optical processing system for an energetic-beam instrument has separate sources for processing radiation (170) and illumination radiation (180) that are combined in a single optical path and directed to a sample surface (140) through a selffocusing rod lens (130). The self-focusing rod lens (130) thus has a working distance from the sample surface (140) that will not interfere with typical arrangements of ion beams (100) and electron beams (110) in such instruments. A combination of polarizers (220) and beam splitters (240) allows separation of the combined incident radiation (150) and the reflected radiation (160) from the sample surface (140) and returned through the same optical channel, so that the reflected radiation (160) may be directed to an optical detector (370), such as a camera or spectrometer.
    • 用于能量束仪器的单通道光学处理系统具有用于处理辐射(170)和照射辐射(180)的分开的源,所述辐射(170)和照射辐射(180)被组合在单个光路中并且被引导到样本表面 (140)通过自聚焦透镜(130)。 因此,自聚焦棒透镜(130)具有距样品表面(140)的工作距离,其不会干扰这种仪器中的离子束(100)和电子束(110)的典型布置。 偏振器(220)和分束器(240)的组合允许组合的入射辐射(150)和反射辐射(160)从样品表面(140)分离并且通过相同的光学通道返回,使得反射的辐射 (160)可以被引导至光学检测器(370),例如照相机或光谱仪。
    • 9. 发明申请
    • STRAIN DETECTION FOR AUTOMATED NANO-MANIPULATION
    • 用于自动纳米操作的应变检测
    • WO2006020323A3
    • 2006-11-23
    • PCT/US2005025743
    • 2005-07-21
    • MOORE THOMAS M
    • MOORE THOMAS M
    • G01N3/00G01L1/04
    • H01J37/20B82Y35/00G01L5/226H01J37/185H01J2237/20292H01J2237/204H01J2237/2062H01J2237/31745H01J2237/31749Y10S977/849
    • We disclose a strain detector for in-situ lift-out, comprising a nano-manipulator probe shaft (100); a strain gauge (120) mounted on the probe shaft; and a first cut-out on the probe shaft. The first cut-out has a rectangular cross-section (130 or 160). There is a second cut-out on the probe shaft; the second cut-out having a semiconductor cross-section. The second cut-out is positioned on the shaft opposite from the first cut-out; the first and second cut-out thus defining a thinned region in the probe. The strain gauge is mounted on the probe shaft at the location of the thinned region. There is detecting circuitry for detecting amplifying and conditioning the out put strain gauge; and wires electrically connecting the strain gauge to the detection circuitry. The wires are preferably located in the trench (140) in the probe shaft. Other embodiments are discloses With multiple strain gauge and detectors, as well as method of use.
    • 我们公开了一种用于原位剥离的应变检测器,包括纳米机械手探针轴(100); 安装在探针轴上的应变计(120); 和探头轴上的第一个切口。 第一个切口具有矩形横截面(130或160)。 探头轴上有一个第二个切口; 第二切口具有半导体横截面。 第二切口位于与第一切口相对的轴上; 因此第一和第二切口限定了探针中的变薄区域。 应变仪安装在探头轴上,位于减薄区域的位置。 有检测电路,用于检测放大应变仪的放大和调理; 以及将应变计电连接到检测电路的电线。 电线优选位于探针轴中的沟槽(140)中。 其他实施例公开了使用多个应变计和检测器以及使用方法。