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    • 9. 发明申请
    • MEASUREMENT OF OBJECT LAYER THICKNESS USING ULTRA-SONIC METHODS AND DEVICES
    • 使用超声波方法和器件测量物体层厚度
    • WO1998017178A1
    • 1998-04-30
    • PCT/US1997018993
    • 1997-10-21
    • LANG, PhilippGRAMPP, StephanMENDLEIN, John, D.
    • A61B08/00
    • A61B5/4872A61B5/6843A61B8/0858A61B8/4272
    • The present invention provides for a method of measuring layer thickness in an object comprising transmitting at least a first and a second ultra-sonic pulse from at least a first and second position; measuring at least one reflective distance from the first pulse and at least one reflective distance from the second pulse, wherein the reflective distance is from the object's external surface (or probe) to a reflective interface (5) of at least one layer; selecting the reflective distance having the shortest reflective distance to indicate the distance between the external surface (or probe surface) and the reflective interface (5) of at least one layer, wherein the selecting of the shortest reflective distance reduces ultra-sonic transmission parallax of the first and second pulses relative to a plane (4) in the object.
    • 本发明提供一种测量物体中的层厚度的方法,包括从至少第一和第二位置至少传输第一和第二超声波脉冲; 测量与第一脉冲的至少一个反射距离和距离第二脉冲的至少一个反射距离,其中反射距离是从物体的外表面(或探针)到至少一层的反射界面(5); 选择具有最短反射距离的反射距离以指示至少一层的外表面(或探针表面)和反射界面(5)之间的距离,其中选择最短反射距离减小超声波透射视差 相对于物体中的平面(4)的第一和第二脉冲。