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    • 1. 发明申请
    • ACTIVE MATRIX DISPLAY COMPENSATING METHOD
    • 有源矩阵显示补偿方法
    • WO2008066695A2
    • 2008-06-05
    • PCT/US2007/023801
    • 2007-11-15
    • EASTMAN KODAK COMPANYLEVEY, Charles, L.HAMER, John, William
    • LEVEY, Charles, L.HAMER, John, William
    • G09G3/32
    • G09G3/3233G09G3/006G09G2300/0842G09G2320/0295G09G2320/043
    • Compensating for changes in the threshold voltage of the drive transistor of an OLED drive circuit, the drive transistor includes a first electrode, second electrode, and gate electrode; connecting a first voltage source to the first electrode, and an OLED device to the second electrode and to a second voltage source; providing a test voltage to the gate electrode and connecting to the OLED drive circuit a test circuit that includes an adjustable current mirror causing voltage applied to the current mirror to be at a first test level; providing a test voltage to the gate electrode of the drive transistor and connecting the test circuit to the OLED device producing a second test level after the drive transistor and the OLED device age; and using the first and second test levels to calculate changes in the voltage applied to the gate electrode to compensate for drive transistor aging.
    • 补偿OLED驱动电路的驱动晶体管的阈值电压的变化,所述驱动晶体管包括第一电极,第二电极和栅电极; 将第一电压源连接到所述第一电极,将OLED器件连接到所述第二电极和第二电压源; 向所述栅电极提供测试电压并且将包括可调电流镜的测试电路连接到所述OLED驱动电路,所述可调电流镜使施加到所述电流镜的电压处于第一测试电平; 在所述驱动晶体管和所述OLED器件老化之后,向所述驱动晶体管的栅电极提供测试电压并将所述测试电路连接到所述OLED器件,以产生第二测试电平; 并使用第一和第二测试电平来计算施加到栅电极的电压的变化,以补偿驱动晶体管老化。
    • 4. 发明申请
    • ACTIVE MATRIX DISPLAY COMPENSATING METHOD
    • 主动矩阵显示补偿方法
    • WO2008066695A3
    • 2008-08-21
    • PCT/US2007023801
    • 2007-11-15
    • EASTMAN KODAK COLEVEY CHARLES LHAMER JOHN WILLIAM
    • LEVEY CHARLES LHAMER JOHN WILLIAM
    • G09G3/32
    • G09G3/3233G09G3/006G09G2300/0842G09G2320/0295G09G2320/043
    • Compensating for changes in the threshold voltage of the drive transistor of an OLED drive circuit, the drive transistor includes a first electrode, second electrode, and gate electrode; connecting a first voltage source to the first electrode, and an OLED device to the second electrode and to a second voltage source; providing a test voltage to the gate electrode and connecting to the OLED drive circuit a test circuit that includes an adjustable current mirror causing voltage applied to the current mirror to be at a first test level; providing a test voltage to the gate electrode of the drive transistor and connecting the test circuit to the OLED device producing a second test level after the drive transistor and the OLED device age; and using the first and second test levels to calculate changes in the voltage applied to the gate electrode to compensate for drive transistor aging.
    • 补偿OLED驱动电路的驱动晶体管的阈值电压的变化,驱动晶体管包括第一电极,第二电极和栅电极; 将第一电压源连接到第一电极,将OLED器件连接到第二电极和第二电压源; 向所述栅电极提供测试电压并连接到所述OLED驱动电路,所述测试电路包括可施加电流镜的电压处于第一测试电平的可调电流镜; 向驱动晶体管的栅电极提供测试电压并将测试电路连接到OLED器件,在驱动晶体管和OLED器件老化之后产生第二测试电平; 并且使用第一和第二测试电平来计算施加到栅电极的电压的变化以补偿驱动晶体管老化。