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1. 发明申请

WO2011139021A9 ELECTROLUMINESCENCE SAMPLE ANALYSIS APPARATUS 审中-公开
标题翻译：电致发光样品分析仪器
公开(公告)号：WO2011139021A9
公开(公告)日：2012-03-22
申请号：PCT/KR2011002250
申请日：2011-03-31
申请人： UNIV DONGGUK IND ACAD COOP , CHO HOON YOUNG , LEE DONG WHA , KWAK DONG WOOK , CHOI HYUN YUL
发明人： CHO HOON YOUNG , LEE DONG WHA , KWAK DONG WOOK , CHOI HYUN YUL
IPC分类号： G01N21/31
CPC分类号： G01N21/66
摘要： Provided is an apparatus for analyzing an electroluminescence sample, which comprises: a pulse generator for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector for receiving electroluminescence which is emitted from the electroluminescence sample according to the application of the pulse driving signal, thereby acquiring a light-receiving signal; a temperature variator for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit for analyzing a change in a time division section of the light-receiving signal delayed depending on a change of the temperature of the electroluminescence sample, and acquiring information on a defect-type charge trap which exists in the electroluminescence sample.
摘要翻译：提供了一种用于分析电致发光样品的设备，其包括：脉冲发生器，用于将脉冲驱动信号施加到电致发光样品; 一个电致发光（EL）检测器，用于接收根据施加脉冲驱动信号从电致发光样品发射的电致发光，从而获得光接收信号; 温度变化器，用于改变电致发光样品的温度; 以及电致发光瞬态光谱学（ELTS）分析单元，用于分析取决于电致发光样品的温度变化而延迟的光接收信号的时分部分的变化，并且获取关于存在的缺陷型电荷陷阱的信息在电致发光样品中。

2. 发明申请

WO2011139021A2 ELECTROLUMINESCENCE SAMPLE ANALYSIS APPARATUS 审中-公开
标题翻译：电致发光样品分析仪
公开(公告)号：WO2011139021A2
公开(公告)日：2011-11-10
申请号：PCT/KR2011002250
申请日：2011-03-31
申请人： UNIV DONGGUK IND ACAD COOP , CHO HOON YOUNG , LEE DONG WHA , KWAK DONG WOOK , CHOI HYUN YUL
发明人： CHO HOON YOUNG , LEE DONG WHA , KWAK DONG WOOK , CHOI HYUN YUL
IPC分类号： G01N21/31
CPC分类号： G01N21/66
摘要： Provided is an apparatus for analyzing an electroluminescence sample, which comprises: a pulse generator for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector for receiving electroluminescence which is emitted from the electroluminescence sample according to the application of the pulse driving signal, thereby acquiring a light-receiving signal; a temperature variator for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit for analyzing a change in a time division section of the light-receiving signal delayed depending on a change of the temperature of the electroluminescence sample, and acquiring information on a defect-type charge trap which exists in the electroluminescence sample.
摘要翻译：提供了一种用于分析电致发光样品的装置，其包括：脉冲发生器，用于向电致发光样品施加脉冲驱动信号; 根据脉冲驱动信号的应用从电致发光试样发射的电致发光的电致发光（EL）检测器，从而获取光接收信号; 用于改变电致发光样品的温度的温度变换器; 以及电致发光瞬态光谱（ELTS）分析单元，用于分析根据电致发光样品的温度变化而延迟的光接收信号的时分部分的变化，以及获取关于存在的缺陷型电荷陷阱的信息在电致发光样品中。

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