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1. 发明申请

WO2005111557A1 INTERFEROMETER AND FOURIER TRANSFORM SPECTROMETER 审中-公开
标题翻译：干涉仪和FOURIER变压器光谱仪
公开(公告)号：WO2005111557A1
公开(公告)日：2005-11-24
申请号：PCT/EP2005/005450
申请日：2005-05-19
申请人： ELDIM S.A. , LEROUX, Thierry , BOHER, Pierre , LUET, Mathieu
发明人： LEROUX, Thierry , BOHER, Pierre , LUET, Mathieu
IPC分类号： G01J3/28
CPC分类号： G01J3/45 , G01J3/4532
摘要： The invention relates to an interferometer comprising, arranged along an axis first n birefringent polarizing beam splitters, wherein n is a natural number larger than one, preferably two, second n birefringent polarizing beam spitters, which are placed on the axis following the first n birefringent polarizing beam spitters, and (50) a light sensitive detector for detecting light interference, andwherein at least one polarizing beam splitter is movably arranged such that its position perpendicular to the axis can be changed to thereby change the phase shifts between the ordinary and extraordinary beams, and wherein for at least one position (100) of the at least one movably arranged polarizing beam splitter the phase shifts created by the first half of the birefringent polarizing beam spitters and the corresponding phase shifts created by the second half of the birefringent polarizing beam spitters compensate each other at least partially. The invention furthermore relates (150) to a fourier transform spectrometer.
摘要翻译：本发明涉及一种干涉仪，其包括沿着轴线布置的n个双折射偏振光束分离器，其中n是大于1的自然数，优选为两个第二n个双折射偏振光束喷射器，它们放置在第一n个双折射后的轴上偏振光束喷射器和（50）用于检测光干涉的光敏检测器，并且其中至少一个偏振分束器可移动地布置成使得其垂直于轴的位置可以改变，从而改变普通和非常光束之间的相移，并且其中对于所述至少一个可移动地布置的偏振分束器的至少一个位置（100），由双折射偏振光束喷射器的前半部分产生的相移以及由双折射偏振光束的后半部分产生的相应相移喷溅器至少部分补偿。本发明还涉及（150）至光纤转换光谱仪。

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