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    • 6. 发明申请
    • METHOD AND APPARATUS FOR DETECTING DEFECTS IN OPTICAL COMPONENTS
    • 用于检测光学部件缺陷的方法和装置
    • WO2008125660A1
    • 2008-10-23
    • PCT/EP2008/054502
    • 2008-04-14
    • ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE)DUBOIS, FrédéricSCHOTT, GuyRAULOT, Philippe
    • DUBOIS, FrédéricSCHOTT, GuyRAULOT, Philippe
    • G01N21/958G01B11/25G01M11/02
    • G01N21/958G01B11/2527G01M11/0264G01M11/0278G06T7/521
    • A method for detecting defects in an optical component to be tested, such as a lens comprising following steps : providing a structured pattern, recording the reflected or transmitted image (21) of the pattern on the optical component to be tested, phase shifting the pattern and recording again similarly the reflected or transmitted image, calculating the local phase and amplitude images of the optical component to be tested, calculating a model image (212) of a defect free optical component and determining corresponding phase and amplitude images of the defect free model optical component, comparing (26) phase and amplitude images of both optical component to be tested and defect free model optical component, determining suspect zones (27) in the optical component to be tested, applying a metrics (28) to separate dust and noise from other defects. Related device and computer program. Use of said method to apply a selection method to a set of optical components.
    • 一种用于检测待测光学部件中的缺陷的方法,例如透镜,包括以下步骤:提供结构图案,将所述图案的反射或透射图像(21)记录在待测试的光学部件上,使图案相移 并再次类似地记录反射或传输的图像,计算待测试的光学部件的局部相位和幅度图像,计算无缺陷光学部件的模型图像(212)并且确定无缺陷模型的对应的相位和幅度图像 光学部件,比较(26)要测试的光学部件和无缺陷模型光学部件的相位和幅度图像,确定待测试的光学部件中的可疑区域(27),应用度量(28)以分离灰尘和噪声 从其他缺陷。 相关设备和计算机程序。 使用所述方法将选择方法应用于一组光学部件。