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    • 1. 发明申请
    • 位相ロックイン型高周波走査トンネル顕微鏡
    • 相位锁定型高频扫描隧道显微镜
    • WO2007102324A1
    • 2007-09-13
    • PCT/JP2007/053428
    • 2007-02-23
    • 財団法人大阪産業振興機構国立大学法人大阪大学遠藤 勝義稲垣 耕司有馬 健太
    • 遠藤 勝義稲垣 耕司有馬 健太
    • G01N13/12
    • G01Q60/12
    • Provided is a phase lock-in type high-frequency scanning tunnel microscope, which can observe an atomic image of the surface of an insulator or a wide-band-gap semiconductor. The microscope comprises a bias power source (8) for applying a high-frequency bias voltage of a rectangular or sinusoidal wave between a probe (1) and a specimen (2), a current amplifier (5) for amplifying a detection current, in which a tunnel current to flow between the probe and the specimen and a current derived from a stray capacity are mixed, and signal processing means (a lock-in amplifier (6) or a DSP) having phase lock-in functions to input the current amplified by the current amplifier and to synchronize a sampling signal with the frequency of the high-frequency bias voltage and lock the same with the frequency of the high-frequency bias voltage so that the current derived from the stray capacity is eliminated to generate a feedback signal exclusively of the tunnel current.
    • 提供一种可以观察绝缘体或宽带隙半导体的表面的原子图像的锁相型高频扫描隧道显微镜。 显微镜包括用于在探针(1)和样品(2)之间施加矩形或正弦波的高频偏置电压的偏置电源(8),用于放大检测电流的电流放大器(5) 混合在探针和样本之间流动的隧道电流和从杂散能力导出的电流,并且具有相位锁定功能的信号处理装置(锁定放大器(6)或DSP)用于输入电流 由电流放大器放大,并使采样信号与高频偏置电压的频率同步,并将其与高频偏置电压的频率锁定,从而消除从杂散容量导出的电流以产生反馈 信号专用于隧道电流。