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    • 3. 发明申请
    • PROFILING OF A COMPONENT HAVING REDUCED SENSITIVITY TO ANOMALOUS OFF-AXIS REFLECTIONS
    • 具有降低灵敏度的组件对异常偏轴反射的分析
    • WO2001011312A1
    • 2001-02-15
    • PCT/US2000/021320
    • 2000-08-04
    • METRON SYSTEMS, INC.THE BOEING COMPANY
    • JOHNSTON, Kyle, S.LOCK, Tomas, E.CLARY, Thomas, R.NELSON, Spencer, G.GREENBERG, Heath, M.
    • G01B11/24
    • G01B11/24
    • A system (100) and method for measuring the profile of an external surface of a part (101) is provided. The system (100) includes a source of light that directs light onto a region of the external surface of the part (101). The system (100) also includes a linear, light-sensitive sensor, and a lens used to image locations within the region onto the sensor. The source of light and the sensor are located substantially within the same plane such that the sensor detects substantially only light scattered, diffracted, or reflected from the region and travelling substantially within the plane. The system (100) additionally includes a re-positionable mirror (110) that re-directs the light emitted from the source of light to the plurality of locations within the region and re-directs light scattered, diffracted, or reflected from the plurality of locations within the region to the lens and sensor.
    • 提供了一种用于测量部件(101)的外表面的轮廓的系统(100)和方法。 系统(100)包括将光引导到部件(101)的外表面的区域上的光源。 系统(100)还包括线性感光传感器和用于将区域内的位置成像到传感器上的透镜。 光源和传感器基本位于相同的平面内,使得传感器基本上仅检测到从该区域散射,衍射或反射的光并且基本上在平面内行进。 系统(100)还包括可重定位镜(110),其将从光源发射的光重新引导到该区域内的多个位置,并且重新引导从多个区域散射,衍射或反射的光 区域内的透镜和传感器的位置。
    • 8. 发明申请
    • PROFILING OF A COMPONENT HAVING REDUCED SENSITIVITY TO ANOMALOUS OFF-AXIS REFLECTIONS
    • 具有降低灵敏度的组件对异常偏轴反射的分析
    • WO0111312A9
    • 2002-09-06
    • PCT/US0021320
    • 2000-08-04
    • METRON SYSTEMS INCBOEING CO
    • JOHNSTON KYLE SLOCK TOMAS ECLARY THOMAS RNELSON SPENCER GGREENBERG HEATH M
    • G01B11/24G01B11/14H01J3/14
    • G01B11/24
    • A system (100) and method for measuring the profile of an external surface of a part (101) is provided. The system (100) includes a source of light that directs light onto a region of the external surface of the part (101). The system (100) also includes a linear, light-sensitive sensor, and a lens used to image locations within the region onto the sensor. The source of light and the sensor are located substantially within the same plane such that the sensor detects substantially only light scattered, diffracted, or reflected from the region and travelling substantially within the plane. The system (100) additionally includes a re-positionable mirror (110) that re-directs the light emitted from the source of light to the plurality of locations within the region and re-directs light scattered, diffracted, or reflected from the plurality of locations within the region to the lens and sensor.
    • 提供了一种用于测量部件(101)的外表面的轮廓的系统(100)和方法。 系统(100)包括将光引导到部件(101)的外表面的区域上的光源。 系统(100)还包括线性感光传感器和用于将区域内的位置成像到传感器上的透镜。 光源和传感器基本位于相同的平面内,使得传感器基本上仅检测到从该区域散射,衍射或反射的光并且基本上在平面内行进。 系统(100)还包括可重定位镜(110),其将从光源发射的光重新引导到该区域内的多个位置,并且重新引导从多个区域散射,衍射或反射的光 区域内的透镜和传感器的位置。