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1. 发明申请

WO2022145934A1 TEST DEVICE 审中-公开
公开(公告)号：WO2022145934A1
公开(公告)日：2022-07-07
申请号：PCT/KR2021/019971
申请日：2021-12-27
申请人： LEENO INDUSTRIAL INC.
发明人： UHM, Heeil
IPC分类号： G01R31/28 , G01R1/04
摘要： Disclosed is a test device for testing electrical characteristics of an object-to-be-tested. The test device includes a test socket comprising a probe configured to transmit a test signal to the object-to-be-tested, a pusher body coupled to the test socket, a pusher unit supported on the pusher body and pressing and releasing the object-to-be-tested and a heat shield cover to perform shielding the pusher unit exposed to a top of the pusher body and releasing the shielding.

2. 发明申请

WO2022005085A1 TEST SOCKET AND METHOD OF FABRICATING THE SAME 审中-公开
公开(公告)号：WO2022005085A1
公开(公告)日：2022-01-06
申请号：PCT/KR2021/007802
申请日：2021-06-22
申请人： LEENO INDUSTRIAL INC.
发明人： BAEK, Seung ha
IPC分类号： G01R1/04 , G01R3/00 , G01R1/067
摘要： Disclosed is a test socket supporting a probe. The test socket includes a socket block of an insulating material, provided with a probe hole to accommodate the probe, and a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole, at least a portion of the internal film being electrically isolated from the external film.

3. 发明申请

WO2021235844A1 TEST SOCKET AND METHOD FOR FABRICATING THE SAME 审中-公开
公开(公告)号：WO2021235844A1
公开(公告)日：2021-11-25
申请号：PCT/KR2021/006239
申请日：2021-05-18
申请人： LEENO INDUSTRIAL INC.
发明人： KIM, Geun su , JEONG, Jae hwan , SHIN, Jung chul , BAEK, Seung ha
IPC分类号： G01R3/00 , G01R1/04 , G01R1/073 , B29C45/14
摘要： The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insulating material to a predetermined depth from an upper surface of the base member to form a probe support member; and forming a first support hole for supporting one end portion of the probe in the probe support member in the probe hole to expose the one end portion of the probe.

4. 发明申请

WO2019093614A1 A TEST PROBE ASSEMBLY AND TEST SOCKET 审中-公开
公开(公告)号：WO2019093614A1
公开(公告)日：2019-05-16
申请号：PCT/KR2018/007343
申请日：2018-06-28
申请人： LEENO INDUSTRIAL INC.
发明人： JEONG, Jae-hwan , KIM, Geun-su , SHIN, Jung-chul
IPC分类号： G01R1/067 , G01R1/18 , G01R3/00 , G01R1/04 , G01R31/28
摘要： Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved in noise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.

5. 发明申请

WO2016027953A1 A TEST SOCKET 审中-公开
标题翻译：测试插座
公开(公告)号：WO2016027953A1
公开(公告)日：2016-02-25
申请号：PCT/KR2015/002982
申请日：2015-03-26
申请人： LEENO INDUSTRIAL INC.
发明人： PARK, Sang-Duck
IPC分类号： G01R1/073 , G01R31/26
CPC分类号： G01R1/0466 , G01R1/06722 , G01R1/07314 , G01R1/07371
摘要： Disclosed is a test socket for inspecting an electronic device that is particular about properties. The test socket for inspecting electric properties of a subject includes a plurality of probes configured to be retractable in an inspection direction; a probe supporter configured to support the plurality of probes so that first ends of the plurality of probes protrudes to contact with an object contact point of a subject; and a printed circuit board (PCB) configured to be placed beneath the probe supporter, be mounted with electronic parts, be formed with holes through which second ends of the plurality of probes pass, include at least one first pad with which at least one second end of the plurality of probes comes into contact and at least one second pad formed on an opposite side to the first pad, and be formed with electric paths extended from the first pad and the second pad and connected to the mounted electronic parts.
摘要翻译：公开了一种用于检查电子设备的测试插座，该电子设备特别关于属性。用于检查被检体的电气特性的检查用插座具有构造成能够沿检查方向收缩的多个探针，探针支撑件，其构造成支撑所述多个探针，使得所述多个探针的第一端突出以与被检体的物体接触点接触; 以及配置成放置在探针支架下方的印刷电路板（PCB），安装有电子部件，形成有多个探针的第二端通过的孔，包括至少一个第一垫，至少一个第二垫多个探针的端部接触，并且至少一个第二焊盘形成在与第一焊盘相反的一侧上，并且形成有从第一焊盘和第二焊盘延伸并连接到安装的电子部件的电路径。

6. 发明申请

WO2019022391A1 A TEST PROBE 审中-公开
公开(公告)号：WO2019022391A1
公开(公告)日：2019-01-31
申请号：PCT/KR2018/007411
申请日：2018-06-29
申请人： LEENO INDUSTRIAL INC.
发明人： LEE, Woo-yeol
IPC分类号： G01R1/067 , G01R31/28
摘要： Disclosed is a test probe for testing electric characteristics of an object to be test. The test probe includes a barrel; a plunger including at least two divisional plungers which are in parallel and partially inserted facing with each other in the barrel and arranged to be movable independently of each other along a probe axial line; and an elastic body configured to provide elasticity so that the plunger can resiliently move along the probe axial line within the barrel. According to the present disclosure, the test probe is improved in contact and decreased in contact resistance, thereby enhancing test reliability.

7. 发明申请

WO2018044014A1 A TESTING DEVICE 审中-公开
标题翻译：测试设备
公开(公告)号：WO2018044014A1
公开(公告)日：2018-03-08
申请号：PCT/KR2017/009375
申请日：2017-08-28
申请人： LEENO INDUSTRIAL INC.
发明人： SHIN, Jung-chul
IPC分类号： G01R1/04 , G01R3/00 , G01R31/28
摘要： Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing socket be coupled to and separated from the testing-circuit substrate, and a slider operator which includes a main body arranged on the testing socket, and a slider pressing portion up/down-movably supported on the main body and moving down from the main body toward the slider so that the slider can slide along a surface direction of the testing socket.
摘要翻译：所公开的是一种测试设备。测试装置包括：构造成支撑多个探针的测试插座;测试电路基板，包括用于接触探针的接触点;滑块，使测试插座与测试电路基板耦合和分离;以及滑块操作器，该滑块操作器包括布置在测试插座上的主体以及可上下移动地支撑在主体上并且从主体朝向滑块向下移动的滑块推压部，使得滑块能够沿着滑块的表面方向测试套接字。

8. 发明申请

WO2017171339A1 TEST SOCKET UNIT 审中-公开
标题翻译：测试套接字单元
公开(公告)号：WO2017171339A1
公开(公告)日：2017-10-05
申请号：PCT/KR2017/003292
申请日：2017-03-28
申请人： LEENO INDUSTRIAL INC.
发明人： SON, Jang-youl
IPC分类号： G01R1/04 , G01R31/28
摘要： Disclosed is a test socket unit for electrically connecting a test object and a test circuit device. The test socket unit includes: a plurality of support locking pins configured to be stationarily installed on the surface of the test substrate; a socket main body configured to support a plurality of probes for signal transmission; a floating plate configured to include a pin guide hole in which the support locking pin is inserted; an elastic member configured to be interposed in between the socket main body and the floating plate; and at least one locking member configured to include a locking portion engaged with the locking engaging portion and prevented from separating upward by the locking stopper.
摘要翻译：公开了一种用于电连接测试对象和测试电路装置的测试插座单元。测试插座单元包括：多个支撑锁定销，被配置为静止地安装在测试基板的表面上; 插座主体，被配置为支撑用于信号传输的多个探头; 浮动板，所述浮动板构造成包括销导向孔，所述支撑锁定销插入所述销导向孔中; 弹性构件，所述弹性构件被配置为插入所述插座主体和所述浮板之间; 以及至少一个锁定构件，所述至少一个锁定构件构造成包括锁定部分，所述锁定部分与所述锁定接合部分接合并且被所述锁定阻挡件阻止向上分离

9. 发明申请

WO2016126036A1 A TEST DEVICE 审中-公开
标题翻译：测试设备
公开(公告)号：WO2016126036A1
公开(公告)日：2016-08-11
申请号：PCT/KR2016/000803
申请日：2016-01-26
申请人： LEENO INDUSTRIAL INC.
发明人： PARK, Sang Duck
IPC分类号： G01R1/04
CPC分类号： G01R1/0433 , G01R1/0408 , G01R1/0416
摘要： Disclosed is a test device for testing electric properties of an object. The test device includes an object support unit configured to support an object; a cover unit configured to include a cover body coupled to the object support unit and a pusher supported by the cover body so as to move toward and away from the object; and a pressure adjuster configured to include a multi-stage adjusting cam which is rotatably provided in the cover body while contacting the pusher and has a multi-stage contact pressing portion with contact radii varied depending on rotated angles so that the pusher can be in a moving-back position and be positioned at a plurality of pressing distances from the cover body, and an operation unit which operates the multi-stage adjusting cam.
摘要翻译：公开了一种用于测试物体的电特性的测试装置。该测试装置包括配置成支撑物体的物体支撑单元; 覆盖单元，被配置为包括联接到所述物体支撑单元的盖体和由所述盖体支撑以便朝向和远离所述物体移动的推动器; 以及压力调节器，其被配置为包括多级调节凸轮，所述多级调节凸轮可旋转地设置在所述盖体中，同时与所述推动器接触，并具有多级接触按压部分，所述多级接触按压部分的接触半径根据旋转角度而变化，使得所述推动器可以在并且从盖体定位在多个按压距离处，以及操作多级调节凸轮的操作单元。

10. 发明申请

WO2008062980A1 INDEPENDENT MODULE SOCKET BY USING CLIP AND PROBE 审中-公开
标题翻译：使用CLIP和PROBE的独立模块插座
公开(公告)号：WO2008062980A1
公开(公告)日：2008-05-29
申请号：PCT/KR2007/005818
申请日：2007-11-20
申请人： LEENO INDUSTRIAL INC. , LEE, Chaeyoon
发明人： LEE, Chaeyoon
IPC分类号： G01R1/06
CPC分类号： G01R1/0425 , G01R31/2808 , G11C5/04 , G11C29/56 , G11C29/56016 , G11C2029/5602 , H01R12/721 , H01R12/727
摘要： Disclosed is an independent module socket using clips and probes. The module socket is used to insert a memory module substrate into the module socket and test the memory module substrate. The module socket includes a probe having a plunger, a plunger cover, and an elastic body for applying elastic force between an end of the plunger and an inner portion of the plunger cover; an independent module clip formed in an S-shape lying in a horizontal direction and provided with a contact portion for making contact with the memory module substrate; and a housing having a space defined in the housing, the independent module clip being inserted into the space, and a hole formed on a lower end, the plunger being inserted into the hole to make contact with a PCB. The module socket is advantageous in that, by providing S-shaped clips lying in the horizontal direction, no separate rubber packing is necessary.
摘要翻译：公开了一种使用夹子和探针的独立模块插座。模块插座用于将内存模块基板插入模块插座并测试内存模块基板。模块插座包括具有柱塞，柱塞盖和用于在柱塞的端部和柱塞盖的内部之间施加弹力的弹性体的探针; 独立的模块夹具，形成为水平方向的S形，并且设置有用于与存储器模块基板接触的接触部分; 以及壳体，其具有限定在所述壳体中的空间，所述独立模块夹子插入所述空间中，以及形成在下端的孔，所述柱塞插入所述孔中以与PCB接触。模块插座的优点在于，通过提供水平方向上的S形夹子，不需要单独的橡胶包装。

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