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    • 35. 发明申请
    • SYSTEMS, METHODS, AND APPARATUSES FOR IMPLEMENTING INCREASED HUMAN PERCEPTION OF HAPTIC FEEDBACK SYSTEMS
    • 用于实现增加的对感知反馈系统的感知的系统,方法和设备
    • WO2018063417A1
    • 2018-04-05
    • PCT/US2016/055086
    • 2016-10-01
    • INTEL CORPORATION
    • DOGIAMIS, Georgios C.ALEKSOV, AleksandarSWAN, Johanna M.
    • G06F1/16G06F3/01
    • In accordance with disclosed embodiments, there are provided systems, methods, and apparatuses for implementing increased human perception of haptic feedback systems. For instance, there is disclosed in accordance with one embodiment there is wearable device, having therein: a wearable device case; a plurality of actuators within the wearable device case, each of which to vibrate independently or in combination; in which one surface of each of the plurality of actuators is exposed at a surface of the wearable device case; an elastomer surrounding the sides of each of the plurality of actuators within the wearable device case to hold the actuators in position within the wearable device case; and electrical interconnects from each of the plurality of actuators to internal semiconductor components of the wearable device. Other related embodiments are disclosed.
    • 根据所公开的实施例,提供了用于实现触觉反馈系统的增加的人类感知的系统,方法和装置。 例如,根据一个实施例公开了一种可穿戴设备,其中具有:可穿戴设备壳体; 可穿装置壳体内的多个致动器,每个致动器独立地或组合地振动; 其中所述多个致动器中的每一个的一个表面暴露在所述可穿装置壳体的表面处; 围绕可穿装置壳体内的多个致动器中的每一个的侧面的弹性体,以将致动器保持在可穿装置壳体内的适当位置; 以及从多个致动器中的每一个到可穿戴设备的内部半导体组件的电互连。 披露了其他相关的实施例。
    • 36. 发明申请
    • TECHNIQUES FOR DIE STACKING AND ASSOCIATED CONFIGURATIONS
    • 模块堆积和相关配置的技术
    • WO2017171863A1
    • 2017-10-05
    • PCT/US2016/025672
    • 2016-04-01
    • INTEL CORPORATION
    • HUA, FayPELTO, Christopher M.RAO, Valluri R.BOHR, Mark T.SWAN, Johanna M.
    • H01L25/07H01L25/10
    • Embodiments of the present disclosure describe techniques for fabricating a stacked integrated circuit (IC) device. A first wafer that includes a plurality of first IC dies may be sorted to identify first known good dies of the plurality of first IC dies. The first wafer may be diced to singulate the first IC dies. A second wafer that includes a plurality of second IC dies may be sorted to identify second known good dies of the plurality of second IC dies. The first known good dies may be bonded to respective second known good dies of the second wafer. In some embodiments, the first known good dies may be thinned after bonding the first known good dies to the second wafer. Other embodiments may be described and/or claimed.
    • 本公开的实施例描述了用于制造堆叠集成电路(IC)器件的技术。 包括多个第一IC管芯的第一晶圆可以被分类以识别多个第一IC管芯中的第一已知良好管芯。 可切割第一晶片以切割第一IC管芯。 包括多个第二IC管芯的第二晶圆可以被分类以识别多个第二IC管芯中的第二已知良好管芯。 第一已知良好管芯可以结合到第二晶圆的各自的第二已知良好管芯。 在一些实施例中,可在将第一已知良好裸片结合到第二晶片之后将第一已知良好裸片薄化。 其他实施例可以被描述和/或要求保护。