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    • 29. 发明申请
    • WAFER-SCANNING ION IMPLANTER HAVING FAST BEAM DEFLECTION APPARATUS FOR BEAM GLITCH RECOVERY
    • 具有快速光束偏转装置的波束扫描离子植绒装置用于光束恢复
    • WO2006084143A8
    • 2008-02-14
    • PCT/US2006003863
    • 2006-02-03
    • VARIAN SEMICONDUCTOR EQUIPMENTLOW RUSSELL JANGEL GORDON C
    • LOW RUSSELL JANGEL GORDON C
    • H01J37/317H01J37/147H01J37/304
    • H01J37/304H01J37/147H01J37/3171H01J2237/043H01J2237/15H01J2237/1501H01J2237/20228H01J2237/3045H01J2237/30472
    • An analyzer module of an ion implanter includes beam deflection apparatus adjacent to a resolving opening from which a terminal ion beam portion of an ion beam emanates. In response to a beam deflection voltage of a first value of substantially zero volts in a first operating condition, the beam deflection apparatus directs a source ion beam portion of the ion beam toward the resolving opening to generate the terminal ion beam portion. When the beam deflection voltage has a high second value in a second operating condition, the beam deflection apparatus directs the species of the source ion beam portion away from the resolving opening such that the terminal ion beam portion is substantially extinguished. Beam control circuitry is operative during the second operating condition to transition the ion implanter to the first operating condition by rapidly switching the beam deflection voltage from the second value to the first value. An implantation method employs the features of the implanter to recover from glitches during implantation and thereby improve the yield of implanted wafers.
    • 离子注入机的分析器模块包括与分离开口相邻的光束偏转装置,离子束的末端离子束部分从该分离开口发射。 响应于在第一操作条件下基本为零伏的第一值的光束偏转电压,光束偏转装置将离子束的源离子束部分引向分辨开口以产生端子离子束部分。 当光束偏转电压在第二操作条件下具有高的第二值时,光束偏转装置引导源离子束部分的种类远离分辨开口,使得末端离子束部分基本上熄灭。 光束控制电路在第二操作条件期间操作,以通过将光束偏转电压从第二值快速切换到第一值来将离子注入机转换到第一操作状态。 植入方法采用注入机的特征从植入期间的毛刺恢复,从而提高植入晶片的产量。