会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 14. 发明申请
    • TEST PREPARED RF INTEGRATED CIRCUIT
    • 测试准备的RF集成电路
    • WO2006103617A1
    • 2006-10-05
    • PCT/IB2006/050924
    • 2006-03-27
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.VAUCHER, Cicero, S.
    • VAUCHER, Cicero, S.
    • G01R31/317G01R31/28
    • G01R31/2822
    • An integrated circuit (10) comprises a mixer circuit (14, 54a) and a local oscillator circuit (18, 58). During testing a frequency divider circuit (32, 60) in the integrated circuit (10) divides a local oscillator signal to a frequency below a normal operating range of the local oscillator (18, 58). The integrated circuit applies the divided local oscillator signal to the mixer circuit (14, 54a) instead of the local oscillator signal during testing. Signal properties of a signal derived from the mixer circuit (14, 54a) are measured while the divided local oscillator signal is applied to the mixer circuit (14, 54a).
    • 集成电路(10)包括混频器电路(14,54a)和本地振荡器电路(18,58)。 在测试期间,集成电路(10)中的分频器电路(32,60)将本地振荡器信号分频到低于本地振荡器(18,58)的正常工作范围的频率。 在测试期间,集成电路将分频的本地振荡器信号施加到混频器电路(14,54a)而不是本地振荡器信号。 在分配的本地振荡器信号施加到混频器电路(14,54a)的同时测量从混频器电路(14,54a)导出的信号的信号特性。