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11. 发明申请

WO2021006609A1 TEST DEVICE 审中-公开
公开(公告)号：WO2021006609A1
公开(公告)日：2021-01-14
申请号：PCT/KR2020/008897
申请日：2020-07-08
申请人： LEENO INDUSTRIAL INC.
发明人： PARK, Donghoon
IPC分类号： G01R31/28 , G01R1/04
摘要： Disclosed is a test device for testing electric characteristics of an object-to-be-tested. The test device includes: a test socket including a probe configured to transmit a test signal to the object-to-be-tested; and a pusher unit configured to press the object-to-be-tested to move close to and away from the probe, the pusher unit including: a pressing procession configured to press the object-to-be-tested; a pusher base including the pressing projection on a first side thereof, and a plurality of heat-dissipation column insertion portions on a second side thereof; and a heat-dissipation column shaped like a bar and including one end portion to be inserted in the heat-dissipation column insertion portion, and a plurality of heat dissipation wings on an outer circumferential surface thereof.

12. 发明申请

WO2019107830A1 TEST DEVICE 审中-公开
公开(公告)号：WO2019107830A1
公开(公告)日：2019-06-06
申请号：PCT/KR2018/014396
申请日：2018-11-22
申请人： LEENO INDUSTRIAL INC.
发明人： SONG, Changhyun , JEONG, Jaehwan
IPC分类号： G01R1/067 , G01R1/18 , G01R31/28
摘要： Disclosed is a test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.

13. 发明申请

WO2018101674A1 CAMERA MODULE TEST DEVICE 审中-公开
公开(公告)号：WO2018101674A1
公开(公告)日：2018-06-07
申请号：PCT/KR2017/013411
申请日：2017-11-23
申请人： LEENO INDUSTRIAL INC.
发明人： KIM, Hee-chul
IPC分类号： H04N17/00 , H04N5/225 , G01R1/04 , G01R1/073 , G01R31/28
CPC分类号： H04N17/002 , G01R1/0416 , G01R31/2825 , H04N5/225 , H04N5/2251
摘要： Disclosed is a test device which electrically connects a terminal of an object to be tested and a testing terminal of a testing circuit. The test device includes a signal probe; a ground probe; a conductive block configured to comprise a signal probe hole through which the signal probe pass without electric contact, and a ground probe hole through which the ground probe pass with electric contact; and an insulating housing configured to accommodate the conductive block and support opposite ends of the signal probe. Thus, it is possible to effectively shield noise between the signal probe and a signal terminal.

14. 发明申请

WO2018093109A3 PROBE FOR TESTING DEVICE 审中-公开
公开(公告)号：WO2018093109A3
公开(公告)日：2018-05-24
申请号：PCT/KR2017/012845
申请日：2017-11-15
申请人： LEENO INDUSTRIAL INC.
发明人： JEONG, Jae-hwan
IPC分类号： G01R1/067 , G01R1/073 , G01R31/28
摘要： Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity than the core and plated on an outer surface of the core. The probe according to the present disclosure is not only excellent in contact with the object to be tested and durability but also has low resistance, and makes it easy to manufacture a probe supporter for supporting the probe.

15. 发明申请

WO2018093109A2 PROBE FOR TESTING DEVICE 审中-公开
公开(公告)号：WO2018093109A2
公开(公告)日：2018-05-24
申请号：PCT/KR2017/012845
申请日：2017-11-15
申请人： LEENO INDUSTRIAL INC.
发明人： JEONG, Jae-hwan
IPC分类号： G01R1/067 , G01R1/073 , G01R31/28
CPC分类号： G01R1/06761
摘要： Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity than the core and plated on an outer surface of the core. The probe according to the present disclosure is not only excellent in contact with the object to be tested and durability but also has low resistance, and makes it easy to manufacture a probe supporter for supporting the probe.

16. 发明申请

WO2017164631A1 TEST SOCKET ASSEMBLY 审中-公开
标题翻译：测试插座组件
公开(公告)号：WO2017164631A1
公开(公告)日：2017-09-28
申请号：PCT/KR2017/003040
申请日：2017-03-22
申请人： LEENO INDUSTRIAL INC.
发明人： JEONG, Jae-hwan
IPC分类号： G01R1/04 , G01R1/073 , G01R31/28
CPC分类号： G01R1/07378 , G01R1/045 , H01R12/88 , H01R13/24 , H01R2201/20
摘要： Disclosed is a test socket assembly for electrically connecting a contact point to be tested in a test object and a contact point for testing in a testing circuit. The test socket assembly includes: a plurality of signal probes; a socket block including a bottom surface facing toward the testing circuit, a top surface facing toward the test object, a plurality of probe holes for accommodating the plurality of signal probes to be parallel with one another while opposite ends of the signal probes are exposed from the top surface and the bottom surface, and a recessed portion recessed from at least partial area of the top surface and the bottom surface excluding a circumferential area of the probe holes; and an elastic grounding member accommodated in the recessed portion and made of a conductive elastic material to come into contact with at least one of the test object and the testing circuit.
摘要翻译：公开了一种测试插座组件，用于将测试对象中待测试的接触点与测试电路中的测试接触点进行电连接。测试插座组件包括：多个信号探针; 插座块，包括面向测试电路的底面，面向测试对象的顶面，多个探针孔，用于容纳多个信号探针，使得多个信号探针彼此平行，同时信号探针的相对端暴露于所述顶表面和所述底表面以及从所述顶表面和所述底表面的除了所述探测孔的周边区域以外的至少一部分区域凹陷的凹入部分; 以及一弹性接地件，该弹性接地件被容纳在该凹部中并由导电弹性材料制成，以便与被测物体和测试电路中的至少一个接触。

17. 发明申请

WO2009125901A1 TEST SOCKET 审中-公开
标题翻译：测试插座
公开(公告)号：WO2009125901A1
公开(公告)日：2009-10-15
申请号：PCT/KR2008/004385
申请日：2008-07-28
申请人： LEENO INDUSTRIAL INC. , LEE, Chae Yoon
发明人： LEE, Chae Yoon
IPC分类号： G01R31/26
CPC分类号： G01R1/0483
摘要： Disclosed is a semiconductor chip test socket having an extended service life. The socket includes a support plate having a fitting hole formed in the center, a silicone part fitted in the fitting hole of the support plate and having a protruded part, a plurality of conductive silicone portions composed of metal balls vertically disposed in the protruded part, a coupling plate placed on the protruded part and having a plurality of plungers for coming into contact with solder balls of a semiconductor chip, and a cap having through-holes corresponding to the plurality of plungers and having a reception space for receiving the protruded part, the cap being coupled to the silicone part to hold the coupling plate. The coupling plate including the plungers fitted therein for coming into contact with a solder ball of a semiconductor chip is coupled on the silicone part to prevent wear of the conductive silicone portions and thus to extend a service life.
摘要翻译：公开了具有延长的使用寿命的半导体芯片测试插座。插座包括：支撑板，其具有形成在中心的嵌合孔;硅树脂部件，其安装在所述支撑板的嵌合孔中并具有突出部;多个导电性硅树脂部，由垂直设置在所述突出部的金属球构成; 放置在突出部上并具有多个用于与半导体芯片的焊球接触的柱塞的联接板和具有与多个柱塞相对应的通孔并具有用于容纳突出部的接收空间的盖，所述盖与所述硅树脂部件联接以保持所述联接板。包括安装在其中以用于与半导体芯片的焊球接触的联接板联接在硅氧烷部分上，以防止导电硅氧烷部分的磨损，从而延长使用寿命。

18. 发明申请

WO2022149783A1 TEST SOCKET AND METHOD OF MANUFACTURING THE SAME 审中-公开
公开(公告)号：WO2022149783A1
公开(公告)日：2022-07-14
申请号：PCT/KR2021/019981
申请日：2021-12-28
申请人： LEENO INDUSTRIAL INC.
发明人： YANG, Woesuk , LEE, Byeongcheol
IPC分类号： G01R1/04 , G01R1/067 , G01R3/00 , G01R31/28
摘要： Disclosed is a test socket. The test socket includes a base frame shaped like a plate having a plurality of probe holes and conductive probes accommodated in the plurality of probe holes, having terminal portions protruding from both sides of the base frame, and comprising elastic material having higher elastic deformation than the base frame and conductive particles distributed in the elastic material.

19. 发明申请

WO2021246719A1 TEST SOCKET 审中-公开
公开(公告)号：WO2021246719A1
公开(公告)日：2021-12-09
申请号：PCT/KR2021/006641
申请日：2021-05-28
申请人： LEENO INDUSTRIAL INC.
发明人： SHIN, Young taek , LEE, Byeong cheol
IPC分类号： G01R1/04 , G01R1/067 , G01R3/00 , G01R31/28 , G01R1/0458 , G01R1/0466 , G01R1/06722 , G01R1/06733 , G01R31/2886
摘要： Disclosed is a test socket. The test socket includes a first block comprising a first base member of a conductive material and a first insulating member of an insulating material, a second block comprising a second base member of a conductive material and a second insulating member of an insulating material, a gap member of an insulating material, interposed between the first block and the second block, a first probe supported being in contact with the first base member and being not in contact with the second base member, a second probe supported being not in contact with the first base member and being in contact with the second base member, and electronic parts provided in the gap member and placed on a conductive path by which the first base member and the second base member are electrically connected.

20. 发明申请

WO2018194276A1 PROBE SOCKET 审中-公开
公开(公告)号：WO2018194276A1
公开(公告)日：2018-10-25
申请号：PCT/KR2018/003270
申请日：2018-03-22
申请人： LEENO INDUSTRIAL INC.
发明人： JEONG, Jae-hwan
IPC分类号： G01R1/04 , G01R1/067 , G01R1/073 , G01R31/28
摘要： Disclosed is a probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in parallel with the power pins, a support block for accommodating and supporting the plurality of power pins or ground pins in parallel, and a conductive plate arranged inside the support block in a direction transverse to lengthwise directions of the power pin and the ground pin and having at least one of a power connection pattern for electrically connecting the plurality of power pins in common and a ground connection pattern for electrically connecting the plurality of ground pins in common.

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