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1. 发明授权

US06331769B1 RMS power sensor with 84 dB dynamic range 有权
标题翻译：具有84 dB动态范围的RMS功率传感器
公开(公告)号：US06331769B1
公开(公告)日：2001-12-18
申请号：US09336607
申请日：1999-06-18
申请人： Vincent W. C. Wong , William W. Oldfield , Kenneth C. Harvey
发明人： Vincent W. C. Wong , William W. Oldfield , Kenneth C. Harvey
IPC分类号： G01R1508
CPC分类号： G01R21/10 , G01R21/12
摘要： A power meter includes components to measure RMS power over an 84 dB range or greater using the I-V square-law relation of a diode for measurements. The power meter includes multiple diodes along with a power distribution manifold which includes power dividers to distribute an input signal to the diodes. In one embodiment, a first power divider (202) distributes power to a first one of the diodes (203), and to the second power divider (204) which distributes power to the second (210) and third (212) diodes. The first power divider (202) is connected without attenuation to the first diode (203). The second power divider (204) is connected to the second diode (210) through a 11 dB attenuator (206), and to the third diode (212) through a 28 dB attenuator (208). With such attenuation, the first diode can operate in its square law range for measurements of signals with power from −64 dBm to −14 dBm, while the second diode can operate in its square law range for signals with power from −14 dBm to +3 dBm, and the third diode can operate within its square law range for signals with power from +3 dBm to +20 dBm. By measuring the current from the appropriate diode depending on the power level of the input signal, RMS power can be determined accurately over an 84 dB operating range. In an alternative embodiment, unequal power dividers (402) and (404) are used to distribute power and eliminate the need for attenuators (206) and (208) and to provide greater operating range sensitivity.
摘要翻译：功率计包括使用二极管测量的I-V平方律关系来测量84 dB范围或更大RMS值的组件。功率计包括多个二极管以及配电歧管，其包括用于将输入信号分配给二极管的功率分配器。在一个实施例中，第一功率分配器（202）将功率分配给二极管（203）中的第一个，以及将功率分配给第二（210）和第三（212）二极管的第二功率分配器（204）。第一功率分配器（202）没有衰减地连接到第一二极管（203）。第二功率分配器（204）通过11dB衰减器（206）连接到第二二极管（210），并通过28dB衰减器（208）连接到第三二极管（212）。通过这种衰减，第一个二极管可以在其平方律范围内工作，用于测量功率为-64 dBm至-14 dBm的信号，而第二个二极管可以在功率为-14 dBm至+ 3 dBm，对于功率为+3 dBm至+20 dBm的信号，第三个二极管可以在其平方律范围内工作。通过根据输入信号的功率电平测量来自适当二极管的电流，可以在84 dB工作范围内精确确定RMS功率。在替代实施例中，使用不等功率分配器（402）和（404）来分配功率并消除对衰减器（206）和（208）的需要并提供更大的工作范围灵敏度。

2. 发明授权

US06617838B1 Current measurement circuit 有权
标题翻译：电流测量电路
公开(公告)号：US06617838B1
公开(公告)日：2003-09-09
申请号：US09952615
申请日：2001-09-11
申请人： Evaldo M. Miranda , Michelle Mahony , John Cleary , John Blake
发明人： Evaldo M. Miranda , Michelle Mahony , John Cleary , John Blake
IPC分类号： G01R1508
CPC分类号： H03F3/38 , G01R19/0092 , H03F3/005 , H03F2200/261
摘要： The present invention is connected across a sense resistor which carries a current of interest. A first pair of cross-coupled switches are connected between the sense resistor and respective input capacitors, and a second pair of cross-coupled switches are connected between the input capacitors and the inputs of an amplifier having differential inputs and outputs. Feedback capacitors are connected between each of the amplifier's outputs and inputs. A control circuit operates the cross-coupled switches in accordance with a switching cycle, during which the connections between the sense resistor and the input capacitors are interchanged, after which the connections between the input capacitors and the differential amplifier are interchanged. When so arranged, the sensed voltage is sampled on the input capacitors and transferred to the feedback capacitors to produce a differential output voltage Vout from the differential amplifier which is proportional to the current of interest.
摘要翻译：本发明连接在一个传感电阻上，该感测电阻携带一个感兴趣的电流。第一对交叉耦合开关连接在感测电阻器和相应的输入电容器之间，第二对交叉耦合开关连接在输入电容器和具有差分输入和输出的放大器的输入端之间。反馈电容连接在每个放大器的输出和输入之间。控制电路根据开关周期来操作交叉耦合开关，在该开关周期期间，感测电阻器和输入电容器之间的连接被互换，之后输入电容器和差分放大器之间的连接被互换。当这样布置时，感测的电压在输入电容器上被采样并被传送到反馈电容器，以从与感兴趣的电流成比例的差分放大器产生差分输出电压Vout。

3. 发明授权

US06548999B2 RMS power sensor with 84 dB dynamic range 有权
公开(公告)号：US06548999B2
公开(公告)日：2003-04-15
申请号：US09933477
申请日：2001-08-17
申请人： Vincent W. C. Wong , William W. Oldfield , Kenneth C. Harvey
发明人： Vincent W. C. Wong , William W. Oldfield , Kenneth C. Harvey
IPC分类号： G01R1508
CPC分类号： G01R21/10 , G01R21/12
摘要： A power meter includes components to measure RMS power over an 84 dB range or greater using the I-V square-law relation of a diode for measurements. The power meter includes multiple diodes along with a power distribution manifold which includes power dividers to distribute an input signal to the diodes. In one embodiment, a first power divider (202) distributes power to a first one of the diodes (203), and to the second power divider (204) which distributes power to the second (210) and third (212) diodes. The first power divider (202) is connected without attenuation to the first diode (203). The second power divider (204) is connected to the second diode (210) through a 11 dB attenuator (206), and to the third diode (212) through a 28 dB attenuator (208). With such attenuation, the first diode can operate in its square law range for measurements of signals with power from −64 dBm to −14 dBm, while the second diode can operate in its square law range for signals with power from −14 dBm to +3 dBm, and the third diode can operate within its square law range for signals with power from +3 dBm to +20 dBm. By measuring the current from the appropriate diode depending on the power level of the input signal, RMS power can be determined accurately over an 84 dB operating range. In an alternative embodiment, unequal power dividers (402) and (404) are used to distribute power and eliminate the need for attenuators (206) and (208) and to provide greater operating range sensitivity.

4. 发明授权

US06218824B1 Simplified user interface and control system for a multimeter 失效
标题翻译：用于万用表的简化用户界面和控制系统
公开(公告)号：US06218824B1
公开(公告)日：2001-04-17
申请号：US09074444
申请日：1998-05-07
申请人： H. Wayne Oldstead , Frank Goovaerts , Theodore G. Nelson , Michael R. Engbretson , J. Steve Lyford , Jerry L. Wrisley , Charles L. Saxe , James L. Williamson
发明人： H. Wayne Oldstead , Frank Goovaerts , Theodore G. Nelson , Michael R. Engbretson , J. Steve Lyford , Jerry L. Wrisley , Charles L. Saxe , James L. Williamson
IPC分类号： G01R1508
CPC分类号： G01R15/125 , G01R13/02
摘要： A simplified user interface for an electronic test and measurement device comprises an arrangement of a segmented LCD device and a plurality of keys used to implement a softkey system, in combination with a single AMPs input connector and a rotary selector having only a single position for each basic kind of parameter to be measured. The segmented LCD device includes, at each location adjacent to a key, a plurality of segments representing a vertically-arranged list of functions to be controlled. In one embodiment of the invention, the housing of the electronic test and measurement device is fabricated to have finger-like projections overlaying a portion of the LCD screen for creating the appearance of the continuation of displayed LCD softkey separation lines.
摘要翻译：用于电子测试和测量装置的简化的用户界面包括分段LCD装置和用于实现软键系统的多个键的结构，其结合单个AMP输入连接器和仅具有用于每个的单个位置的旋转选择器要测量的基本类型的参数。分段LCD装置在与键相邻的每个位置处包括表示垂直排列的要被控制的功能列表的多个段。在本发明的一个实施例中，电子测试和测量装置的壳体被制造成具有覆盖LCD屏幕的一部分的手指状突起，用于产生显示的LCD软键分离线的延续的外观。

5. 发明授权

US06552527B1 Wafer map display apparatus and method for semiconductor test system 失效
公开(公告)号：US06552527B1
公开(公告)日：2003-04-22
申请号：US09711704
申请日：2000-11-13
申请人： Mitsue Nanbu
发明人： Mitsue Nanbu
IPC分类号： G01R1508
CPC分类号： G01R31/2851 , G01R31/2831 , H01L23/544 , H01L2924/0002 , H01L2924/00
摘要： A wafer map display apparatus and method for displaying an entire image of a semiconductor wafer and IC chips therein with an optimal display size within a specified window size. The wafer map display apparatus acquires window size information for displaying a wafer map of a semiconductor wafer under test in a specified window, and calculates a chip display size every time when test results and XY address data of an IC chip that has been tested is received with use of all of XY address data of IC chips that have been tested, and renews the wafer map display based on the newest chip display size, thereby displaying all of the IC chips that have been tested and an overall semiconductor wafer under test with an optimum size within the specified window.

6. 发明授权

US06181126B2 Dual variable color measuring system 失效
标题翻译：双变色测量系统
公开(公告)号：US06181126B2
公开(公告)日：2001-01-30
申请号：US09335281
申请日：1999-06-17
申请人： Karel Havel
发明人： Karel Havel
IPC分类号： G01R1508
CPC分类号： G01R13/26 , G01R13/02 , G01R13/405 , G01R15/125 , G09G3/14 , G09G2300/0452 , G09G2310/0275 , G09G2320/0666
摘要： A measuring system performs measurement of two measured values and simultaneously exhibits the two measurement results in a digital format on a single variable color display device in respectively different colors, in order to distinguish them comfortably.
摘要翻译：测量系统执行两个测量值的测量，并且以单独的可变颜色显示设备分别以不同的颜色在数字格式中显示两个测量结果，以便舒适地区分它们。

7. 发明授权

US06774620B2 Wafer map display apparatus and method for semiconductor test system for displaying an image of wafer and IC chips with optimum display size 失效
标题翻译：用于以最佳显示尺寸显示晶片和IC芯片的图像的半导体测试系统的晶片映射显示装置和方法
公开(公告)号：US06774620B2
公开(公告)日：2004-08-10
申请号：US10373919
申请日：2003-02-25
申请人： Mitsue Nanbu
发明人： Mitsue Nanbu
IPC分类号： G01R1508
CPC分类号： G01N21/9501
摘要： A wafer map display apparatus and method for displaying an entire image of a semiconductor wafer and IC chips therein with an optimal display size within a specified window size. The wafer map display apparatus acquires window size information for displaying a wafer map of a semiconductor wafer under test in a specified window, and calculates a chip display size every time when receiving test results and XY address data of an IC chip that has been tested with use of all of XY address data of IC chips that have been tested, and renews the wafer map display based on the newest chip display size, thereby displaying all of the IC chips that have been tested and an overall semiconductor wafer under test with an optimum size within the specified window.
摘要翻译：一种用于以特定窗口尺寸内的最佳显示尺寸显示半导体晶片及其IC芯片的整个图像的晶片地图显示装置和方法。晶片图显示装置获取用于在指定窗口中显示被测半导体晶片的晶片图的窗口尺寸信息，并且每当接收测试结果时的芯片显示尺寸和已经被测试的IC芯片的XY地址数据使用已经测试的IC芯片的所有XY地址数据，并且基于最新的芯片显示尺寸更新晶片图显示，从而显示已经被测试的所有IC芯片和正在测试的整个半导体晶片，具有最佳在指定窗口内的大小。

8. 发明授权

US06734658B1 Wireless alternating current phasing voltmeter multimeter 有权
标题翻译：无线交流电流相位电压表万用表
公开(公告)号：US06734658B1
公开(公告)日：2004-05-11
申请号：US10117000
申请日：2002-04-05
申请人： Walter S Bierer
发明人： Walter S Bierer
IPC分类号： G01R1508
CPC分类号： G01R15/14
摘要： A wireless alternating current phasing voltmeter multimeter that uses modular wireless based components in order to provide indications of highly desirable parameters of interest, such as AC voltage, phase rotation, and the number of degrees difference between phases. The use of wireless technology eliminates the cable customarily used to interconnect the test probes and the metering circuitry, which may effectively eliminate the concern regarding the distance separating the power lines that are to be tested. The wireless alternating current phasing voltmeter multimeter has two base modules, but, because of the flexibility of the design, modifications can be readily incorporated into the present invention modules that allow for numerous operational and functional permutations to be implemented in order to meet an individual user's needs including the use of one of the modules as a hand-held base module that can be remotely located away from the electrical power lines (or test points).
摘要翻译：一种无线交流电相控电压表万用表，其使用模块化的基于无线的组件，以提供高度期望的感兴趣参数的指示，例如AC电压，相位旋转和相位之间的差数。使用无线技术消除了通常用于互连测试探针和计量电路的电缆，这可以有效地消除对分离要测试的电力线的距离的担忧。无线交流电相控电压表万用表具有两个基本模块，但是由于设计的灵活性，可以将修改容易地并入到本发明的模块中，从而实现多种操作和功能排列，以便满足个体用户的需要包括使用其中一个模块作为远程远离电力线（或测试点）的手持基座模块。

9. 发明授权

US06603301B2 Multiple range current measurement system with low power dissipation, fast setting time, and low common mode voltage error 有权
标题翻译：多范围电流测量系统，功耗低，设置时间短，共模电压低
公开(公告)号：US06603301B2
公开(公告)日：2003-08-05
申请号：US09912351
申请日：2001-07-26
申请人： Michael J. Benes
发明人： Michael J. Benes
IPC分类号： G01R1508
CPC分类号： G01R19/0092 , G01R15/09
摘要： A multi-range measuring circuit for measuring a flow of electrical current between a first node and a second node. A measurement resistor is connected to the first node to develop a voltage having a high range output. A summing node connected in series with the measurement resistor acts as an input to an amplifier for developing a second voltage having a low range output having a higher scale factor than the high range output. If the capacity of the amplifier to maintain the low range as a linear function is exceeded, a bypass circuit bypasses excess current flow to the second node.
摘要翻译：一种用于测量第一节点和第二节点之间的电流的多范围测量电路。测量电阻器连接到第一节点以产生具有高范围输出的电压。与测量电阻串联连接的求和节点用作放大器的输入，用于开发具有比高范围输出更高比例因子的低范围输出的第二电压。如果超过放大器维持低电平范围的容量，则旁路电路将过剩电流旁路到第二节点。

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