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1. 发明授权

US11988615B2 Region prober optical inspector 有权
公开(公告)号：US11988615B2
公开(公告)日：2024-05-21
申请号：US17576986
申请日：2022-01-16
申请人： Lumina Instruments
发明人： Steven W. Meeks , Hung Phi Nguyen , Alireza Shahdoost Moghaddam
IPC分类号： G01N21/958 , G01N21/21 , G01N21/55 , G01N21/84 , G01N21/896 , G02B26/08 , G02B26/10 , G02B27/54
CPC分类号： G01N21/958 , G01N21/21 , G01N21/55 , G01N21/8422 , G02B26/0816 , G02B26/101 , G02B26/105 , G02B27/54 , G01N21/896 , G01N2021/8967 , G01N2201/06113 , G01N2201/0633 , G01N2201/0636
摘要： An optical scanning system including a radiating source that outputs a light beam, a time varying beam reflector that reflects the light beam through a scan lens towards a transparent sample at an incident angle of plus or minus ten degrees from Brewster's angle, a focusing lens configured to be irradiated by light scattered from the transparent sample, and a detector that is irradiated by the light scattered from the transparent sample. The detector outputs a signal that indicates an intensity of light measured by the detector. None of the light scattered from the transparent sample is blocked. The light scattered from the transparent sample is scattered from the top surface of the transparent sample, the bottom surface of the transparent sample, or any location in between the top surface of the transparent sample and the bottom surface of the transparent sample.

2. 发明授权

US11867924B2 Visualizing catheter irrigation using schlieren images 有权
公开(公告)号：US11867924B2
公开(公告)日：2024-01-09
申请号：US17133989
申请日：2020-12-24
申请人： Biosense Webster (Israel) Ltd.
发明人： Assaf Govari , Amit Fuchs , Eran Aharon , Yehuda Algawi
IPC分类号： G02B27/54 , G01N21/45 , A61B18/00
CPC分类号： G02B27/54 , A61B18/00 , G01N21/45 , G01N21/455
摘要： A system for visualizing catheter irrigation, the system includes a fluid container, a pump, a schlieren imaging assembly and a processor. The fluid container is configured to: (i) contain a first fluid, which is at least partially transparent and has a first temperature, and (ii) receive into the first fluid a catheter having one or more irrigation holes. The pump is configured to inject, through the one or more irrigation holes, a second fluid, which is at least partially transparent and has a second different temperature. The schlieren imaging assembly is configured to acquire schlieren images of turbulence occurring in the first fluid when injecting the second fluid, and the processor is configured to visualize the irrigation using the schlieren images.

3. 发明授权

US09599497B1 Background oriented Schlieren using celestial objects 有权
公开(公告)号：US09599497B1
公开(公告)日：2017-03-21
申请号：US14811994
申请日：2015-07-29
申请人： The United States of America as Represented by the Administrator of NASA
发明人： Edward A Haering, Jr. , Michael A Hill
IPC分类号： G01C1/00 , G01F1/708 , G01P3/38
CPC分类号： G01F1/7086 , G01P3/38 , G02B27/54
摘要： The present invention is a system and method of visualizing fluid flow around an object, such as an aircraft or wind turbine, by aligning the object between an imaging system and a celestial object having a speckled background, taking images, and comparing those images to obtain fluid flow visualization.

4. 发明授权

US3582185A Schlieren optical system 失效
标题翻译： SCHLIEREN光学系统
公开(公告)号：US3582185A
公开(公告)日：1971-06-01
申请号：US3582185D
申请日：1969-04-22
申请人： WERNER STEIGER , HEINRICH HOGG
发明人： STEIGER WERNER , HOGG HEINRICH
IPC分类号： G02B27/54 , H04N5/74 , G02F1/28
CPC分类号： G02B27/54 , H04N5/7425
摘要： This invention relates to a Schlieren optical system comprising a medium for controlling the light of a separate light source for illuminating the image field on the control medium, and a masking system having mirrors arranged in a checkerboard pattern located in the path of the illuminating beam to divide the light into individual rays, the mirrors being so mounted as to provide a masking system in the path of the image beam to prevent or allow the passage of light when the control medium is in an undeformed or deformed state respectively.

5. 发明授权

US3439982A Optical insetting 失效
标题翻译：光学插件
公开(公告)号：US3439982A
公开(公告)日：1969-04-22
申请号：US3439982D
申请日：1967-12-20
申请人： GEN PRECISION SYSTEMS INC
发明人： LUDWIG URBAN W
IPC分类号： G02B27/54 , G03B21/26
CPC分类号： G02B27/54

6. 发明授权

US3283309A Information thermoplastic recording 失效
标题翻译：信息热塑记录
公开(公告)号：US3283309A
公开(公告)日：1966-11-01
申请号：US21808362
申请日：1962-08-20
申请人： GEN ELECTRIC
发明人： JOSEPH GAYNOR
IPC分类号： G02B27/54 , G03G5/022 , G06K19/02 , H04N5/82
CPC分类号： H04N5/82 , G02B27/54 , G03G5/022 , G06K19/02

7. 发明授权

US3041395A Bar system in schlieren-optical systems 失效
标题翻译：系统光学系统中的棒系统
公开(公告)号：US3041395A
公开(公告)日：1962-06-26
申请号：US79352159
申请日：1959-02-16
申请人： GRETAG AG
发明人： FRED MAST
IPC分类号： G02B27/54 , H01J29/56 , H04N5/74
CPC分类号： H01J29/56 , G02B27/54 , H04N5/7425

8. 发明授权

US2629283A Interference schlieren apparatus of unusually large dimensions, having means for improving the interference quality by selective one point deformation of the reflecting elements of the device 失效
标题翻译：具有异常大尺寸的干涉仪，具有通过设备的反射元件的选择性一点变形来提高干扰质量的装置
公开(公告)号：US2629283A
公开(公告)日：1953-02-24
申请号：US21536651
申请日：1951-03-13
申请人： ZOBEL THEODOR W
发明人： ZOBEL THEODOR W
IPC分类号： G02B27/54
CPC分类号： G02B27/54

9. 发明授权

US08810781B2 Device and method for measuring vaporization-melt ratio 有权
标题翻译：测量汽化熔体比的装置和方法
公开(公告)号：US08810781B2
公开(公告)日：2014-08-19
申请号：US13447314
申请日：2012-04-16
申请人： Xuyue Wang , Lianji Wang , Wenji Xu , Yande Liang , Renke Kang , Dongming Guo
发明人： Xuyue Wang , Lianji Wang , Wenji Xu , Yande Liang , Renke Kang , Dongming Guo
IPC分类号： G01N21/00 , G02B27/54 , G01N5/04
CPC分类号： G02B27/54 , G01N5/04
摘要： A detection device is described for measuring the vaporization-melt ratio, the device including a light source, a first and second optical lens group, a slit, a first and second steering mirror, a first and second primary mirror, a glass container, a colored blade, and a high-speed recording analyzer. The first primary mirror and the second primary mirror are symmetrically placed at both ends of the glass container. The first optical lens group is located between the light source and the slit. The second optical lens group is located between the colored blade and the high-speed recording analyzer. The first steering mirror is installed behind the slit, passing the light from the slit to the first primary mirror. The light reflected by the second primary mirror is passed to the colored blade from the second steering mirror located between the second primary mirror and the colored blade.
摘要翻译：描述了一种用于测量蒸发 - 熔融比的检测装置，该装置包括光源，第一和第二光学透镜组，狭缝，第一和第二转向镜，第一和第二主反射镜，玻璃容器，彩色刀片和高速记录分析仪。第一主镜和第二主镜对称放置在玻璃容器的两端。第一光学透镜组位于光源和狭缝之间。第二光学透镜组位于着色刮板和高速记录分析器之间。第一转向镜安装在狭缝后面，将光从狭缝传递到第一主镜。由第二主反射镜反射的光从位于第二主反射镜和彩色叶片之间的第二转向镜传递到彩色叶片。

10. 发明申请

US20050036153A1 Apparatus and process for characterizing samples 有权
标题翻译：用于表征样品的装置和方法
公开(公告)号：US20050036153A1
公开(公告)日：2005-02-17
申请号：US10861673
申请日：2004-06-04
申请人： Luc Joannes
发明人： Luc Joannes
IPC分类号： G01N21/45 , G02B27/54 , G01B9/02
CPC分类号： G02B27/54 , G01N21/455
摘要： An apparatus and method for measuring by the Schlieren technique light beam deviations generated by a sample (EV) includes a source (S) of light beam for illuminating the sample (EV) therewith so as to have a transmitted beam. An imaging means is provided (L2, L3) for forming an image of the sample from the transmitted beam. A filtering means acts as a Schlieren filter (SF) for obtaining “Schlieren fringes” from the image. The Schlieren filter (SF) comprises a periodic structure (SFP) of a defined period. A detecting means (CCD) is provided for detecting the Schlieren fringes under operating conditions. The apparatus can also include means to shift the filtering means with a shift φ by a fraction of the period of the periodic structure thereby shifting the Schlieren fringes, means to acquire a set of at least three successive phase-shifted images; means for reconstructing a mean image of the sample from said collected phase-shifted images using a phase-shifting algorithm used in interferometry, and processing means to calculate by said phase-shifting analysis the optical characteristics, angle and phase of the transmitted beam from said reconstructed image so as to determine the beam deviation angle generated by the sample.
摘要翻译：用于通过施利伦技术测量的装置和方法由样品（EV）产生的光束偏差包括用于照射样品（EV）的光束源（S）以具有透射束。提供了一种成像装置（L2，L3），用于从透射光束形成样品的图像。过滤装置用作Schlieren过滤器（SF），用于从图像中获得“Schlieren条纹”。 Schlieren滤波器（SF）包括定义周期的周期性结构（SFP）。提供检测装置（CCD），用于在操作条件下检测施莱伦条纹。该装置还可以包括用移位装置移动滤波装置的装置，该移动装置以周期性结构周期的一小部分移动，从而移动施伦瑞条纹，用于获取一组至少三个连续的相移图像的装置; 用于使用在干涉测量中使用的相移算法从所述收集的相移图像重建样本的平均图像的装置，以及通过所述相移分析来计算所述透射光束的光学特性，角度和相位的处理装置重建图像，以便确定样本产生的光束偏移角。

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