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1. 发明授权

US11774499B2 Relay diagnosis device, relay diagnosis method, battery system, and electric vehicle 有权
公开(公告)号：US11774499B2
公开(公告)日：2023-10-03
申请号：US17798151
申请日：2021-09-28
申请人： LG Energy Solution, Ltd.
发明人： Jong-Il Park
IPC分类号： G01R31/327 , B60L3/00 , G01R31/12
CPC分类号： G01R31/3272 , B60L3/00 , G01R31/1227
摘要： A relay diagnosis apparatus includes a first voltage detection circuit to generate first and second diagnosis voltages between positive and negative electrode terminals of a battery assembly and a chassis, respectively; and a controller to determine first and second insulation resistances between the positive and negative electrode terminals and the chassis, respectively, based on the first and second diagnosis voltages at first and second time points while respective relays are controlled into an off-state. The controller determines third and fourth insulation resistances between the positive and negative electrode terminals and the chassis, respectively, based on the first and second diagnosis voltages at third and fourth time points while the first and second relays are controlled into an on-state. The controller detects relay faults based on the insulation resistances.

2. 发明授权

US11733299B2 Test apparatus and method for synthetically testing at least one switch device for a high-voltage battery of a vehicle 有权
公开(公告)号：US11733299B2
公开(公告)日：2023-08-22
申请号：US16963534
申请日：2019-03-27
申请人： Bayerische Motoren Werke Aktiengesellschaft
发明人： Suljo Hajdarbasic , Florian Pritscher , Andre Ribeiro , Wladislaw Waag
IPC分类号： G01R31/327 , G01R31/333
CPC分类号： G01R31/3272 , G01R31/3336
摘要： A test apparatus for testing at least one switch device for a high-voltage battery of a vehicle, includes a voltage source for generating an electrical test voltage between a positive high-voltage path and a negative high-voltage path of the at least one switch device. The test apparatus has a first connecting device and a first current source for feeding a first electrical test current into the positive high-voltage path, wherein the first connecting device, the first current source and the positive high-voltage path together form a first circuit when testing the at least one switch device. The test apparatus has a second connecting device and a second current source for feeding a second electrical test current into the negative high-voltage path, wherein the second connecting device, the second current source and the negative high-voltage path together form a second circuit when testing the at least one switch device.

3. 发明授权

US09671466B2 Arc fault circuit interrupter test apparatus and methods 有权
公开(公告)号：US09671466B2
公开(公告)日：2017-06-06
申请号：US14862879
申请日：2015-09-23
申请人： Eaton Corporation
发明人： Saivaraprasad Murahari , Tom Xiong , Jackie Hao
IPC分类号： G01R31/327
CPC分类号： G01R31/3275 , G01R31/3272
摘要： An apparatus for testing an arc fault circuit interrupter includes an AC signal generator circuit configured to be capacitively coupled to an AC power line and to induce an AC signal thereon and a control circuit configured to control the AC signal generator circuit to selectively enable and disable generation of the AC signal responsive to a waveform of an AC power voltage of the AC power line.

4. 发明申请

US20170139009A1 TEST SYSTEM AND METHOD FOR TESTING A CIRCUIT BREAKER 审中-公开
公开(公告)号：US20170139009A1
公开(公告)日：2017-05-18
申请号：US15319284
申请日：2015-08-12
申请人： OMICRON ELECTRONICS GMBH
发明人： Ulrich Klapper
IPC分类号： G01R31/327
CPC分类号： G01R31/3272
摘要： The invention relates to a test system and a method to test a circuit breaker (2) of an electrical switchgear assembly. A sub-station battery (3) of the electrical switchgear assembly is used to generate a supply voltage (7) for the circuit breaker (2) for the testing thereof, wherein the sub-station battery (3) is coupled to a test device (1) in order to generate the supply voltage (7) for the circuit breaker (7) [sic] from an input voltage (6) provided by the sub-station battery (3). The supply voltage (7) is stabilised by means of a voltage regulator (11) of the test device (1).

5. 发明申请

US20170102444A1 Testing System for Traveling Wave Fault Detectors 审中-公开
公开(公告)号：US20170102444A1
公开(公告)日：2017-04-13
申请号：US15293171
申请日：2016-10-13
申请人： Schweitzer Engineering Laboratories, Inc.
发明人： David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
IPC分类号： G01R35/00 , G01R31/08
CPC分类号： G01R35/00 , G01R31/086 , G01R31/11 , G01R31/3272
摘要： A testing apparatus for imposing a traveling wave signal on an electric system signal for testing a fault detector is disclosed herein. The fault detector may be configured to simulate a fault at a particular location by controlling the timing of the traveling wave signal. The testing apparatus may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing apparatus may be configured to determine the calculation accuracy of the fault detector. The testing apparatus may impose a traveling wave signal on a signal simulating an electrical signal on an electric power delivery system. The testing apparatus may be used to test capabilities of a fault detector of detecting a fault using traveling waves or incremental quantities.

6. 发明申请

US20170082691A1 ARC FAULT CIRCUIT INTERRUPTER TEST APPARATUS AND METHODS 有权
公开(公告)号：US20170082691A1
公开(公告)日：2017-03-23
申请号：US14862879
申请日：2015-09-23
申请人： Eaton Corporation
发明人： Saivaraprasad Murahari , Tom Xiong , Jackie Hao
IPC分类号： G01R31/327
CPC分类号： G01R31/3275 , G01R31/3272
摘要： An apparatus for testing an arc fault circuit interrupter includes an AC signal generator circuit configured to be capacitively coupled to an AC power line and to induce an AC signal thereon and a control circuit configured to control the AC signal generator circuit to selectively enable and disable generation of the AC signal responsive to a waveform of an AC power voltage of the AC power line.

7. 发明申请

US20170016949A1 METHOD AND APPARATUS FOR TESTING UTILITY POWER DEVICES 有权
标题翻译：用于测试实用功率器件的方法和装置
公开(公告)号：US20170016949A1
公开(公告)日：2017-01-19
申请号：US15279032
申请日：2016-09-28
申请人： Doble Engineering Company
发明人： Robert Clark Woodward , George Matthew Kennedy
IPC分类号： G01R31/02 , G01R31/14 , G01R31/327 , G01R27/26
CPC分类号： G01R31/027 , G01R27/2694 , G01R31/025 , G01R31/14 , G01R31/3272 , H02J3/00 , H02J2003/007 , Y02E60/76 , Y04S40/22
摘要： An apparatus for performing measurements on a utility power device that shares a common ground with the apparatus selectively sends a first high voltage signal via a first lead to a first terminal of the utility power device, measures a first corresponding signal returned via a second lead of the apparatus from a second terminal of the utility power device. While the corresponding first lead and the second lead of the apparatus remain electrically coupled to the corresponding first and the second terminal of the utility power device. The apparatus selectively sends a second high voltage signal via the second lead to the second terminal of the utility power device, and measures a second corresponding signal returned via the first lead of the apparatus from the first terminal of the utility power device.
摘要翻译：用于在与设备共用共用地的公用设备上进行测量的设备选择性地通过第一引线将第一高电压信号发送到公用电力设备的第一端，测量经由第二引线返回的第一对应信号该设备来自公用电力设备的第二终端。当设备的相应的第一引线和第二引线保持电耦合到公用电力设备的对应的第一和第二端子时。该设备通过第二引线选择性地将第二高电压信号发送到公用电力设备的第二终端，并且测量经由设备的第一引线从公用电力设备的第一端返回的第二对应信号。

8. 发明申请

US20160291058A1 SAFETY TEST SWITCH WITH ACTUATION LEVER 审中-公开
标题翻译：具有执行杆的安全测试开关
公开(公告)号：US20160291058A1
公开(公告)日：2016-10-06
申请号：US14880460
申请日：2015-10-12
申请人： Hubert Ostmeier
发明人： Hubert Ostmeier
IPC分类号： G01R15/14 , G01R19/00
CPC分类号： G01R31/3272 , H01R13/7034
摘要： An interface test device for testing a circuit, the interface test device including a module assembly including a plurality of modules, wherein a test block assembly is formed from individual test blocks that are arranged at one another in parallel and fixated at one another, wherein a test plug assembly is formed from individual test plugs that are arranged at one another other in parallel and fixated at one another, wherein a movement of a lever arm out of a plane of an insertion direction of the test plug assembly into the test block assembly is transferred by strut elements to pinions of the test plug assembly and inserts test fingers of the test plug assembly into openings of the test block assembly, wherein one of the test fingers of the test plug assembly opens a medium to high voltage monitoring circuit.
摘要翻译：一种用于测试电路的接口测试装置，所述接口测试装置包括包括多个模块的模块组件，其中测试块组件由彼此平行地彼此排列并彼此固定的各个测试块形成，其中，测试插头组件由彼此平行布置并彼此固定的单个测试插头形成，其中杠杆臂从测试插头组件的插入方向的平面移动到测试块组件中的移动是由支柱元件转移到测试插头组件的小齿轮并将测试插头组件的测试指插入测试块组件的开口中，其中测试插头组件的一个测试指针打开中高电压监控电路。

9. 发明授权

US09188645B2 System and method for testing a circuit 有权
标题翻译：用于测试电路的系统和方法
公开(公告)号：US09188645B2
公开(公告)日：2015-11-17
申请号：US13721977
申请日：2012-12-20
申请人： Infineon Technologies AG
发明人： Jens Barrenscheen , Dirk Hammerschmidt
IPC分类号： G01R31/327 , G01R31/02 , G01R31/00
CPC分类号： G01R31/327 , G01R31/00 , G01R31/007 , G01R31/3272
摘要： In an embodiment, a device comprises a circuit with at least one circuit element; measurement circuitry capable to test a state of the at least one circuit element during an operation of the circuit, the measurement circuitry comprising a first terminal configured to be coupled to a first node of the circuit via a first capacitor, a second terminal configured to be coupled to a second node of the circuit, wherein the measurement circuitry is configured to determine in situ an operating state of the at least one circuit element based on signals applied by the measurement circuitry to the circuit during the operation of the circuit.
摘要翻译：在一个实施例中，装置包括具有至少一个电路元件的电路; 所述测量电路能够在电路的操作期间测试所述至少一个电路元件的状态，所述测量电路包括被配置为经由第一电容器耦合到所述电路的第一节点的第一端子，被配置为耦合到所述电路的第二节点，其中所述测量电路被配置为基于在所述电路的操作期间基于由所述测量电路施加到所述电路的信号来原地确定所述至少一个电路元件的操作状态。

10. 发明申请

US20150280596A1 Single Phase AC Chopper for High Current Control of Complex and Simple Loads 有权
标题翻译：单相交流斩波器，用于复杂和简单负载的大电流控制
公开(公告)号：US20150280596A1
公开(公告)日：2015-10-01
申请号：US14434639
申请日：2013-10-15
申请人： AVO Multi-Amp Corporation d/b/a Megger
发明人： Harvey Wayne Veselka, JR. , Eugenio Jorge Tacconi
IPC分类号： H02M5/293 , G01R31/40
CPC分类号： H02M5/293 , G01R31/3272 , G01R31/40 , H02M2005/2932
摘要： A testing device is provided. The testing device comprises a processor and a switching AC to AC power converter that has no DC link. The processor is configured to set a plurality of bi-directional switches in the power converter in a configuration of on/off states that cause a substantially set electric current to flow through a component being tested by the testing device.
摘要翻译：提供了测试设备。测试装置包括处理器和没有DC链路的交流AC到AC电力转换器。处理器被配置为在电源转换器中设置导致/关闭状态的配置中的多个双向开关，其导致基本设定的电流流过被测试装置正在测试的部件。

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