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    • 10. 发明授权
    • Long wavelength infrared test set
    • 长波长红外测试仪
    • US3694654A
    • 1972-09-26
    • US3694654D
    • 1971-05-12
    • CROWNOVER JAMES D
    • CROWNOVER JAMES D
    • G01J5/00G01M11/00G02B23/12G01J1/00
    • G01J5/522G01J5/08G01J5/0806G01J5/0809G01J5/0871G01J5/089G01M11/00G02B23/12
    • A test set for forward looking infrared systems or cameras with test set optics projecting onto the field of view of devices being tested the infrared radiation from two plates at a controlled temperature differential subject to calibrated adjustment. A first plate of the two plates contains openings in chosen patterns through which radiations from portions of the second plate are viewed simultaneously with radiation of the first plate. This is with the two plates spaced a predetermined Delta T1 temperature distance apart in a heat flux circuit system having at least one energy exchange device and an extended Delta T2 temperature circuit path of heat flux media material with the Delta T1 temperature spacing a relatively small portion thereof.
    • 用于前瞻性红外系统或具有测试组件光学器件的测试装置的测试装置投射到正在被测量的设备的视场上,来自两个板的红外辐射在受控温度差下进行校准调整。 两个板的第一板包含选定图案的开口,通过该开口与第一板的辐射同时观察来自第二板的部分的辐射。 这是在具有至少一个能量交换装置的热通量电路系统中隔开预定的DELTA T1温度距离的两个板和具有DELTA T1温度间隔的热通量介质材料的扩展DELTA T2温度电路路径相对较小的部分 其中。