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1. 发明授权

US11781994B2 Measurement apparatus and measurement method 有权
公开(公告)号：US11781994B2
公开(公告)日：2023-10-10
申请号：US17707287
申请日：2022-03-29
申请人： YOKOGAWA ELECTRIC CORPORATION
发明人： Syuhei Okada
IPC分类号： G01J3/28 , G01N21/88 , G01N21/17
CPC分类号： G01N21/8851 , G01J3/28 , G01N21/17 , G01J2003/2859 , G01N2021/1738
摘要： A measurement apparatus (10) includes a generator (121) that irradiates electromagnetic waves on a measurement target (M) including a substance that undergoes a structural transition from a first substance with an unstable structure to a second substance with a stable structure due to entry of a foreign substance, a receiver (122) that receives the electromagnetic waves including information on a spectroscopic spectrum of the measurement target (M), and a controller (116) that acquires the measured spectroscopic spectrum based on the electromagnetic waves received by the receiver (122), calculates ratio information between the first substance and the second substance based on the acquired measured spectroscopic spectrum, and generates diagnostic information regarding entry of the foreign substance based on the ratio information.

2. 发明申请

US20170082874A1 ATTENUATED LIGHT BEAM PEAK FREQUENCY MODIFICATION 审中-公开
公开(公告)号：US20170082874A1
公开(公告)日：2017-03-23
申请号：US15167326
申请日：2016-05-27
申请人： VIAVI SOLUTIONS INC.
发明人： Chris WAGNER , Grant TESSARO
IPC分类号： G02F1/01 , G01J3/28 , H04B10/079 , H04B10/516 , G02F1/133 , H04B10/40
CPC分类号： G02F1/0121 , G01J1/0219 , G01J1/0228 , G01J1/0418 , G01J1/26 , G01J1/4257 , G01J3/28 , G01J2001/4247 , G01J2003/2859 , G02F1/13306 , H04B10/07955 , H04B10/40 , H04B10/516
摘要： According to an example, a plurality of pixels of a modulator upon which an input light beam impinges may be modulated to apply a first asymmetrical attenuation pattern on the input light beam and to direct a first attenuated light beam from the modulator and a first power level of the first attenuated light beam may be measured. The plurality of pixels may be modulated to apply a second asymmetrical attenuation pattern on the input light beam and to direct a second attenuated light beam from the modulator, and a second power level of the second attenuated light beam may be measured. A difference between the first power level and the second power level may be calculated and a modified peak frequency for an attenuated light beam from the calculated difference may be calculated.

3. 发明申请

US20170336261A1 TERAHERTZ WAVE SPECTROMETRY SYSTEM 审中-公开
公开(公告)号：US20170336261A1
公开(公告)日：2017-11-23
申请号：US15497181
申请日：2017-04-25
申请人： Panasonic Intellectual Property Management Co., Ltd.
发明人： SEIJI FUJIHARA , YASUYUKI NAITO , MORIO TOMIYAMA
IPC分类号： G01J3/42 , G01N21/3581 , G01N21/35 , G01J3/443 , G01N21/49 , G01N21/3563
CPC分类号： G01J3/42 , G01J3/4338 , G01J2003/2859 , G01J2003/421 , G01J2003/425 , G01N21/3563 , G01N21/3581 , G01N2021/3572
摘要： Provided is a terahertz wave spectrometry system that is capable of identifying analyzing target molecules contained in an analyte even if the analyte contains water, by activating a water remover to remove water according a comparison of absorption spectrums so that water in the analyte is easily removed without causing the analyzing target molecules to disappear due to decomposition or denaturation.

4. 发明授权

US4629322A Material analysis using reflected light 失效
标题翻译：使用反射光进行材料分析
公开(公告)号：US4629322A
公开(公告)日：1986-12-16
申请号：US665893
申请日：1984-10-29
申请人： John H. Pollard
发明人： John H. Pollard
IPC分类号： G01J3/28 , G01J3/42
CPC分类号： G01J3/42 , G01J2003/2859 , G01J2003/425
摘要： An apparatus and method for determining the relative proportions of two eents of a ternary compound from light reflected off a sample of the compound. The light is varied in wavelength and a graph of reflectance vs wavelength is stored. For a given compound of general form A.sub.x B.sub.1-x C, x may be determined by converting the stored graph to a graph of reflectance vs photon energy of the light, determining the photon energy of the light for the longest wavelength peak on the converted graph, and computing x from the equation E.sub.1 =a+bx+cx.sup.2 wherein a, b, and c are predetermined constants, and E.sub.1 is the photon energy in electron volts of the peak of interest.
摘要翻译：用于确定三元化合物的两种元素与化合物样品反射的光的相对比例的装置和方法。光在波长上变化，并且存储反射率与波长的曲线图。对于一般形式的AxB1-xC的给定化合物，可以通过将存储的图转换成光的反射率与光子能量的曲线图，确定转换图上最长波长峰的光的光子能量来确定x，以及从等式E1 = a + bx + cx2计算x，其中a，b和c是预定常数，E1是感兴趣峰的电子伏特中的光子能量。

5. 发明公开

US20240099586A1 ANALYSIS DEVICE AND ANALYSIS METHOD 审中-公开
公开(公告)号：US20240099586A1
公开(公告)日：2024-03-28
申请号：US18266355
申请日：2021-12-16
申请人： HAMAMATSU PHOTONICS K.K. , TOKYO MEDICAL UNIVERSITY
发明人： Tomomi IIDA , Yukio UEDA , Takafumi HAMAOKA
IPC分类号： A61B5/00 , G01J3/42 , G01N21/3563
CPC分类号： A61B5/0075 , A61B5/4872 , A61B5/7203 , G01J3/42 , G01N21/3563 , G01J2003/2859
摘要： An analysis apparatus includes a light emission unit configured to emit measurement light including light in a 900 nm wavelength band to a sample, a light detection unit configured to acquire spectrum data of reflected light in the sample, a data processing unit configured to perform a noise removing process on the spectrum data, a first determination unit configured to store a PLS regression model associated with prediction of an amount of triglyceride in the sample and to determine an amount of triglyceride in the sample by applying the spectrum data subjected to the noise removing process to the PLS regression model, and a second determination unit configured to store data indicating a correlation with an amount of triglyceride in the sample and to determine an amount of brown adipose tissue or beige fat in the sample based on the data and the amount of triglyceride determined by the first determination unit.

6. 发明公开

US20230168125A1 Spectrometer 审中-公开
公开(公告)号：US20230168125A1
公开(公告)日：2023-06-01
申请号：US17917002
申请日：2020-10-30
申请人： Shimadzu Corporation
发明人： Ryoji HIRAOKA , Zeno YONEZAWA , Tetsuya NAGAI
IPC分类号： G01J3/28 , G01J3/18
CPC分类号： G01J3/28 , G01J3/18 , G01J2003/2859
摘要： A mode of a spectrometer according to the present invention includes a spectrum measurement unit (11, 12) configured to repeatedly measure a spectrum over a predetermined wavelength range for measurement target light that is laser light; a peak counting unit (21, 22) configured to, every time a spectrum is obtained by the spectrum measurement unit, detect a peak from the spectrum and count the number of detected peaks; and a display processing unit (24) configured to display a numerical value of a peak counting result by the peak counting unit on a screen of a display unit in real time. With the spectrometer of the above mode, adjustment and the like of the multimode laser oscillator can be efficiently and accurately performed.

7. 发明申请

US20180254600A1 NARROWBAND LASER APPARATUS AND SPECTRAL LINEWIDTH MEASURING APPARATUS 审中-公开
公开(公告)号：US20180254600A1
公开(公告)日：2018-09-06
申请号：US15973896
申请日：2018-05-08
申请人： Gigaphoton Inc.
发明人： Takahito KUMAZAKI , Keisuke ISHIDA , Hiroshi FURUSATO
IPC分类号： H01S3/137 , G01J3/28 , H01S3/034 , H01S3/23 , H01S3/08 , H01S3/10 , G03F7/20
CPC分类号： H01S3/137 , G01J3/0205 , G01J3/0218 , G01J3/027 , G01J3/10 , G01J3/26 , G01J3/28 , G01J2003/2859 , G03F7/70025 , G03F7/70575 , G03F7/70725 , H01S3/005 , H01S3/0078 , H01S3/034 , H01S3/08004 , H01S3/08009 , H01S3/10038 , H01S3/10061 , H01S3/10069 , H01S3/106 , H01S3/225 , H01S3/2251 , H01S3/2256 , H01S3/2308
摘要： A narrowband laser apparatus may be provided with a laser resonator including optical elements for narrowing a spectral linewidth, a spectrometer configured to detect spectral intensity distributions of multiple pulses included in a pulsed laser beam output from the laser resonator, a spectral waveform producer configured to produce a spectral waveform by adding up the spectral intensity distributions of the multiple pulses, a device function storage configured to store a device function of the spectrometer, a wavelength frequency function generator configured to generate a wavelength frequency function which represents a frequency distribution of center wavelengths of the multiple pulses, and a deconvolution processor configured to perform deconvolution processing on the spectral waveform with the device function and the wavelength frequency function.

8. 发明申请

US20160231238A1 METHOD FOR ASSESSING THE DAMAGE TO A PAINT-COVERED COMPOSITE MATERIAL, MEASURING TWO SEPARATE CRITERIA ON THE SPECTROGRAM 有权
标题翻译：评估涂料复合材料损伤的方法，在光谱仪上测量两种分离标准
公开(公告)号：US20160231238A1
公开(公告)日：2016-08-11
申请号：US15098895
申请日：2016-04-14
申请人： AIRCELLE
发明人： Andre BAILLARD , Odile LEFEU , Frederic JOUBERT , PIEL EMMANUEL
IPC分类号： G01N21/3563 , G01N33/32 , G01N25/72 , G01N21/84 , G01N21/88
CPC分类号： G01N21/3563 , G01J3/28 , G01J2003/2859 , G01N21/8422 , G01N21/8851 , G01N21/95 , G01N25/72 , G01N33/32 , G01N2021/8427 , G01N2021/8472
摘要： A method for assessing damage to a composite material covered with a polyurethane-type paint is provided. Two separate criteria are measured on a spectrogram obtained by infrared spectrometry, thereby characterizing thermal ageing of the paint, each separate criteria being a measurement on a curve of a spectrum of the spectrogram of a height of a particular peak, thereby giving two independent assessments of the thermal ageing. Then, the two separate criteria are combined together in order to obtain a result of a level of the damage.
摘要翻译：提供了一种用于评估覆盖有聚氨酯型涂料的复合材料的损伤的方法。在通过红外光谱法获得的光谱图上测量两个单独的标准，从而表征涂料的热老化，每个单独的标准是对特定峰的高度的光谱图的光谱曲线的测量，由此给出两个独立的评估热老化。然后，将两个单独的标准组合在一起以获得损伤水平的结果。

9. 发明授权

US11913875B2 Method for the identification of an incorrectly calibrated or non-calibrated infrared spectrometer 有权
公开(公告)号：US11913875B2
公开(公告)日：2024-02-27
申请号：US17311911
申请日：2019-12-13
申请人： Evonik Operations GmbH
发明人： Ingolf Reimann , Joachim Reising , Christoph Mueller
IPC分类号： G01N21/27 , G01J3/28
CPC分类号： G01N21/274 , G01J3/28 , G01J2003/2859 , G01J2003/2879
摘要： The present invention relates to a computer-implemented method for identifying an incorrectly or non-calibrated infrared spectrometer, comprising the steps of a) recording an infrared spectrum of a sample with a first infrared spectrometer to provide a sample infrared spectrum, b) recording an infrared spectrum of the same sample as in step a) with a second infrared spectrometer to provide a reference infrared spectrum, wherein said second spectrometer is a correctly calibrated infrared spectrometer, or b′) providing a reference spectrum of the same sample as in step a), wherein said reference spectrum was recorded on a second infrared spectrometer, which is a correctly calibrated spectrometer, c) determining a difference between the wavelength of each extreme point in the sample of step a) and the wavelength of each extreme point in the reference spectrum of step b) or b′), and d) indicating the infrared spectrometer of step a) as incorrectly calibrated or non-calibrated, when at least one difference was determined in step c).

10. 发明授权

US10627290B2 Spectral image correcting apparatus and spectral image correcting method, and object component analyzing apparatus 有权
公开(公告)号：US10627290B2
公开(公告)日：2020-04-21
申请号：US16172279
申请日：2018-10-26
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： Yun S Park , Ho Jun Chang
IPC分类号： G01J3/44 , G01J3/28 , G01N21/65
CPC分类号： G01J3/4412 , G01J3/2823 , G01N21/65 , G01J2003/2859 , G01J2003/2866
摘要： A spectral image correcting apparatus includes: an image acquirer configured to acquire a spectral image; and a processor configured to detect a peak wavelength corresponding to a characteristic wavelength based on a differential value of a spectrum of the spectral image, and correct a curvature of the spectral image based on the detected peak wavelength.

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