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    • 6. 发明授权
    • Method for particle size distribution control in a bayer circuit decomposition chain, comprising an agglomeration phase
    • 在拜尔电路分解链中的粒度分布控制方法,包括凝聚相
    • US06878357B1
    • 2005-04-12
    • US09744237
    • 1999-08-12
    • Benoit Cristol
    • Benoit Cristol
    • C01F7/14C01F7/00
    • C01F7/144C01P2004/50C01P2004/61
    • In a BAYER circuit, a process for controlling precipitation in which particle size quality of alumina hydrate produced in the circuit and circulating in feed tanks is monitored utilizing a calibration step and a control step. In the calibration step, cumulative percentage of alumina hydrate particles circulating in the feed tanks in the circuit that are finer than X2 μm, defined as CPFT X2, is measured vs. time and cumulative percentage of alumina hydrate particles circulating in the feed tanks in the circuit that are finer that X1 μm, defined as CPFT X1 vs. time, is measured, where X1 and X2 are predetermined particles sizes and X1 is smaller than X2. A relationship R between CPFT X1 and later changes in CPFT X2, is determined and upper and lower trigger thresholds of CPFT X1 which correspond to maximum permissible variation in CPFT X2 are defined. In the control step, CPFT X1 and CPFT X2 are regularly measured, and R and the correlation between CPFT X2 and the particle size of hydrate produced are updated. Corrective action is taken at the beginning of precipitation when the measured value of CPFT X1 reaches one of the trigger thresholds.
    • 在BAYER电路中,使用校准步骤和控制步骤来监测用于控制沉淀的方法,其中在电路中产生的水合氧化铝的粒度质量和在进料罐中循环。 在校准步骤中,测定在循环中进料池中循环的氧化铝水合物颗粒的累积百分比,其比X2妈妈定义为CPFT X2,相对于在进料罐中循环的水合氧化铝颗粒的时间和累积百分比 测量X1 mum,定义为CPFT X1与时间相比更精细的电路,其中X1和X2是预定的粒径,X1小于X2。 确定CPFT X1与CPFT X2之间的更改之间的关系R,并且定义与CPFT X2中的最大允许变化对应的CPFT X1的上下触发阈值。 在控制步骤中,定期测量CPFT X1和CPFT X2,并更新R和CPFT X2与产生的水合物粒径之间的相关性。 当CPFT X1的测量值达到触发阈值之一时,在降水开始时采取纠正措施。