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    • 4. 发明授权
    • High-frequency measurement line structure
    • US11300587B1
    • 2022-04-12
    • US17129011
    • 2020-12-21
    • WANSHIH ELECTRONIC CO., LTD.
    • Hung-Hsuan Lin
    • G01R1/067G01R1/073
    • A high-frequency measurement line structure includes a circuit board structure and a multi-conductor transmission line section, a high-frequency measurement probe pad section and a transition section which are formed by the circuit board structure, wherein the transition section is arranged between the multi-conductor transmission line section and the high-frequency measurement probe pad section to be connected to the multi-conductor transmission line section and the high-frequency measurement probe pad section. The high-frequency measurement probe pad section includes a group of high-frequency measurement probe pads arranged on a first metal layer of the circuit board structure to touch a high-frequency probe to transmit a high-frequency signal. A second metal layer of the circuit board structure defines a slot arranged in accordance with the high-frequency measurement probe pad section and the transition section to help a mode conversion between the high-frequency probe and the multi-conductor transmission line section.