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    • 2. 发明授权
    • Corner compensation method for fabricating MEMS and structure thereof
    • 用于制造MEMS的角补偿方法及其结构
    • US06949396B2
    • 2005-09-27
    • US10187714
    • 2002-07-01
    • Jerwei HsiehWeileun Fang
    • Jerwei HsiehWeileun Fang
    • B81C1/00H01L21/00B82B1/00
    • B81C1/00571
    • A corner-compensation method for fabricating MEMS (Micro-Electro-Mechanical System) is provided. The method includes steps of: (a) providing a substrate; (b) forming a conductive layer on the substrate; (c) sequentially forming a masking layer having structural openings and a photoresist layer on the conductive layer; (d) executing a photolithography for etching the photoresist layer and the masking layer to form at least one hole penetrating the photoresist layer and the masking layer; (e) etching the conductive layer and the substrate to extend the at least one hole to upper portions of the substrate; (f) removing the photoresist layer and etching the conductive layer and the substrate via the structural openings and the at least one hole respectively to form deep trench structures having different depths; (g) forming a peripheral compensation structure on a side-wall portion of the deep trench structure having the different depths; (h) removing portions of the peripheral compensation structure laterally and the substrate for exposing an uncompensated silicon structure; and (i) side etching the uncompensated silicon structure to be terminated by the peripheral compensation structure around the at least one hole.
    • 提供了一种用于制造MEMS(微机电系统)的角补偿方法。 该方法包括以下步骤:(a)提供衬底; (b)在所述基板上形成导电层; (c)在所述导电层上依次形成具有结构开口的掩模层和光致抗蚀剂层; (d)执行光刻用于蚀刻光致抗蚀剂层和掩模层以形成穿透光致抗蚀剂层和掩模层的至少一个孔; (e)蚀刻所述导电层和所述基底以将所述至少一个孔延伸到所述基底的上部; (f)去除光致抗蚀剂层并分别经由结构开口和至少一个孔蚀刻导电层和基板以形成具有不同深度的深沟槽结构; (g)在具有不同深度的深沟槽结构的侧壁部分上形成外围补偿结构; (h)横向去除外围补偿结构的部分和用于暴露未补偿的硅结构的衬底; 和(i)侧面蚀刻由所述至少一个孔周围的外围补偿结构终止的未补偿硅结构。
    • 7. 发明申请
    • Micromirror switch and transmission method thereof
    • 微镜开关及其传输方法
    • US20040008926A1
    • 2004-01-15
    • US10464958
    • 2003-06-19
    • Walsin Lihwa Corp.
    • Hung-Yi Lin
    • G02B006/35
    • G02B6/3556G02B6/3512
    • A micromirror switch for implementing a light transmission is provided. The micromirror switch includes a first optical fiber array for transmitting a light ray from a first transmission position thereof, a first micromirror array for receiving the light ray from the first optical fiber array and sending out the light ray switched in a first specific direction, a second micromirror array for receiving the light ray from the first micromirror array and sending out the light ray switched in a second specific direction, and a second optical fiber array for receiving the light array from the second micromirror array and loading the light ray into a second transmission position of the second optical fiber array to complete the light transmission.
    • 提供了用于实现光传输的微镜开关。 微镜开关包括用于从其第一透射位置传输光线的第​​一光纤阵列,用于从第一光纤阵列接收光线并发出沿第一特定方向切换的光线的第一微镜阵列, 第二微镜阵列,用于从第一微镜阵列接收光线并发出在第二特定方向上切换的光线;以及第二光纤阵列,用于从第二微镜阵列接收光阵列并将光线加载到第二微镜阵列中 第二光纤阵列的透射位置来完成光透射。
    • 8. 发明授权
    • Light emitting diode
    • 发光二极管
    • US09130122B2
    • 2015-09-08
    • US14181738
    • 2014-02-17
    • Industrial Technology Research InstituteWALSIN LIHWA Corp
    • Yi-Keng FuChia-Lung TsaiHung-Tse ChenChih-Hsuen Chou
    • H01L29/06H01L27/15H01L21/00H01L33/32H01L33/02H01L33/22
    • H01L33/325H01L33/025H01L33/22
    • A light emitting diode (LED) including a first-type doped GaN substrate, a first-type doped semiconductor layer, an active layer, a second-type semiconductor layer, a first electrode, and a second electrode is provided. The first-type doped GaN substrate has a first doped element. The first-type semiconductor layer is disposed on the first-type doped GaN substrate. The first-type semiconductor layer has a second doped element different from the first doped element, and the doped concentration of the second doped element—may have a peak from 3E18/cm3 to 1E20/cm3 at an interface between the first-type doped GaN substrate and the first-type semiconductor layer. The active layer is disposed on the first-type semiconductor layer, and the second-type semiconductor layer is disposed on the active layer. The first electrode and the second electrode are respectively disposed on the first-type doped GaN substrate and the second-type semiconductor layer. Other LEDs are also provided.
    • 提供了包括第一类掺杂GaN衬底,第一类型掺杂半导体层,有源层,第二类型半导体层,第一电极和第二电极的发光二极管(LED)。 第一掺杂GaN衬底具有第一掺杂元素。 第一类型半导体层设置在第一种掺杂的GaN衬底上。 第一类型半导体层具有与第一掺杂元素不同的第二掺杂元素,并且第二掺杂元素的掺杂浓度可以在第一掺杂GaN的界面处具有3E18 / cm3至1E20 / cm3的峰值 衬底和第一类半导体层。 有源层设置在第一型半导体层上,第二类型半导体层设置在有源层上。 第一电极和第二电极分别设置在第一型掺杂GaN衬底和第二类型半导体层上。 还提供其他LED。