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1. 发明申请

US20130026359A1 METHOD AND APPARATUS FOR GENERATING AND ANALYZING IONS 有权
标题翻译：用于产生和分析离子的方法和装置
公开(公告)号：US20130026359A1
公开(公告)日：2013-01-31
申请号：US13634190
申请日：2011-04-22
申请人： Sumio Kumashiro , Wenjian Sun , Li Ding
发明人： Sumio Kumashiro , Wenjian Sun , Li Ding
IPC分类号： H01J49/26 , H01J49/04 , H01J49/16
CPC分类号： H01J49/10 , G01N27/622 , H01J49/066 , H01J49/161 , H01J49/164 , H01J49/165 , H01J49/24
摘要： The current invention involves a method and a device for generating and analyzing ions in order to analyze samples directly without sample preparation. The gaseous neutral molecules are desorbed under atmospheric pressure by a desorption method. The desorbed neutral molecules are then transferred into a low pressure region where they are post-ionized by a mist from an electrospray probe tip or by photons from a vacuum UV source. The generated ions are then focused in a time varying electric field in the low pressure chamber before they are transferred into a mass spectrometer or ion mobility spectrometer for further analysis.
摘要翻译：本发明涉及用于生成和分析离子的方法和装置，以便在不进行样品制备的情况下直接分析样品。气态中性分子通过解吸法在大气压下解吸。然后将解吸的中性分子转移到低压区域，在那里它们被来自电喷雾探针尖端的雾或者来自真空UV源的光子后离子化。然后将所产生的离子聚焦在低压室中的时变电场中，然后将其转移到用于进一步分析的质谱仪或离子迁移谱仪中。

2. 发明授权

US10739308B2 Ion mobility analyzer and analysis method 有权
公开(公告)号：US10739308B2
公开(公告)日：2020-08-11
申请号：US16321164
申请日：2018-06-15
申请人： SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
发明人： Kent James Gillig , Keke Wang , Wenjian Sun , Xiaoqiang Zhang
IPC分类号： G01N27/62 , H01J49/42 , H01J49/10 , H01J49/06
摘要： The invention provides ion mobility analyzer and analysis method. The analyzer includes an ion source, a first drift/analyzer region provided with an ions entrance, a second drift/analyzer region provided with an ions exit, a connection region connecting the first drift/analyzer region and the second drift/analyzer region, and a detector connected to the ion exit. Direct current electric fields and gas flows in the first drift/analyzer region and the second drift/analyzer region apply opposing forces on ions, and first and second gas flows have the same gas flow direction. The connection region includes a third direct current electric field that causes ions to transfer from the first drift/analyzer region to the second drift/analyzer region. Because the first and second regions have the same gas flow direction, the invention achieves stable resolution and sensitivity as a high-resolution ion mobility analyzer and/or an ion mobility filter for a continuous ion beam.

3. 发明授权

US08536523B2 Desorption and ionization method and device 有权
标题翻译：解吸和电离方法及装置
公开(公告)号：US08536523B2
公开(公告)日：2013-09-17
申请号：US13265638
申请日：2010-04-12
申请人： Ding Li , Wenjian Sun
发明人： Ding Li , Wenjian Sun
IPC分类号： H01J49/04
CPC分类号： H01J49/04 , G01N27/62 , H01J49/049
摘要： The present invention involves a method and a device for sequentially desorbing and ionizing mixed analytes on a solid surface with a gradual temperature scan, and continuously collecting data for multiple times in the gradual desorption and ionization process. By gradually increase the temperature of at least one part of the sample, the analytes with different thermal desorption capabilities are sequentially desorbed from surfaces of the solid sample, thereby providing a sample pre-separation scheme, so as to reduce difficulties to subsequent mass spectrum detection. Meanwhile, since mass spectrum data of the analytes with different boiling points is collected for multiple times during a temperature scan, the analytes with a low boiling point can be detected first at lower temperature in order to avoid rapid exhaustion at higher temperature, thereby improving the detection efficiency of the analytes with low boiling points.
摘要翻译：本发明涉及一种用于在逐渐温度扫描下在固体表面上顺次解吸和电离混合分析物的方法和装置，并且在逐渐解吸和电离过程中连续收集数据多次。通过逐渐增加样品的至少一部分的温度，具有不同热解吸能力的分析物从固体样品的表面顺序解吸，从而提供样品预分离方案，以减少后续质谱检测的困难。同时，由于在温度扫描期间多次收集沸点不同的分析物的质谱数据，所以可以在较低的温度下首先检测低沸点的分析物，以避免在较高的温度下快速耗尽，从而改善低沸点分析物的检测效率。

4. 发明授权

US08299444B2 Ion source 有权
标题翻译：离子源
公开(公告)号：US08299444B2
公开(公告)日：2012-10-30
申请号：US12552476
申请日：2009-09-02
申请人： Li Ding , Wenjian Sun
发明人： Li Ding , Wenjian Sun
IPC分类号： H01J49/16
CPC分类号： H01J49/162 , H01J49/0463 , H01J49/165
摘要： This invention relates to a desorption/ionization source operated under ambient conditions for direct analysis of solid or liquid samples on a surface. The source comprises of a laser desorption system and a UV/electrospray combined ionization system. The source is suitable for simultaneously ionizing samples with different polarity in a complex mixture. At the same time, the compact design of the source with multiple channels can maintain the level of local concentration of the analyte ions inside the source for higher efficiency of sample ionization and introduction.
摘要翻译：本发明涉及在环境条件下操作的用于在表面上直接分析固体或液体样品的解吸/电离源。该源包括激光解吸系统和UV /电喷雾组合电离系统。该源适用于在复杂混合物中同时电离不同极性的样品。同时，具有多个通道的源的紧凑设计可以保持源内的分析物离子的局部浓度水平，以提高样品电离和引入的效率。

5. 发明授权

US11031229B2 Sample desorption ionization device and analysis method for a mass spectrometer 有权
公开(公告)号：US11031229B2
公开(公告)日：2021-06-08
申请号：US16756239
申请日：2019-03-01
申请人： SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
发明人： Yunqing Huang , Wenjian Sun
IPC分类号： H01J49/16 , G01N27/68 , H01J49/04 , H01J49/24
摘要： The present disclosure provides a sample desorption ionization device and analysis method for a mass spectrometer. The device has a first gas pressure region and a second gas pressure region lower than the first gas pressure region. The device includes: a heating desorption device, carrying a sample and heating the sample, an analyte in the sample is desorbed from the sample under a heating action and then enters the first gas pressure region; a vacuum interface component, connected with the first gas pressure region and the second gas pressure region, and causing the analyte to enter the second gas pressure region from the first gas pressure region under the drive of a gas flow; and a soft ionization source, converting gas molecules in the second gas pressure region into activated gas molecules, the analyte entering the second gas pressure region realizes soft ionization after interacting with the activated gas molecules.

6. 发明授权

US09192053B2 Method for manufacturing ion optical device 有权
标题翻译：离子光学器件的制造方法
公开(公告)号：US09192053B2
公开(公告)日：2015-11-17
申请号：US14094132
申请日：2013-12-02
申请人： SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO. LTD.
发明人： Hui Mu , Gongyu Jiang , Li Ding , Jianliang Li , Wenjian Sun
IPC分类号： B05D5/12 , H05K3/10 , B05D3/00 , C23C14/34 , H01J49/06 , H01J49/42 , H01J37/04 , C23C14/00 , C23C18/18 , C23C14/04 , H05K1/11 , H05K3/00 , H05K3/14
CPC分类号： H05K3/107 , B05D3/002 , B05D5/12 , C23C14/0021 , C23C14/046 , C23C14/34 , C23C18/1806 , H01J37/04 , H01J49/063 , H01J49/421 , H05K1/119 , H05K3/0014 , H05K3/14
摘要： The present invention provides a method for preparing an ion optical device. A substrate is fabricated with a hard material adapted for a grinding process, the substrate at least including a planar surface, and including at least one insulating material layer. Next, one or more linear grooves are cut on the planar surface, to form multiple discrete ion optical electrode regions on the planar surface separated by the linear grooves. Then, conductive leads are fabricated on other substrate surfaces than the planar surface and in a through hole inside the substrate, to provide voltages required on ion optical electrodes. By using high-hardness materials in cooperation with high-precision machining, higher precision and a desired discrete electrode contour can be obtained.
摘要翻译：本发明提供了一种离子光学器件的制备方法。用适于磨削工艺的硬质材料制造衬底，所述衬底至少包括平坦表面，并且包括至少一个绝缘材料层。接下来，在平坦表面上切割一个或多个线性沟槽，以在由线性沟槽分隔开的平面上形成多个离散的离子光电极区域。然后，在平坦表面和衬底内的通孔中的其它衬底表面上制造导电引线，以提供离子光电电极所需的电压。通过与高精度加工配合使用高硬度材料，可以获得更高精度和期望的分立电极轮廓。

7. 发明授权

US08704170B2 Method and apparatus for generating and analyzing ions 有权
标题翻译：用于产生和分析离子的方法和装置
公开(公告)号：US08704170B2
公开(公告)日：2014-04-22
申请号：US13634190
申请日：2011-04-22
申请人： Sumio Kumashiro , Wenjian Sun , Li Ding
发明人： Sumio Kumashiro , Wenjian Sun , Li Ding
IPC分类号： H01J49/00 , H01J49/10 , H01J49/24 , H01J49/16
CPC分类号： H01J49/10 , G01N27/622 , H01J49/066 , H01J49/161 , H01J49/164 , H01J49/165 , H01J49/24
摘要： The current invention involves a method and a device for generating and analyzing ions in order to analyze samples directly without sample preparation. The gaseous neutral molecules are desorbed under atmospheric pressure by a desorption method. The desorbed neutral molecules are then transferred into a low pressure region where they are post-ionized by a mist from an electrospray probe tip or by photons from a vacuum UV source. The generated ions are then focused in a time varying electric field in the low pressure chamber before they are transferred into a mass spectrometer or ion mobility spectrometer for further analysis.
摘要翻译：本发明涉及用于生成和分析离子的方法和装置，以便在不进行样品制备的情况下直接分析样品。气态中性分子通过解吸法在大气压下解吸。然后将解吸的中性分子转移到低压区域，在那里它们被来自电喷雾探针尖端的雾或者来自真空UV源的光子后离子化。然后将所产生的离子聚焦在低压室中的时变电场中，然后将其转移到用于进一步分析的质谱仪或离子迁移谱仪中。

8. 发明申请

US20130187044A1 A WIRE ELECTRODE BASED ION GUIDE DEVICE 有权
标题翻译：一种基于导线电极的导线装置
公开(公告)号：US20130187044A1
公开(公告)日：2013-07-25
申请号：US13357470
申请日：2012-01-24
申请人： LI DING , GONGYU JIANG , WENJIAN SUN
发明人： LI DING , GONGYU JIANG , WENJIAN SUN
IPC分类号： H01J49/22
CPC分类号： H01J49/065 , H01J49/066
摘要： This invention presents a kind of ion guide device comprising multiple layers of stretched wire electrodes crossing in space. These wire electrodes are distributed along a defined ion guiding axis in the ion guide device. Each layer of wire electrodes contains at least two wire electrodes with some distance away from the guiding axis, and rotates with an angle relative to wire electrodes on neighboring layer. The ion guide contains multiple layers of wire electrodes to form a cage-like ion guide tunnel and keeps the mounting framework of those wire electrodes outside of the ion guide tunnel, thus reducing the interference of the gas flows from the ion guide device. A power supply provides voltage to each layer of wire electrodes, creates an electric field which focuses the ions towards the guiding axis.
摘要翻译：本发明提供了一种离子导向装置，其包括在空间上交叉的多层拉伸线电极。这些线电极沿离子导向装置中限定的离子引导轴分布。每层线电极包含至少两根与引导轴距离一定距离的线电极，并相对于相邻层上的线电极以一定角度旋转。离子导向器包含多层线电极以形成笼状离子导向通道，并将这些线电极的安装框架保持在离子引导通道外部，从而减少离子导向装置的气流的干扰。电源为每层线电极提供电压，产生将离子聚焦到引导轴的电场。

9. 发明授权

US11735407B2 Ionization device, mass spectrometer, ion mobility spectrometer, and ionization method 有权
公开(公告)号：US11735407B2
公开(公告)日：2023-08-22
申请号：US17048721
申请日：2019-03-27
申请人： SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO. LTD.
发明人： Yupeng Cheng , Wenjian Sun
IPC分类号： H01J49/04 , H01J49/00
CPC分类号： H01J49/049 , H01J49/0031 , H01J49/0413
摘要： The present invention relates to the field of mass and/or ion mobility spectrometers. Provided is an ionization device and a mass spectrometer and an ion mobility spectrometer having same. Further provided is an ionization method. A sampling probe of the ionization device of the present invention is able to actively and rapidly collect samples, while a sampling device and a thermal desorption device are combined into one, simplifying and compacting the sampling device. An ionization part is provided downstream of the sampling and desorption part, ensuring that the sampling probe will not interfere with a flow field or an electric field between the ionization part and the analysis assembly inlet, thus ensuring repeatability of the device signal and flexibility of analysis.

10. 发明申请

US20210151305A1 IONIZATION DEVICE, MASS SPECTROMETER, ION MOBILITY SPECTROMETER, AND IONIZATION METHOD 有权
公开(公告)号：US20210151305A1
公开(公告)日：2021-05-20
申请号：US17048721
申请日：2019-03-27
申请人： SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO. LTD.
发明人： Yupeng CHENG , Wenjian SUN
IPC分类号： H01J49/04 , H01J49/00
摘要： The present invention relates to the field of mass and/or ion mobility spectrometers. Provided is an ionization device and a mass spectrometer and an ion mobility spectrometer having same. Further provided is an ionization method. A sampling probe of the ionization device of the present invention is able to actively and rapidly collect samples, while a sampling device and a thermal desorption device are combined into one, simplifying and compacting the sampling device. An ionization part is provided downstream of the sampling and desorption part, ensuring that the sampling probe will not interfere with a flow field or an electric field between the ionization part and the analysis assembly inlet, thus ensuring repeatability of the device signal and flexibility of analysis.

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