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1. 发明授权

US07545159B2 Electrical test probes with a contact element, methods of making and using the same 失效
标题翻译：具有接触元件的电气测试探针，制造和使用它们的方法
公开(公告)号：US07545159B2
公开(公告)日：2009-06-09
申请号：US11621717
申请日：2007-01-10
申请人： John M. Winter
发明人： John M. Winter
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R1/06733 , H01R13/2421
摘要： Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.
摘要翻译：本文公开了电测试探针及其制备方法。在一个实施例中，电测试探针包括：筒，柱塞，接触元件和弹簧。桶包括由止动接合限定的接触区域和在桶的第一端处的开口。柱塞可滑动地设置穿过开口，接触元件和接触区域。柱塞包括尖端和止动突起，其中柱塞延伸部在其间延伸。接触元件设置在接触区域中，在筒体和柱塞之间。弹簧与柱塞可操作地接合。

2. 发明授权

US07315176B2 Electrical test probes, methods of making, and methods of using 有权
标题翻译：电气测试探针，制作方法和使用方法
公开(公告)号：US07315176B2
公开(公告)日：2008-01-01
申请号：US11155230
申请日：2005-06-16
申请人： Larre H. Nelson , John M. Winter
发明人： Larre H. Nelson , John M. Winter
IPC分类号： G01R31/02
CPC分类号： G01R1/06722 , H01R13/2421
摘要： Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.
摘要翻译：本文公开了一种电子测试探针，其包括设置在壳体中的与柱塞接合的压缩弹簧，该压缩弹簧包括第一部分线圈，其包括第一中心线和第二部分线圈，该第一部分线圈包括与第二中心线间隔开并平行于第一个中心线。

3. 发明申请

US20070296436A1 ELECTRICAL TEST PROBES WITH A CONTACT ELEMENT, METHODS OF MAKING AND USING THE SAME 失效
标题翻译：具有接触元件的电气测试探针，制造和使用它的方法
公开(公告)号：US20070296436A1
公开(公告)日：2007-12-27
申请号：US11621717
申请日：2007-01-10
申请人： John M. Winter
发明人： John M. Winter
IPC分类号： G01R31/02
CPC分类号： G01R1/06733 , H01R13/2421
摘要： Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.
摘要翻译：本文公开了电测试探针及其制备方法。在一个实施例中，电测试探针包括：筒，柱塞，接触元件和弹簧。桶包括由止动接合限定的接触区域和在桶的第一端处的开口。柱塞可滑动地设置穿过开口，接触元件和接触区域。柱塞包括尖端和止动突起，其中柱塞延伸部在其间延伸。接触元件设置在接触区域中，在筒体和柱塞之间。弹簧与柱塞可操作地接合。

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