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    • 4. 发明授权
    • Average inductor current control using variable reference voltage
    • 使用可变参考电压的平均电感电流控制
    • US08884600B2
    • 2014-11-11
    • US13324121
    • 2011-12-13
    • Yung-I Chang
    • Yung-I Chang
    • H02M3/156G05F1/46H02M1/00
    • G05F1/46H02M3/156H02M2001/0025
    • A variable reference voltage generation unit used in DC/DC converter includes a sample-hold valley inductor current unit electrically connected to a reference voltage generation unit. The sample-hold valley inductor current unit receives the valley inductor current and converts it into the valley voltage. The reference voltage generation unit receives and converts a current signal two times of a designated current into a voltage signal two times of a designated voltage. The voltage signal two times of reference voltage is then subtracted by the valley voltage to produce the new reference voltage to compare with an inductor voltage for controlling the switching of a switching transistor of the DC/DC convertor.
    • 在DC / DC转换器中使用的可变参考电压产生单元包括电连接到参考电压产生单元的采样保持谷值电感器电流单元。 采样保持谷电感电流单元接收谷值电感电流并将其转换为谷值电压。 参考电压产生单元将指定电流的两倍的电流信号接收并转换成指定电压的两倍的电压信号。 然后将参考电压的两倍的电压信号除以谷值电压以产生新的参考电压,以与用于控制DC / DC转换器的开关晶体管的开关的电感器电压进行比较。
    • 7. 发明授权
    • Semiconductor device die with integrated MOSFET and low forward voltage diode-connected enhancement mode JFET and method
    • 具有集成MOSFET和低正压二极管连接增强型JFET和方法的半导体器件裸片
    • US08669613B2
    • 2014-03-11
    • US12893978
    • 2010-09-29
    • Sik LuiWei Wang
    • Sik LuiWei Wang
    • H01L29/66
    • H01L27/0617H01L27/098
    • A semiconductor die with integrated MOSFET and diode-connected enhancement mode JFET is disclosed. The MOSFET-JFET die includes common semiconductor substrate region (CSSR) of type-1 conductivity. A MOSFET device and a diode-connected enhancement mode JFET (DCE-JFET) device are located upon CSSR. The DCE-JFET device has the CSSR as its DCE-JFET drain. At least two DCE-JFET gate regions of type-2 conductivity located upon the DCE-JFET drain and laterally separated from each other with a DCE-JFET gate spacing. At least a DCE-JFET source of type-1 conductivity located upon the CSSR and between the DCE-JFET gates. A top DCE-JFET electrode, located atop and in contact with the DCE-JFET gate regions and DCE-JFET source regions. When properly configured, the DCE-JFET simultaneously exhibits a forward voltage Vf substantially lower than that of a PN junction diode while the reverse leakage current can be made comparable to that of a PN junction diode.
    • 公开了具有集成MOSFET和二极管连接的增强型JFET的半导体管芯。 MOSFET-JFET管芯包括类型1导电性的公共半导体衬底区域(CSSR)。 MOSFET器件和二极管连接的增强型JFET(DCE-JFET)器件位于CSSR上。 DCE-JFET器件具有CSSR作为其DCE-JFET漏极。 至少两个DCE-JFET栅极区域,位于DCE-JFET漏极上,并以DCE-JFET栅极间隔彼此横向分离。 至少一个位于CSSR上和DCE-JFET门之间的类型1电导率的DCE-JFET源。 位于顶部并与DCE-JFET栅极区域和DCE-JFET源极区域接触的顶部DCE-JFET电极。 当正确配置时,DCE-JFET同时呈现基本上低于PN结二极管的正向电压Vf,而反向漏电流可以与PN结二极管的相反。
    • 10. 发明授权
    • Double-side exposed semiconductor device and its manufacturing method
    • 双面裸露半导体器件及其制造方法
    • US08450152B2
    • 2013-05-28
    • US13193474
    • 2011-07-28
    • Yuping GongYan Xun Xue
    • Yuping GongYan Xun Xue
    • H01L21/00
    • H01L23/49537H01L23/3107H01L23/4334H01L23/49562H01L23/49568H01L2224/16245H01L2224/32245
    • A double-side exposed semiconductor device includes an electric conductive first lead frame attached on top of a thermal conductive but electrical nonconductive second lead frame and a semiconductor chip flipped and attached on top of the first lead frame. The gate and source electrodes on top of the flipped chip form electrical connections with gate and source pins of the first lead frame respectively. The flipped chip and center portions of the first and second lead frames are then encapsulated with a molding compound, such that the heat sink formed at the center of the second lead frame and the drain electrode at bottom of the semiconductor chip are exposed on two opposite sides of the semiconductor device. Thus, heat dissipation performance of the semiconductor device is effectively improved without increasing the size of the semiconductor device.
    • 双面露出的半导体器件包括安装在导热但不导电的第二引线框架的顶部的导电第一引线框架和翻转并附接在第一引线框架顶部上的半导体芯片。 翻转芯片顶部的栅极和源极电极分别与第一引线框架的栅极和源极引脚形成电连接。 第一和第二引线框架的翻转芯片和中心部分然后用模塑料封装,使得形成在第二引线框架的中心处的散热器和在半导体芯片的底部的漏电极暴露在两个相对的 半导体器件的侧面。 因此,在不增加半导体器件的尺寸的情况下,有效地提高了半导体器件的散热性能。