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1. 发明申请

US20220157044A1 DETECTOR FOR IDENTIFYING AT LEAST ONE MATERIAL PROPERTY 有权
公开(公告)号：US20220157044A1
公开(公告)日：2022-05-19
申请号：US17439492
申请日：2020-03-13
申请人： trinamiX GmbH
发明人： Friedrich Schick , Peter Schillen , Patrick Schindler , Andre Schmidt , Michael Eberspach , Christian Lennartz , Robert Send , Lars Diesselberg , Heiko Hengen , Ingmar Bruder , Jakob Unger , Christian Bonsignore
IPC分类号： G06V10/764 , G01B11/22 , G01C21/16 , G01S17/66 , G06T7/73 , G06T5/20 , G06T5/00 , H04N5/225 , H04N5/235 , G06T7/20 , G06T7/521
摘要： Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

2. 发明授权

US11906421B2 Enhanced material detection by stereo beam profile analysis 有权
公开(公告)号：US11906421B2
公开(公告)日：2024-02-20
申请号：US18363488
申请日：2023-08-24
申请人： TRINAMIX GMBH
发明人： Patrick Schindler , Ruben Huehnerbein , Christian Lennartz , Jakob Unger
IPC分类号： G01N21/01 , H04N13/254 , H04N13/239 , G06V10/764 , G06V10/145 , G06V10/60 , G06V10/75 , G06V10/147 , H04N13/00 , G01N21/17
CPC分类号： G01N21/01 , G06V10/145 , G06V10/147 , G06V10/60 , G06V10/751 , G06V10/759 , G06V10/764 , H04N13/239 , H04N13/254 , G01N2021/0106 , G01N2021/177 , H04N2013/0074
摘要： A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises

at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120);
at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112);
at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ;
at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.

3. 发明授权

US12087003B2 Auto calibration from epipolar line distance in projection pattern 有权
公开(公告)号：US12087003B2
公开(公告)日：2024-09-10
申请号：US18363420
申请日：2023-08-01
申请人： TRINAMIX GMBH
发明人： Patrick Schindler , Friedrich Schick , Christian Lennartz , Peter Schillen , Jakob Unger
IPC分类号： G06T7/521 , G06T7/80
CPC分类号： G06T7/521 , G06T7/80
摘要： A detector for determining a position of at least one object, the detector including:

at least one projector for illuminating the object with at least one illumination pattern;
at least one sensor element having a matrix of optical sensors; and
at least one evaluation device configured for determining initial distance information of reflection features by analysis of their respective beam profiles, where the evaluation device is configured for performing a calibration method.

4. 发明授权

US11947013B2 Detector for identifying at least one material property 有权
公开(公告)号：US11947013B2
公开(公告)日：2024-04-02
申请号：US17439492
申请日：2020-03-13
申请人： trinamiX GmbH
发明人： Friedrich Schick , Peter Schillen , Patrick Schindler , Andre Schmidt , Michael Eberspach , Christian Lennartz , Robert Send , Lars Diesselberg , Heiko Hengen , Ingmar Bruder , Jakob Unger , Christian Bonsignore
IPC分类号： G06T7/521 , G01B11/22 , G01C21/16 , G01S17/46 , G01S17/66 , G06T5/00 , G06T5/20 , G06T7/20 , G06T7/73 , G06V10/145 , G06V10/60 , G06V10/764 , H04N23/56 , H04N23/74
CPC分类号： G01S17/46 , G01B11/22 , G01C21/16 , G01S17/66 , G06T5/002 , G06T5/20 , G06T7/20 , G06T7/521 , G06T7/73 , G06V10/145 , G06V10/60 , G06V10/764 , H04N23/56 , H04N23/74
摘要： Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

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