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1. 发明申请

US20080220182A1 Laser-based method for growing array of carbon nanotubes 有权
标题翻译：用于生长碳纳米管阵列的基于激光的方法
公开(公告)号：US20080220182A1
公开(公告)日：2008-09-11
申请号：US11982667
申请日：2007-11-02
申请人： Zhuo Chen , Chun-Xiang Luo , Kai-Li Jiang Jiang , Shou-Shan Fan
发明人： Zhuo Chen , Chun-Xiang Luo , Kai-Li Jiang Jiang , Shou-Shan Fan
IPC分类号： C23C16/44
CPC分类号： C30B29/602 , B82Y30/00 , B82Y40/00 , C01B32/162 , C01B2202/08 , C30B25/00 , C30B29/02
摘要： A method for growing an array of carbon nanotubes includes the steps of: (a) providing a substrate having a first substrate surface and a second substrate surface opposite to the first substrate surface; (b) forming a catalyst film on the first substrate surface; (c) flowing a mixture of a carrier gas and a first carbon source gas over the catalyst film on the first substrate surface; (d) focusing a laser beam on the second substrate surface to locally heat the substrate to a predetermined reaction temperature; and (e) growing an array of the carbon nanotubes on the first substrate surface via the catalyst film.
摘要翻译：一种用于生长碳纳米管阵列的方法包括以下步骤：（a）提供具有第一衬底表面和与第一衬底表面相对的第二衬底表面的衬底; （b）在第一基板表面上形成催化剂膜; （c）将载气和第一碳源气体的混合物流过第一基板表面上的催化剂膜; （d）将激光束聚焦在第二基板表面上以将基板局部加热到预定的反应温度; 和（e）经由催化剂膜在第一基板表面上生长碳纳米管阵列。

2. 发明授权

US07508216B2 Method for measuring work function 有权
标题翻译：功能测量方法
公开(公告)号：US07508216B2
公开(公告)日：2009-03-24
申请号：US11640056
申请日：2006-12-14
申请人： Wei Wei Wei , Kai-Li Jiang Jiang , Shou-Shan Fan Fan
发明人： Wei Wei Wei , Kai-Li Jiang Jiang , Shou-Shan Fan Fan
IPC分类号： G01R31/26
CPC分类号： G01N27/005
摘要： A method for measuring work function includes the steps of: (a) providing a field emission electron source having a carbon nanotube tip as a cathode electrode and a spaced anode electrode, having a predetermined spaced distance therebetween; (b) applying a voltage between the cathode electrode and the anode electrode and measuring a first current-voltage curve of the field emission electron source in a vacuum environment; (c) forming a layer of field emission material at least on the surface of the carbon nanotube tip; (d) measuring a second current-voltage curve of the now-treated field emission electron source in the same conditions as that in the step (b); (e) achieving two Fowler-Nordheim curves calculated from the two current-voltage curves according to the Fowler-Nordheim equation; and (f) comparing the two Fowler-Nordheim curves and calculating the work function of the field emission material therefrom.
摘要翻译：一种用于测量功函数的方法包括以下步骤：（a）提供具有碳纳米管尖端作为阴极和间隔开的阳极的场致发射电子源，它们之间具有预定的间隔距离; （b）在阴极电极和阳极电极之间施加电压，并在真空环境中测量场发射电子源的第一电流 - 电压曲线; （c）至少在所述碳纳米管尖端的表面上形成场致发射材料层; （d）在与步骤（b）相同的条件下测量现在处理的场发射电子源的第二电流 - 电压曲线; （e）根据Fowler-Nordheim方程，从两个电流 - 电压曲线计算出两个Fowler-Nordheim曲线; 和（f）比较两条福勒 - 诺德海姆曲线，并计算其中的场致发射材料的功函数。

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