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1. 发明申请

US20080265253A1 THIN FILM TRANSISTOR DISPLAY PANEL, MANUFACTURING METHOD AND DETECTION METHOD THEREOF 审中-公开
标题翻译：薄膜晶体管显示面板，制造方法及其检测方法
公开(公告)号：US20080265253A1
公开(公告)日：2008-10-30
申请号：US12045851
申请日：2008-03-11
申请人： Zhenhuan TIAN , Ki Young KWON
发明人： Zhenhuan TIAN , Ki Young KWON
IPC分类号： H01L27/105 , H01L21/77
CPC分类号： G09G3/006 , G02F1/1345 , G02F2001/136254 , G09G3/3648 , H01L27/12 , H01L27/1214
摘要： A thin film transistor (TFT) display panel as well as a manufacturing method and a detection method thereof are provided. The TFT display panel comprises at least two display regions and a detection region, wherein a gate detection line is correspondingly connected at least with all the gate lines from one of the display regions in the detection region. The embodiments of the present invention improve the safety of the circuits in the detection region, and simplify the mask process of the TFT display panel and the detection process for the display region, which in turn increases the production efficiency of the TFT and reduces the production cost.
摘要翻译：提供薄膜晶体管（TFT）显示面板及其制造方法和检测方法。 TFT显示面板包括至少两个显示区域和检测区域，其中栅极检测线至少与检测区域中的一个显示区域中的所有栅极线相应地连接。本发明的实施例提高了检测区域中的电路的安全性，并且简化了TFT显示面板的掩模处理和显示区域的检测过程，这又提高了TFT的生产效率并降低了生产成本。

2. 发明申请

US20090146678A1 SUBSTRATE TESTING CIRCUIT 有权
标题翻译：基板测试电路
公开(公告)号：US20090146678A1
公开(公告)日：2009-06-11
申请号：US12126307
申请日：2008-05-23
申请人： Yupeng CHEN , Zhenhuan TIAN , Kiyoung KWON
发明人： Yupeng CHEN , Zhenhuan TIAN , Kiyoung KWON
IPC分类号： G01R31/26
CPC分类号： G09G3/006 , G09G3/3648 , G09G2300/04
摘要： The present invention relates to a substrate testing circuit comprising a testing bus and a testing signal terminal connected to the testing bus, a signal line to be tested in the substrate being connected to the testing bus via a signal connecting terminal, wherein a plurality of signal access terminals are provided on the testing bus; one testing branch is connected between each the signal access terminal and the testing signal terminal; and resistance values of the testing branches are the same. By means of the present invention, since a plurality of signal access terminals are introduced and the testing branches with the same resistance are added so that input resistances and impedances of testing signals across the display screen are substantially identical without making changes to process flow and device hardware structure, input resistances and impedances of respective signal lines are well averaged, thereby no obvious regional attenuation occurs in the testing signals within the pixel area to be tested irrespective of limitation in size of panel, so as to realize tests for panels with greater sizes.
摘要翻译：本发明涉及一种基板测试电路，包括测试总线和连接到测试总线的测试信号端子，待测试的信号线通过信号连接端连接到测试总线，其中多个信号接入终端设在测试总线上; 每个信号接入终端和测试信号终端之间连接一个测试分支; 测试分支的电阻值相同。通过本发明，由于引入了多个信号接入终端，并且添加了具有相同电阻的测试分支，使得跨越显示屏的测试信号的输入电阻和阻抗基本相同，而不改变处理流程和设备各个信号线的硬件结构，输入电阻和阻抗都很好地平均，因此，无论面板的尺寸受到限制，在待测像素区域内的测试信号中都不会出现明显的区域衰减，从而实现更大尺寸的面板的测试。

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