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1. 发明申请

US20080231260A1 PUSHER FOR MATCH PLATE OF TEST HANDLER 有权
标题翻译：推动测试手术的匹配板
公开(公告)号：US20080231260A1
公开(公告)日：2008-09-25
申请号：US12044181
申请日：2008-03-07
申请人： Yun Sung Na , In Gu Jeon , Dong Han Kim , Jae woo Jang
发明人： Yun Sung Na , In Gu Jeon , Dong Han Kim , Jae woo Jang
IPC分类号： G01R1/02 , G01R31/26
CPC分类号： G01R31/2893
摘要： A pusher for a match plate of a test handler is disclosed which assists a tester to test the produced semiconductor devices. The pusher includes: a body part installed to an installation plate; and a pushing part that extends forward from a front side of the body part, for pushing a semiconductor device placed on an insert of a test tray. The pusher forms: an air through hole that extends through from a rear side of the body part to the front side of the pushing part, for guiding air of a certain temperature, supplied to the rear side of the body part from a duct, to be supplied to the semiconductor device; and at least one or more air outflow holes that extend through from at least one side of the pushing part and communicate with the air through hole, for allowing part of the air supplied from the duct through the air through hole to flow out to a test site. The pusher can reduce the temperature deviation of semiconductor devices at the test site.
摘要翻译：公开了用于测试处理机的匹配板的推动器，其帮助测试器测试所制造的半导体器件。推动器包括：安装到安装板的主体部分; 以及从主体部的前侧向前方延伸的推压部，用于推动放置在测试盘的插入物上的半导体器件。推动器形成：从主体部分的后侧延伸到推动部分的前侧的空气通孔，用于引导从管道向主体部分的后侧供应的一定温度的空气，提供给半导体器件; 以及至少一个或多个空气流出孔，其从所述推动部的至少一侧延伸并与所述空气通孔连通，以允许通过所述空气通孔从所述管道供应的一部分空气流出到测试中现场。推动器可以降低测试点半导体器件的温度偏差。

2. 发明授权

US07656152B2 Pusher for match plate of test handler 有权
标题翻译：测试处理机匹配推杆
公开(公告)号：US07656152B2
公开(公告)日：2010-02-02
申请号：US12044181
申请日：2008-03-07
申请人： Yun Sung Na , In Gu Jeon , Dong Han Kim , Jae woo Jang
发明人： Yun Sung Na , In Gu Jeon , Dong Han Kim , Jae woo Jang
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R31/2893
摘要： A pusher for a match plate of a test handler is disclosed which assists a tester to test the produced semiconductor devices. The pusher includes: a body part installed to an installation plate; and a pushing part that extends forward from a front side of the body part, for pushing a semiconductor device placed on an insert of a test tray. The pusher forms: an air through hole that extends through from a rear side of the body part to the front side of the pushing part, for guiding air of a certain temperature, supplied to the rear side of the body part from a duct, to be supplied to the semiconductor device; and at least one or more air outflow holes that extend through from at least one side of the pushing part and communicate with the air through hole, for allowing part of the air supplied from the duct through the air through hole to flow out to a test site. The pusher can reduce the temperature deviation of semiconductor devices at the test site.
摘要翻译：公开了用于测试处理机的匹配板的推动器，其帮助测试器测试所制造的半导体器件。推动器包括：安装到安装板的主体部分; 以及从主体部的前侧向前方延伸的推压部，用于推动放置在测试盘的插入物上的半导体器件。推动器形成：从主体部分的后侧延伸到推动部分的前侧的空气通孔，用于引导从管道向主体部分的后侧供应的一定温度的空气，提供给半导体器件; 以及至少一个或多个空气流出孔，其从所述推动部的至少一侧延伸并与所述空气通孔连通，以允许通过所述空气通孔从所述管道供应的一部分空气流出到测试中现场。推动器可以降低测试点半导体器件的温度偏差。

3. 发明授权

US07923989B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US07923989B2
公开(公告)日：2011-04-12
申请号：US12170680
申请日：2008-07-10
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： G01R31/28
CPC分类号： G01R31/2893
摘要： A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed.
摘要翻译：测试处理器包括用于将半导体器件从客户托盘加载到测试托盘上的加载单元; 测试室，用于对装载在测试盘上的半导体器件进行测试; 推动单元，具有至少一个用于推动位于待测试的测试室中的测试托盘的推动构件和用于操作推动构件的按压单元; 位置控制单元，用于调节推动构件的位置，以补偿推动构件和测试托盘之间由于推动构件和测试托盘中的任一个的热膨胀或收缩而产生的偏差; 以及卸载单元，用于在半导体器件的测试完成之后，将装载在测试托盘上的半导体器件卸载到客户托盘上。

4. 发明申请

US20080061485A1 Hi-Fix board clamping apparatus for use in test handler 有权
标题翻译：用于测试处理器的Hi-Fix板夹紧装置
公开(公告)号：US20080061485A1
公开(公告)日：2008-03-13
申请号：US11652181
申请日：2007-01-11
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： B23Q3/00 , B25B1/00
CPC分类号： B25B5/006 , Y10S269/90 , Y10T24/44496
摘要： A clamping apparatus for clamping a plurality of Hi-Fix boards arranged in a row, includes at least one rotational clamping unit installed to clamp facing end sides of the two or more Hi-Fix boards together, and a plurality of clamping units installed to clamp end sides of the Hi-Fix boards other than the facing sides thereof. The rotational clamping unit includes a clamper installed to rotate about a fixed rotation point to clamp or release the claming of the facing end sides of the two or more Hi-Fix boards, and a driving unit for providing a rotational force to the clamper.
摘要翻译：一种用于夹紧排列成一列的多个Hi-Fix板的夹持装置，包括至少一个旋转夹紧单元，其安装成将两个或更多个Hi-Fix板的相对端侧夹在一起，并且多个夹紧单元安装成夹紧 Hi-Fix板的除了其正面侧之外的端面。旋转夹紧单元包括夹持器，其安装成围绕固定旋转点旋转以夹紧或释放两个或更多个Hi-Fix板的相对端侧的卡住，以及用于向夹持器提供旋转力的驱动单元。

5. 发明授权

US08919755B2 Hi-fix board clamping apparatus for use in test handler 有权
标题翻译：用于测试处理器的Hi-fix板夹紧装置
公开(公告)号：US08919755B2
公开(公告)日：2014-12-30
申请号：US11652181
申请日：2007-01-11
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： H01L21/687 , B25B5/00
CPC分类号： B25B5/006 , Y10S269/90 , Y10T24/44496
摘要： A clamping apparatus for clamping a plurality of Hi-Fix boards arranged in a row, includes at least one rotational clamping unit installed to clamp facing end sides of the two or more Hi-Fix boards together, and a plurality of clamping units installed to clamp end sides of the Hi-Fix boards other than the facing sides thereof. The rotational clamping unit includes a clamper installed to rotate about a fixed rotation point to clamp or release the claming of the facing end sides of the two or more Hi-Fix boards, and a driving unit for providing a rotational force to the clamper.
摘要翻译：一种用于夹紧排列成一列的多个Hi-Fix板的夹持装置，包括至少一个旋转夹紧单元，其安装成将两个或更多个Hi-Fix板的相对端侧夹在一起，并且多个夹紧单元安装成夹紧 Hi-Fix板的除了其正面侧之外的端面。旋转夹紧单元包括夹持器，其安装成围绕固定旋转点旋转以夹紧或释放两个或更多个Hi-Fix板的相对端侧的卡住，以及用于向夹持器提供旋转力的驱动单元。

6. 发明授权

US07723981B2 Method for transferring test trays in a side-docking type test handler 有权
标题翻译：用于在侧对接式测试处理器中传送测试托盘的方法
公开(公告)号：US07723981B2
公开(公告)日：2010-05-25
申请号：US12389469
申请日：2009-02-20
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： G01R31/26 , G01R31/28 , B07C5/00
CPC分类号： G01R31/2893 , Y10S414/135 , Y10S414/138
摘要： The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.
摘要翻译：本发明涉及一种用于测试处理器的测试托盘。根据本发明，公开了一种技术，即装入装载部件中的镶嵌在测试托盘的框架中的矩阵图案的技术允许根据其位置来确定其自由运动的量和方向加载部件，其中插入物被加载在基体上，从而使匹配板或测试托盘的热膨胀或收缩得以补偿。

7. 发明授权

US08038191B2 Pick and place apparatus 有权
标题翻译：拾取和放置仪器
公开(公告)号：US08038191B2
公开(公告)日：2011-10-18
申请号：US12103306
申请日：2008-04-15
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Hyun Yo
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Hyun Yo
IPC分类号： B25J15/06 , B65G47/91
CPC分类号： G01R31/2893 , H05K13/0482
摘要： A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately.
摘要翻译：拾取和放置装置包括预定布置的多个装置孔元件; 电源机构，用于提供用于控制所述多个设备保持元件之间的水平间距的电力; 动力传递机构，用于将来自供电机构的动力作为水平方向的平移力传递到多个装置保持元件; 用于引导所述多个装置保持元件中的一些的水平移动的第一线性运动引导机构; 以及第二线性运动引导机构，其设置在所述第一线性运动引导机构的下方，用于引导所述另一装置保持元件的水平运动。多个装置保持元件交替地可滑动地联接到第一和第二直线运动引导机构。

8. 发明申请

US20100134136A1 OPERATING METHOD OF TEST HANDLER 有权
标题翻译：测试手术操作方法
公开(公告)号：US20100134136A1
公开(公告)日：2010-06-03
申请号：US12698532
申请日：2010-02-02
申请人： Yun Sung Na , In Gu Jeon , Dong Hyun Yo , Hyun Song
发明人： Yun Sung Na , In Gu Jeon , Dong Hyun Yo , Hyun Song
IPC分类号： G01R31/26
CPC分类号： G01R31/2893
摘要： Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up the semiconductor devices from the first loading compartments and place them selectively onto a plurality of adjacent odd rows or a plurality of adjacent even rows of the second loading compartments during one operation. The pick-and-place apparatus includes a relatively large number of the pickers, preferably arrayed in a matrix, and thus performs loading and unloading of semiconductor devices at a relatively high speed.
摘要翻译：公开了测试处理器的操作方法。拾取和放置装置从在第一加载元件上排列成矩阵的第一加载隔间拾取半导体器件，移动并放置在第二加载元件上排列成矩阵的第二加载隔间上。拾取和放置装置的拾取器从第一加载隔间拾取半导体器件，并且在一次操作期间将它们选择性地放置在第二加载隔间的多个相邻奇数行或多个相邻偶数行上。拾取和放置装置包括相对大量的拾取器，优选地排列成矩阵，并且因此以相对高的速度执行半导体器件的装载和卸载。

9. 发明申请

US20100019790A1 TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE 有权
标题翻译：具有尺寸可变测试点的测试操作员
公开(公告)号：US20100019790A1
公开(公告)日：2010-01-28
申请号：US12574395
申请日：2009-10-06
申请人： JAE GYUN SHIM , Yun Sung Na , In Gu Jeon
发明人： JAE GYUN SHIM , Yun Sung Na , In Gu Jeon
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/2893
摘要： A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M×N array (where M and N represent an integer greater than a value of =), a cover (170) detachably fixed to the main body t close a part of the window and convert the window into the test site having a size corresponding to a [M−A)×(n−B)] Hi-Fix board (where A is an integer equal to or greater than 0 but smaller than M, and B is an integer having a value other than 0). In the test handler, the size of window is easily modified to adapt that of the Hi-Fix board of M×N array by closing or opening a part of the window using the cover. Therefore, the test handler is capable of applying Hi-Fix boards having different sizes.
摘要翻译：本发明的测试处理器（122）包括主体，窗体（142），其形成在主体的表面上并且具有与MxN阵列的Hi-Fix板相对应的尺寸（其中M和N表示整数大于值=），可拆卸地固定到主体t的盖子（170）将窗口的一部分关闭并将窗口转换成具有对应于[MA] x（nB）] Hi- 修正板（其中A为等于或大于0但小于M的整数，B为0以外的整数）。在测试处理程序中，通过使用盖子关闭或打开窗口的一部分，可以轻松修改窗口的大小以适应MxN阵列的Hi-Fix板。因此，测试处理机能够应用具有不同尺寸的Hi-Fix板。

10. 发明申请

US20090199395A1 SIDE-DOCKING TYPE TEST HANDLER AND APPARATUS FOR TRANSFERRING TEST TRAY FOR SAME 有权
标题翻译：用于传送测试托盘的侧锁式测试操作器和设备
公开(公告)号：US20090199395A1
公开(公告)日：2009-08-13
申请号：US12415662
申请日：2009-03-31
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Dong-Hyun Yo , Bong-Soo Kim , Choung-Min Joung
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Dong-Hyun Yo , Bong-Soo Kim , Choung-Min Joung
IPC分类号： B23P17/04 , B65G47/22 , H01L21/02 , B65G47/90 , H01L21/68 , H01L21/677
CPC分类号： G01R31/2893 , Y10T29/52
摘要： In a side-docking type test handler, a descending mechanism lowers a horizontally postured test tray, which has been transferred into a soak chamber, down to a descent finish position and a vertical posture changing mechanism changes the posture of the test tray, which has been lowered to the descent finish position, from the horizontal state to a vertical state, to transfer the test tray into a test chamber. Further, a horizontal posture changing mechanism changes the posture of the test tray in the test chamber from the vertical state to the horizontal state while transferring the test tray to an ascent start position in a desoak chamber.
摘要翻译：在侧对接式测试处理机中，下降机构降低已经被传送到浸泡室中的水平姿态的测试盘，直到下降完成位置，并且垂直姿势改变机构改变测试托盘的姿态，已经从水平状态下降到下降完成位置到垂直状态，以将测试托盘传送到测试室中。此外，水平姿势改变机构将测试盘中的测试托盘的姿势从垂直状态改变到水平状态，同时将测试托盘转移到脱泡室中的上升开始位置。

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