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    • 1. 发明授权
    • Light sensor, and detecting mechanism and light-measuring mechanism in analyzing device
    • 光传感器,分析装置中的检测机构和光测量机构
    • US07382460B2
    • 2008-06-03
    • US10537003
    • 2003-11-20
    • Yukio HigashiisogawaJunichi OkaTetsuaki Saiji
    • Yukio HigashiisogawaJunichi OkaTetsuaki Saiji
    • G01N21/55
    • G01N21/55G01N21/4738G01N21/8483G01N2201/08
    • The present invention relates to an analyzing device provided with: a light-measuring mechanism (6) that includes a light-emitting unit for emitting light onto a test tool (7) to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (7); and a detecting mechanism (4) for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool (7) and a light-receiving unit for receiving reflection light from the test tool (7). In the light-measuring mechanism (6), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other. The detecting mechanism (4) is arranged such that the one or more light-receiving units selectively receive regularly-reflected light from the test tool (7) among the light emitted from the light-emitting unit.
    • 分析装置技术领域本发明涉及一种分析装置,其具备:光测量机构(6),其包括用于将光发射到测试工具(7)上以分析样本的发光单元和用于接收反射光的光接收单元 从测试工具(7); 以及用于检测所述测试工具是否存在于目标区域中的检测机构(4),所述机构包括用于将光发射到所述测试工具(7)上的发光单元和用于接收来自所述测试工具(7)的反射光的光接收单元 测试工具(7)。 在该测光机构(6)中,发光单元和受光单元被布置成使得发光单元的发光轴和光接收单元的光接收轴平行或基本平行 对彼此。 检测机构(4)被布置成使得一个或多个光接收单元在从发光单元发射的光中选择性地接收来自测试工具(7)的规则反射光。
    • 2. 发明申请
    • Light sensor, and detecting mechanism and light-measuring mechanism in analyzing device
    • 光传感器,分析装置中的检测机构和光测量机构
    • US20060076523A1
    • 2006-04-13
    • US10537003
    • 2003-11-20
    • Yukio HigashiisogawaJunichi OkaTetsuaki Saiji
    • Yukio HigashiisogawaJunichi OkaTetsuaki Saiji
    • G01N21/86
    • G01N21/55G01N21/4738G01N21/8483G01N2201/08
    • The present invention relates to an analyzing device provided with: a light-measuring mechanism (6) that includes a light-emitting unit for emitting light onto a test tool (7) to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (7); and a detecting mechanism (4) for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool (7) and a light-receiving unit for receiving reflection light from the test tool (7). In the light-measuring mechanism (6), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other. The detecting mechanism (4) is arranged such that the one or more light-receiving units selectively receive regularly-reflected light from the test tool (7) among the light emitted from the light-emitting unit.
    • 分析装置技术领域本发明涉及一种分析装置,其具备:光测量机构(6),其包括用于将光发射到测试工具(7)上以分析样本的发光单元和用于接收反射光的光接收单元 从测试工具(7); 以及用于检测所述测试工具是否存在于目标区域中的检测机构(4),所述机构包括用于将光发射到所述测试工具(7)上的发光单元和用于接收来自所述测试工具(7)的反射光的光接收单元 测试工具(7)。 在该测光机构(6)中,发光单元和受光单元被布置成使得发光单元的发光轴和光接收单元的光接收轴平行或基本平行 对彼此。 检测机构(4)被布置成使得一个或多个光接收单元在从发光单元发射的光中选择性地接收来自测试工具(7)的规则反射光。