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1. 发明授权

US07848037B2 Media defect removal in disk drive head testing 有权
标题翻译：磁盘驱动器头测试中的介质缺陷删除
公开(公告)号：US07848037B2
公开(公告)日：2010-12-07
申请号：US11986234
申请日：2007-11-19
申请人： Youping Deng , Terry Farren , Jing Zhang
发明人： Youping Deng , Terry Farren , Jing Zhang
IPC分类号： G11B27/36
CPC分类号： G01R33/09
摘要： A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
摘要翻译：描述了用于测试硬盘驱动器的方法。该方法包括确定与与硬盘驱动器相关联的可记录介质的一部分相关联的缺陷的数量。所述方法还包括将所确定的缺陷的数量与阈值数量的缺陷进行比较，并且如果所确定的缺陷的数量大于所述缺陷的阈值数量，则确定所述盘的所述部分包括盘缺陷。

2. 发明申请

US20090128142A1 Media defect removal in disk drive head testing 有权
标题翻译：磁盘驱动器头测试中的介质缺陷删除
公开(公告)号：US20090128142A1
公开(公告)日：2009-05-21
申请号：US11986234
申请日：2007-11-19
申请人： Youping Deng , Terry Farren , Jing Zhang
发明人： Youping Deng , Terry Farren , Jing Zhang
IPC分类号： G01R33/12
CPC分类号： G01R33/09
摘要： A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
摘要翻译：描述了用于测试硬盘驱动器的方法。该方法包括确定与与硬盘驱动器相关联的可记录介质的一部分相关联的缺陷的数量。所述方法还包括将所确定的缺陷的数量与阈值数量的缺陷进行比较，并且如果所确定的缺陷的数量大于所述缺陷的阈值数量，则确定所述盘的所述部分包括盘缺陷。

3. 发明申请

US20080104449A1 Discrete device testing 有权
标题翻译：分立器件测试
公开(公告)号：US20080104449A1
公开(公告)日：2008-05-01
申请号：US11591080
申请日：2006-10-31
申请人： Terry Farren , Heng Gong , Yong Shen , Jing Zhang
发明人： Terry Farren , Heng Gong , Yong Shen , Jing Zhang
IPC分类号： G06F11/36
CPC分类号： G06F11/26
摘要： One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.
摘要翻译：根据本发明的一个实施例是一种方法，其包括使用包括项目的第一测试序列来测试第一数量的物理设备。使用第二测试序列测试第二数量的物理设备。注意，第二测试序列包括第一测试项目和第二项目。

4. 发明授权

US08174779B2 Discrete device testing 有权
标题翻译：分立器件测试
公开(公告)号：US08174779B2
公开(公告)日：2012-05-08
申请号：US11591080
申请日：2006-10-31
申请人： Terry Farren , Heng Gong , Yong Shen , Jing Zhang
发明人： Terry Farren , Heng Gong , Yong Shen , Jing Zhang
IPC分类号： G11B27/36
CPC分类号： G06F11/26
摘要： One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.
摘要翻译：根据本发明的一个实施例是一种方法，其包括使用包括项目的第一测试序列来测试第一数量的物理设备。使用第二测试序列测试第二数量的物理设备。注意，第二测试序列包括第一测试项目和第二项目。

5. 发明申请

US20060232271A1 System, method, and apparatus for dynamic electrical testing of workpieces by multiplexing test sites with shared electronics 有权
标题翻译：通过将测试点与共享电子元件进行多路复用，对工件进行动态电气测试的系统，方法和装置
公开(公告)号：US20060232271A1
公开(公告)日：2006-10-19
申请号：US11107186
申请日：2005-04-15
申请人： Terry Farren , Yong Shen
发明人： Terry Farren , Yong Shen
IPC分类号： G01R33/12
CPC分类号： G11B5/455
摘要： A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.
摘要翻译：公开了一种用于测试头万向架组件（HGA）的动态电气测试仪（DET）。 DET模拟磁盘驱动器操作，同时显着减少测试人员的投资。使用具有共享电子设备的模块化旋转架同时测试多个HGA。这种设计提高了电子元件的利用率，并最大限度地减少了主轴启动/停止时间的影响。具有共享电子设备的并联阵列旋转架用于通过在旋转架之间进行复用来降低测试仪组件和材料成本。 DET具有通过在机械相关延迟期间空闲时利用电子设备来减少等待时间的显着优点。此外，DET包括每个测试头更多的通道，可以在被测产品之间轻松切换。

6. 发明授权

US07288935B2 System, method, and apparatus for dynamic electrical testing of workpieces by multiplexing test sites with shared electronics 有权
标题翻译：通过将测试点与共享电子元件进行多路复用，对工件进行动态电气测试的系统，方法和装置
公开(公告)号：US07288935B2
公开(公告)日：2007-10-30
申请号：US11107186
申请日：2005-04-15
申请人： Terry Farren , Yong Shen
发明人： Terry Farren , Yong Shen
IPC分类号： G01R33/00
CPC分类号： G11B5/455
摘要： A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.
摘要翻译：公开了一种用于测试头万向架组件（HGA）的动态电气测试仪（DET）。 DET模拟磁盘驱动器操作，同时显着减少测试人员的投资。使用具有共享电子设备的模块化旋转架同时测试多个HGA。这种设计提高了电子元件的利用率，并最大限度地减少了主轴启动/停止时间的影响。具有共享电子设备的并联阵列旋转架用于通过在旋转架之间进行复用来降低测试仪组件和材料成本。 DET具有通过在机械相关延迟期间空闲时利用电子设备来减少等待时间的显着优点。此外，DET包括每个测试头更多的通道，可以在被测产品之间轻松切换。

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