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    • 7. 发明授权
    • Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit
    • 半导体器件,半导体器件的测试方法以及半导体集成电路
    • US06774655B2
    • 2004-08-10
    • US10622472
    • 2003-07-21
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • G01R3102
    • G11C29/022G11C29/02
    • A semiconductor device mounted on a board or the like and having a test circuit, having the function of carrying out a contact test at a low cost on the terminals of the semiconductor, is disclosed. The semiconductor device comprises a terminal test circuit for testing a state of a contact of an external terminal and a test mode control circuit unit. The test mode control circuit unit outputs a signal indicating a first operation mode upon application of a power supply voltage thereto, outputs a test mode signal to the terminal test circuit in response to a control signal input to a specific terminal such as a chip select terminal, and outputs a signal indicating a second operation mode in response to the number of times in which the level of the control signal input to the specific terminal changes. Preferably, the first operation mode is a terminal test mode, and the second operation mode is a normal operation mode. A method of testing the semiconductor device and a semiconductor integrated circuit, having the test circuit, are also disclosed.
    • 公开了一种安装在板等上并具有测试电路的半导体器件,具有在半导体端子上以低成本进行接触测试的功能。 半导体器件包括用于测试外部端子和测试模式控制电路单元的接触状态的端子测试电路。 测试模式控制电路单元在施加电源电压时输出指示第一操作模式的信号,响应于输入到诸如芯片选择端子的特定终端的控制信号,向终端测试电路输出测试模式信号 并且响应于输入到特定终端的控制信号的电平改变的次数而输出指示第二操作模式的信号。 优选地,第一操作模式是终端测试模式,并且第二操作模式是正常操作模式。 还公开了一种测试半导体器件的方法和具有测试电路的半导体集成电路。
    • 8. 发明授权
    • Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit
    • 半导体器件,半导体器件的测试方法以及半导体集成电路
    • US06621283B1
    • 2003-09-16
    • US09437221
    • 1999-11-10
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • G01R3102
    • G11C29/022G11C29/02
    • A semiconductor device mounted on a board or the like and having a test circuit, having the function of carrying out a contact test at a low cost on the terminals of the semiconductor, is disclosed. The semiconductor device comprises a terminal test circuit for testing a state of a contact of an external terminal and a test mode control circuit unit. The test mode control circuit unit outputs a signal indicating a first operation mode upon application of a power supply voltage thereto, outputs a test mode signal to the terminal test circuit in response to a control signal input to a specific terminal such as a chip select terminal, and outputs a signal indicating a second operation mode in response to the number of times in which the level of the control signal input to the specific terminal changes. Preferably, the first operation mode is a terminal test mode, and the second operation mode is a normal operation mode. A method of testing the semiconductor device and a semiconductor integrated circuit, having the test circuit, are also disclosed.
    • 公开了一种安装在板等上并具有测试电路的半导体器件,具有在半导体端子上以低成本进行接触测试的功能。 半导体器件包括用于测试外部端子和测试模式控制电路单元的接触状态的端子测试电路。 测试模式控制电路单元在施加电源电压时输出指示第一操作模式的信号,响应于输入到诸如芯片选择端子的特定终端的控制信号,向终端测试电路输出测试模式信号 并且响应于输入到特定终端的控制信号的电平改变的次数而输出指示第二操作模式的信号。 优选地,第一操作模式是终端测试模式,并且第二操作模式是正常操作模式。 还公开了一种测试半导体器件的方法和具有测试电路的半导体集成电路。
    • 10. 发明授权
    • Decoder circuit for a semiconductor memory device
    • 一种用于半导体存储器件的解码器电路
    • US5889725A
    • 1999-03-30
    • US915332
    • 1997-08-20
    • Tadao AikawaHirohiko MochizukiAtsushi HatakeyamaShusaku YamaguchiKoichi Nishimura
    • Tadao AikawaHirohiko MochizukiAtsushi HatakeyamaShusaku YamaguchiKoichi Nishimura
    • G11C11/413G11C8/10G11C8/00
    • G11C8/10
    • A semiconductor or memory device has a decoder circuit for decoding a plurality of external address signals. The external address signals include first and second external address signals. A first address buffer receives the first external address signals and outputs first internal address signals to first address lines. A second address buffer receives the second external address signals and outputs second internal address signals to second address lines. First predecoders have input terminals connected to the first address lines, and output first predecode signals to first predecode lines. Second predecoders have input terminals connected to the second address lines and output second predecode signals to second predecode lines. Main decoders have input terminals connected to the first predecode lines and the second predecode lines and output decode signals. The number of the first external address signals are greater than the number of the second external address signals. The second predecoders and the second predecode lines are provided at least in double in such a manner that inputs of the main decoders to be connected to each of the second predecode lines are equal in number to inputs of the main decoders to be connected to each of the first predecode lines. It is possible to shorten the transition time of predecode signals because of the same capacitive load of the predecoder circuit.
    • 半导体或存储器件具有用于解码多个外部地址信号的解码器电路。 外部地址信号包括第一和第二外部地址信号。 第一地址缓冲器接收第一外部地址信号,并将第一内部地址信号输出到第一地址线。 第二地址缓冲器接收第二外部地址信号,并将第二内部地址信号输出到第二地址线。 第一预解码器具有连接到第一地址线的输入端,并将第一预解码信号输出到第一预解码线。 第二预解码器具有连接到第二地址线的输入端,并将第二预解码信号输出到第二预解码线。 主解码器具有连接到第一预解码线和第二预解码线并输出解码信号的输入端。 第一外部地址信号的数量大于第二外部地址信号的数量。 第二预解码器和第二预解码线以至少两个方式提供,使得要连接到每个第二预解码线的主解码器的输入数量等于要连接到每个的主解码器的输入 第一个预先代码行。 由于预解码器电路的容性负载相同,可以缩短预解码信号的转换时间。