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    • 7. 发明申请
    • Charge coupled device and solid-state imaging apparatus
    • 电荷耦合器件和固态成像设备
    • US20060163620A1
    • 2006-07-27
    • US11334364
    • 2006-01-19
    • Takahiko Ogo
    • Takahiko Ogo
    • H01L27/148
    • H01L27/14812H01L27/14636
    • When capacity coupling between an output gate electrode (OG) and a last-stage transfer electrode is large at an output end of a CCD shift register, an electric potential of the OG is varied according to transfer clocks with the result that noise is liable to generate in an output signal. As measures for this, convex portions projecting horizontally are formed in those positions of the last-stage transfer electrode and the OG, which correspond to a channel region, and overlap between the both electrodes is caused only on the portions. A clearance is formed between the OG and the transfer electrode except those locations, in which the convex portions are provided. In particular, in that location, in which the OG and the transfer electrode, respectively, are extended relatively lengthily toward wirings, the both electrodes do not overlap each other. In this manner, capacity coupling between the both electrodes is reduced.
    • 当在CCD移位寄存器的输出端输出栅电极(OG)和最后级转移电极之间的电容耦合较大时,OG的电位根据转移时钟而变化,结果是噪声易于 在输出信号中产生。 作为其措施,水平突出的凸部形成在与沟道区域相对应的最后级转移电极和OG的那些位置处,并且仅在这两个部分之间产生两个电极之间的重叠。 除了设置有凸部的那些位置之外,在OG和转印电极之间形成间隙。 特别地,在分别将OG和转移电极相对于配线相对长度延伸的位置中,两个电极彼此不重叠。 以这种方式,减小了两个电极之间的电容耦合。