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1. 发明申请

US20050076757A1 Lathe 有权
标题翻译：车床
公开(公告)号：US20050076757A1
公开(公告)日：2005-04-14
申请号：US10956208
申请日：2004-09-30
申请人： Yoshiharu Kikuchi , Shinsuke Kumakura , Hidenori Sato
发明人： Yoshiharu Kikuchi , Shinsuke Kumakura , Hidenori Sato
IPC分类号： B23B3/16 , B23B3/18 , B23B3/30 , B23B9/04 , B23B15/00 , B23B19/02 , B23Q1/76 , B23Q39/04 , B23B13/00
CPC分类号： B23Q39/048 , B23B3/168 , B23F17/00 , B23F23/06 , B23F23/1243 , B23F23/1293 , B23Q1/76 , Y10T82/2508 , Y10T82/2514 , Y10T82/2516 , Y10T82/2524 , Y10T82/2566
摘要： A main spindle and a back spindle grip works W, respectively. Or, the main spindle grips one end of a work W and the back spindle grips the other end of the work W. A tool is attached to a tool spindle. By adjusting the positions of the spindles and the position of the tool spindle, the work W gripped by the main spindle and the back spindle is machined by the tool. Since tool spindle can change the direction of the tool, the work W, including both ends thereof, can be entirely machined into a complex shape. A guide bush supports the work W to prevent the work W from being bent when a lengthy work W is machined. Therefore, this lathe can entirely machine a long or short work into a complex shape.
摘要翻译：主轴和后主轴夹头分别工作W。或者，主轴握住工件W的一端，后主轴夹紧工件W的另一端。工具连接到工具主轴。通过调整主轴的位置和刀具主轴的位置，由主轴和后主轴夹持的工件W由刀具加工。由于工具主轴可以改变工具的方向，所以包括其两端的工件W可以被完全加工成复杂的形状。当加工长时间的工件W时，导向衬套支撑工件W以防止工件W弯曲。因此，该车床可以将长或短的工件整体加工成复杂的形状。

2. 发明授权

US07448304B2 Lathe 有权
标题翻译：车床
公开(公告)号：US07448304B2
公开(公告)日：2008-11-11
申请号：US10956208
申请日：2004-09-30
申请人： Yoshiharu Kikuchi , Shinsuke Kumakura , Hidenori Sato
发明人： Yoshiharu Kikuchi , Shinsuke Kumakura , Hidenori Sato
IPC分类号： B23B13/00 , B23Q3/155
CPC分类号： B23Q39/048 , B23B3/168 , B23F17/00 , B23F23/06 , B23F23/1243 , B23F23/1293 , B23Q1/76 , Y10T82/2508 , Y10T82/2514 , Y10T82/2516 , Y10T82/2524 , Y10T82/2566
摘要： A main spindle and a back spindle grip works W, respectively. Or, the main spindle grips one end of a work W and the back spindle grips the other end of the work W. A tool is attached to a tool spindle. By adjusting the positions of the spindles and the position of the tool spindle, the work W gripped by the main spindle and the back spindle is machined by the tool. Since tool spindle can change the direction of the tool, the work W, including both ends thereof, can be entirely machined into a complex shape. A guide bush supports the work W to prevent the work W from being bent when a lengthy work W is machined. Therefore, this lathe can entirely machine a long or short work into a complex shape.
摘要翻译：主轴和后主轴夹头分别工作W。或者，主轴握住工件W的一端，后主轴夹紧工件W的另一端。工具连接到工具主轴。通过调整主轴的位置和刀具主轴的位置，由主轴和后主轴夹持的工件W由刀具加工。由于工具主轴可以改变工具的方向，所以包括其两端的工件W可以被完全加工成复杂的形状。当加工长时间的工件W时，导向衬套支撑工件W以防止工件W弯曲。因此，该车床可以将长或短的工件整体加工成复杂的形状。

3. 发明授权

US06535442B2 Semiconductor memory capable of debugging an incorrect write to or an incorrect erase from the same 失效
标题翻译：半导体存储器能够调试不正确的写入或不正确的擦除
公开(公告)号：US06535442B2
公开(公告)日：2003-03-18
申请号：US10015597
申请日：2001-12-17
申请人： Shinsuke Kumakura
发明人： Shinsuke Kumakura
IPC分类号： G11C2900
CPC分类号： G11C29/00
摘要： A command storing control circuit stores in storing units a plurality of commands supplied the latest of the supplied commands so as to execute the memory operation. A command reading control circuit reads the commands stored in a command storing area during a test mode. If incorrect data are written into a semiconductor memory, causing the system mounting the semiconductor memory to become inoperable, the cause of the trouble can be efficiently determined by utilizing the commands stored in the command storing area. As a result, the efficiency of development of the system can be improved, for example, and the cost of developing the system can be reduced. Moreover, the quality of the system can be also improved.
摘要翻译：命令存储控制电路在存储单元中存储提供最近提供的命令的多个命令，以便执行存储器操作。命令读取控制电路在测试模式期间读取存储在命令存储区域中的命令。如果不正确的数据被写入到半导体存储器中，导致半导体存储器的系统安装变得不可操作，则可以通过利用存储在命令存储区域中的命令来有效地确定故障的原因。结果，可以提高系统的开发效率，例如，可以降低开发系统的成本。此外，系统的质量也可以提高。

4. 发明授权

US5892776A Semiconductor memory and test method incorporating selectable clock signal modes 失效
标题翻译：半导体存储器和包含可选时钟信号模式的测试方法
公开(公告)号：US5892776A
公开(公告)日：1999-04-06
申请号：US583938
申请日：1996-01-11
申请人： Shinsuke Kumakura
发明人： Shinsuke Kumakura
IPC分类号： G01R31/28 , G11C16/02 , G11C16/06 , G11C17/00 , G11C29/00 , G11C29/06 , G11C29/14 , G11C29/56
CPC分类号： G11C29/14
摘要： A semiconductor memory is provided with a select circuit and a control circuit. The select circuit selects either a master clock signal or a test clock signal supplied to a specific terminal, based upon a mode selection signal supplied to a specific terminal. The control operation writes, reads and erases data of the memory cells in response to the master clock signal or the test clock signal. A semiconductor memory test method includes a number of steps, including supplying a mode selection signal, which is higher than normally used voltage, to a specific terminal, and a test clock signal is supplied to another specific terminal; the master clock signal and the test clock signal are then switched in response to the mode selection signal; the data writes and erases relating to the cells of the memory are then tested based upon the test clock signal. In other semiconductor memory test method, two or more specific terminals are first selected, and are supplied with a mode selection signal which is higher than a normally used voltage; then, a master clock signal with a predetermined frequency is selected based upon the mode selection signal. The data writes and erases relating to the cells of the memory are tested based upon the master clock signal with the predetermined frequency.
摘要翻译：半导体存储器设置有选择电路和控制电路。选择电路基于提供给特定终端的模式选择信号来选择提供给特定终端的主时钟信号或测试时钟信号。控制操作响应于主时钟信号或测试时钟信号写入，读取和擦除存储器单元的数据。半导体存储器测试方法包括多个步骤，包括将比常用电压高的模式选择信号提供给特定终端，并且将测试时钟信号提供给另一个特定终端; 然后响应于模式选择信号切换主时钟信号和测试时钟信号; 然后基于测试时钟信号测试与存储器的单元相关的数据写入和擦除。在其他半导体存储器测试方法中，首先选择两个或多个特定端子，并且提供比正常使用的电压高的模式选择信号; 然后，基于模式选择信号选择具有预定频率的主时钟信号。基于具有预定频率的主时钟信号测试与存储器的单元相关的数据写入和擦除。

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