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    • 4. 发明授权
    • IC package processing and measuring method and system therefor
    • IC封装加工及测量方法及系统
    • US5920481A
    • 1999-07-06
    • US952259
    • 1997-11-12
    • Masashi IchiharaYoshinori SaitoMasato SuwaYukihiro TsudaHitoshi Kitamura
    • Masashi IchiharaYoshinori SaitoMasato SuwaYukihiro TsudaHitoshi Kitamura
    • H01L21/677H01L21/00H01L21/02H01L21/68H01L23/00H01L23/544H05K13/04H05K13/08G06F19/00
    • H01L21/67294H01L22/34H01L23/544H05K13/0478H05K13/08H01L2223/54473H01L2924/0002
    • An IC package processing and measuring system comprises: a processing and measuring device that executes processing or measurement on a prescribed number of IC packages juxtaposed in a prescribed area; a feed device that feeds IC packages into the prescribed area, a prescribed number at a time, by feeding with a prescribed feed pitch an IC package support on which are loaded a plurality of juxtaposed IC packages; and a control device that controls the processing and measuring device and feed device. The control device comprises position calculating means that uses shape data of the IC package and IC package support to calculate target positions of processing and measurement of the IC packages in the prescribed area and outputs the calculated position data to the processing and measuring device. The processing and measuring device comprises processing and measuring means that uses the target position data that were input from the position calculating means to execute processing or measurement on the IC packages that were fed into the prescribed area. Thus improvement of the operability and shortening of the operating time are attained.
    • PCT No.PCT / JP96 / 01279 Sec。 371日期:1997年11月12日 102(e)日期1997年11月12日PCT提交1996年5月15日PCT公布。 公开号WO96 / 36456 日期1996年11月21日IC封装处理和测量系统包括:处理和测量装置,其在规定区域中并列规定数量的IC封装件执行处理或测量; 馈送装置,通过馈送规定的馈送距离将IC封装馈送到规定的区域,一个规定的数量,一个IC封装支架,其上装有多个并置的IC封装; 以及控制装置和控制装置。 控制装置包括使用IC封装和IC封装支架的形状数据的位置计算装置,以计算处理和在规定区域中的IC封装的测量的目标位置,并将计算的位置数据输出到处理和测量装置。 处理和测量装置包括处理和测量装置,其使用从位置计算装置输入的目标位置数据对进入规定区域的IC封装进行处理或测量。 从而可以实现操作性的提高和操作时间的缩短。
    • 8. 发明授权
    • Transmission type liquid crystal mask marker
    • 透射型液晶掩模标记
    • US5663826A
    • 1997-09-02
    • US619546
    • 1996-04-01
    • Yukihiro TsudaTaku YamazakiAkira MoriYukinori Matsumura
    • Yukihiro TsudaTaku YamazakiAkira MoriYukinori Matsumura
    • B23K26/06G02B26/08
    • B23K26/066
    • The present invention relates to a transmission type liquid crystal mask marker which can be incorporated easily into a conventional apparatus, and which enables high-speed and high-accuracy stable printing and an increase in the S/N ratio of a sensor output. The transmission type liquid crystal mask marker thus includes a controller for, during rewriting a static marking image displayed on a transmission type liquid crystal mask, displaying a static test image and attaining an equipotential state, and thereafter repeatedly displaying the static marking image and attaining an equipotential state up to the end of the rewriting time, measuring an actual light transmittance of the static test image during rewriting, and regulating the voltage applied to the transmission type liquid crystal mask so that the actual light transmittance is equal to the optimum light transmittance. An optical filter can be provided on a light receiving device for measuring a light transmittance.
    • PCT No.PCT / JP94 / 01574 Sec。 371日期:1996年4月1日 102(e)日期1996年4月1日PCT 1994年9月26日PCT公布。 第WO95 / 09067号公报 日期1995年4月6日本发明涉及一种可以容易地并入现有装置中的透射型液晶掩模标记,其能够进行高速高精度的稳定印刷,并且能够提高S / N比的S / N比 传感器输出。 因此,透射型液晶掩模标记器包括:控制器,用于在重写显示在透射型液晶掩模上的静态标记图像时,显示静态测试图像并获得等电位状态,然后反复显示静态标记图像并获得 等电位状态直到重写时间结束,在重写期间测量静态测试图像的实际透光率,并调节施加到透射型液晶掩模的电压,使得实际透光率等于最佳透光率。 可以在用于测量透光率的光接收装置上设置滤光器。