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    • 2. 发明申请
    • VEHICLE STEERING CONTROL APPARATUS
    • 车辆转向控制装置
    • US20130124045A1
    • 2013-05-16
    • US13811697
    • 2011-06-01
    • Yoshiaki SuzukiTheerawat LimpibunterngToru TakashimaTakahiro KojoTaro HiroseYoshiaki TsuchiyaMasahiro MiyataSusumu Fujii
    • Yoshiaki SuzukiTheerawat LimpibunterngToru TakashimaTakahiro KojoTaro HiroseYoshiaki TsuchiyaMasahiro MiyataSusumu Fujii
    • B62D6/00
    • B62D6/00B62D5/008B62D5/0481B62D7/159
    • A vehicle steering control apparatus (100) in a vehicle (10), which is provided with: a steering system including at least a rudder angle varying device (400, 700) capable of changing a relation between a steering angle, which is a rotation angle of a steering wheel (12), and a rudder angle of steered wheels and a steering torque assisting device (500) capable of assisting a driver steering torque; and a power supply source (800) for supplying electric power to the steering system, is provided with: a limiting device for limiting electric current consumption of the steering torque assisting device if a consumption current value of the steering system is greater than a maximum allowable current value in a case where supply capacity of supplying an electric current in the power supply source is reduced with respect to a reference; and a controlling device for matching a neutral position of the steering wheel with a neutral position of the steered wheels in a situation in which the electric current consumption of the steering torque assisting device is limited.
    • 一种车辆(10)中的车辆转向控制装置(100),其设置有:至少包括舵角变化装置(400,700)的转向系统,其能够改变作为旋转的转向角 方向盘(12)的角度以及转向轮的方向舵角度和能够辅助驾驶员转向转矩的转向转矩辅助装置(500); 以及用于向转向系统供电的供电源(800)设置有限制装置,用于限制转向系统的消耗电流值大于最大允许值的转向助力装置的电流消耗 在供电源供给电力相对于基准的情况下减小电流值的电流值; 以及用于在转向转矩辅助装置的电流消耗受到限制的情况下将方向盘的空档位置与转向轮的空档位置相匹配的控制装置。
    • 5. 发明授权
    • Variable transmission ratio steering apparatus
    • 可变传动比转向装置
    • US07195098B2
    • 2007-03-27
    • US10878576
    • 2004-06-29
    • Kenichiro HidakaMasahiro MiyataTakahiro Kojo
    • Kenichiro HidakaMasahiro MiyataTakahiro Kojo
    • B62D5/04
    • B62D5/008
    • A variable transmission ratio steering apparatus for a vehicle is configured with an input shaft coupled to a steering wheel of the vehicle, a sensor for sensing a rotation angle of the input shaft, an output shaft operatively linked to steerable road wheels of the vehicle, an actuator having an electric motor which is configured to vary a transmission ratio between a rotation angle of the output shaft and the rotation angle of the input shaft, and a controller. More specifically, the controller includes a desired rotation angle calculation unit, a difference calculation unit, and a difference limitation unit, whereby a rotation angle of a rotor of the electric motor is limited. With such a configuration, a rotation speed of the rotor of the electric motor can be limited by limiting the rotation angle of the rotor, and consequently, audible operation noises arising from the electric motor can be minimized.
    • 一种用于车辆的可变传动比转向装置,其配置有联接到车辆的方向盘的输入轴,用于感测输入轴的旋转角度的传感器,可操作地连接到车辆的可转向车轮的输出轴, 致动器具有电动机,其构造成改变输出轴的旋转角度与输入轴的旋转角度之间的传动比,以及控制器。 更具体地,控制器包括期望的旋转角度计算单元,差分计算单元和差分限制单元,由此电动机的转子的旋转角度受到限制。 通过这样的结构,能够通过限制转子的旋转角来限制电动机的转子的旋转速度,能够使电动机产生的可听见的操作噪音最小化。
    • 10. 发明申请
    • INSPECTING APPARATUS AND INSPECTION METHOD
    • 检查装置和检查方法
    • US20120050518A1
    • 2012-03-01
    • US13053403
    • 2011-03-22
    • Masahiro Miyata
    • Masahiro Miyata
    • H04N7/18
    • G01N21/9501
    • An inspecting apparatus includes a first light receiving sensor that senses an image of a surface of the wafer incident from the microscope, and that acquires first inspection image data of the surface of the wafer. The inspecting apparatus includes a second light receiving sensor that corrects a focusing position to focus on a reference position of an upper portion of a bump formed on the surface of the wafer, with respect to an image incident from the microscope, that senses an image of the bump incident from the microscope, and that acquires second inspection image data of the bump. The inspecting apparatus includes a first image processing unit that compares the first inspection image data acquired by the first light receiving sensor with previously acquired first reference image data, and that detects a defect of the surface of the wafer on the basis of the comparison result. The inspecting apparatus includes a second image processing unit that compares the second inspection image data acquired by the second light receiving sensor with previously acquired second reference image data, and that detects a defect of the bump on the basis of the comparison result.
    • 检查装置包括:第一受光传感器,其感测从显微镜入射的晶片的表面的图像,并且获取晶片表面的第一检查图像数据。 检查装置包括第二光接收传感器,其校正聚焦位置以聚焦在形成在晶片表面上的凸起的上部的参考位置,相对于从显微镜入射的图像,其感测图像 从显微镜入射的凸块,并且获得凸块的第二检查图像数据。 检查装置包括第一图像处理单元,其将由第一光接收传感器获取的第一检查图像数据与先前获取的第一参考图像数据进行比较,并且基于比较结果来检测晶片的表面的缺陷。 检查装置包括第二图像处理单元,其将由第二光接收传感器获取的第二检查图像数据与先前获取的第二参考图像数据进行比较,并且基于比较结果来检测凹凸的缺陷。