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    • 1. 发明申请
    • Apparatus and method for testing a network connection device
    • 用于测试网络连接设备的装置和方法
    • US20060002307A1
    • 2006-01-05
    • US11147737
    • 2005-06-08
    • Yi-Ming WangChun-Ming Wang
    • Yi-Ming WangChun-Ming Wang
    • H04L1/00
    • H04L1/24
    • A test apparatus for testing a to-be-tested network connection device is disclosed. The to-be-tested network connection device has a number of to-be-tested ports. The test apparatus includes a packet generator and a switch fixture. The packet generator is for generating a test packet having a VLAN ID (VID). The switch fixture, having VLAN function, includes a number of fixture ports. The to-be-tested ports are respectively one-to-one electrically coupled to the fixture ports. The switch fixture receives the test packet and transmits the test packet from one of the fixture ports to the corresponding to-be-tested port according to its VID in order to verify the to-be-tested network connection device.
    • 公开了一种用于测试待测试网络连接设备的测试设备。 待测试的网络连接设备具有多个待测试端口。 测试装置包括分组发生器和开关夹具。 分组生成器用于生成具有VLAN ID(VID)的测试分组。 具有VLAN功能的开关灯具包括多个灯具端口。 待测试的端口分别一对一地电耦合到固定端口。 开关夹具接收测试包,并根据其VID将其中一个灯具端口的测试包发送到相应的待测试端口,以验证待测试的网络连接设备。
    • 2. 发明授权
    • Method of making pillars using photoresist spacer mask
    • 使用光刻胶掩模掩模制作柱的方法
    • US08080443B2
    • 2011-12-20
    • US12289396
    • 2008-10-27
    • Yung-Tin ChenChun-Ming WangSteven J. Radigan
    • Yung-Tin ChenChun-Ming WangSteven J. Radigan
    • H01L21/44
    • H01L21/0337
    • A method of making a device includes forming a first hard mask layer over an underlying layer, forming first features over the first hard mask layer, forming a first spacer layer over the first features, etching the first spacer layer to form a first spacer pattern and to expose top of the first features, removing the first features, patterning the first hard mask using the first spacer pattern as a mask to form first hard mask features, removing the first spacer pattern. The method also includes forming second features over the first hard mask features, forming a second spacer layer over the second features, etching the second spacer layer to form a second spacer pattern and to expose top of the second features, removing the second features, etching the first hard mask features using the second spacer pattern as a mask to form second hard mask features, and etching at least part of the underlying layer using the second hard mask features as a mask.
    • 制造器件的方法包括在下层上形成第一硬掩模层,在第一硬掩模层上形成第一特征,在第一特征上形成第一间隔层,蚀刻第一间隔层以形成第一间隔图案, 为了暴露第一特征的顶部,去除第一特征,使用第一间隔图案作为掩模来图案化第一硬掩模以形成第一硬掩模特征,去除第一间隔图案。 该方法还包括在第一硬掩模特征上形成第二特征,在第二特征上形成第二间隔层,蚀刻第二间隔层以形成第二间隔图案并暴露第二特征的顶部,去除第二特征,蚀刻 第一硬掩模使用第二间隔图案作为掩模形成第二硬掩模特征,并且使用第二硬掩模特征作为掩模蚀刻至少部分下层。